Graduate School of Science and Technology Electrical and Information Engineering Electrical and Electronic Engineering Professor
Faculty of Engineering Department of Engineering Professor
Updated on 2024/04/27
博士(工学) ( 1994.3 東京工業大学 )
Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Measurement engineering
Niigata University Graduate School of Science and Technology Electrical and Information Engineering Electrical and Electronic Engineering Professor
2010.4
Niigata University Faculty of Engineering Department of Electrical and Electronic Engineering Professor
2010.4
Niigata University Graduate School of Science and Technology Advanced Materials Science and Technology Advanced Material Science and Engineering Technology Professor
2007.9 - 2010.3
Niigata University Faculty of Engineering Department of Electrical and Electronic Engineering Associate Professor
2004.4 - 2007.8
Niigata University Faculty of Engineering Associate Professor (as old post name)
1994.7 - 2004.3
Niigata University Faculty of Engineering Lecturer
1993.4 - 1994.6
Niigata University Faculty of Engineering Research Assistant
1987.1 - 1993.3
日本光学会 英文論文誌「Optical Review」 編集委員
2021.4 - 2023.3
Committee type:Academic society
Chair for the Fabrication, Design and Instrumentation division in OSA
2018.1 - 2020.12
アメリカ光学会 光学設計・製造研究部門 委員長
2018.1 - 2020.12
アメリカ光学会 国際会議開催部門 委員
2018.1 - 2020.12
Committee member of the Board of Meetings in OSA
2018.1 - 2020.12
日本光学会 信越地区幹事
2006.4 - 2008.3
応用物理学会 代議員
2006.2 - 2008.1
応用物理学会 北陸信越支部幹事
2003.4 - 2005.3
電子情報通信学会 本部評議員
2002.5 - 2003.4
日本光学会 信越地区幹事
2002.4 - 2004.3
アメリカ光学会(OSA) ディビッド・リチャードソン・メダル選考委員会委員
2002.1 - 2003.12
member of the David Richardson Medal Committee
2002.1 - 2003.12
電子情報通信学会 信越支部評議員
2001.5 - 2003.4
Overview of KAGRA : Data transfer and management
T Akutsu, M Ando, K Arai, Y Arai, S Araki, A Araya, N Aritomi, H Asada, Y Aso, S Bae, Y Bae, L Baiotti, R Bajpai, M A Barton, K Cannon, Z Cao, E Capocasa, M Chan, C Chen, K Chen, Y Chen, C-Y Chiang, H Chu, Y-K Chu, S Eguchi, Y Enomoto, R Flaminio, Y Fujii, Y Fujikawa, M Fukunaga, M Fukushima, D Gao, G Ge, S Ha, A Hagiwara, S Haino, W-B Han, K Hasegawa, K Hattori, H Hayakawa, K Hayama, Y Himemoto, Y Hiranuma, N Hirata, E Hirose, Z Hong, B Hsieh, G-Z Huang, H-Y Huang, P Huang, Y-C Huang, Y Huang, D C Y Hui, S Ide, B Ikenoue, S Imam, K Inayoshi, Y Inoue, K Ioka, K Ito, Y Itoh, K Izumi, C Jeon, H-B Jin, K Jung, P Jung, K Kaihotsu, T Kajita, M Kakizaki, M Kamiizumi, N Kanda, G Kang, K Kawaguchi, N Kawai, T Kawasaki, C Kim, J Kim, J C Kim, W S Kim, Y-M Kim, N Kimura, N Kita, H Kitazawa, Y Kobayashi, Y Kojima, K Kokeyama, K Komori, A K H Kong, K Kotake, C Kozakai, R Kozu, R Kumar, J Kume, C Kuo, H-S Kuo, Y Kuromiya, S Kuroyanagi, K Kusayanagi, K Kwak, H K Lee, H W Lee, R Lee, M Leonardi, K L Li, L C-C Lin, C-Y Lin, F-K Lin, F-L Lin, H L Lin, G C Liu, L-W Luo, E Majorana, M Marchio, Y Michimura, N Mio, O Miyakawa, A Miyamoto, Y Miyazaki, K Miyo, S Miyoki, Y Mori, S Morisaki, Y Moriwaki, K Nagano, S Nagano, K Nakamura, H Nakano, M Nakano, R Nakashima, Y Nakayama, T Narikawa, L Naticchioni, R Negishi, L Nguyen Quynh, W-T Ni, A Nishizawa, S Nozaki, Y Obuchi, W Ogaki, J J Oh, K Oh, S H Oh, M Ohashi, T Ohashi, N Ohishi, M Ohkawa, H Ohta, Y Okutani, K Okutomi, K Oohara, C Ooi, S Oshino, S Otabe, K Pan, H Pang, A Parisi, J Park, F E Peña Arellano, I Pinto, N Sago, S Saito, Y Saito, K Sakai, Y Sakai, Y Sakuno, Y Sasaki, S Sato, T Sato, T Sawada, T Sekiguchi, Y Sekiguchi, L Shao, S Shibagaki, R Shimizu, T Shimoda, K Shimode, H Shinkai, T Shishido, A Shoda, K Somiya, E J Son, H Sotani, R Sugimoto, J Suresh, T Suzuki, T Suzuki, H Tagoshi, H Takahashi, R Takahashi, A Takamori, S Takano, H Takeda, M Takeda, H Tanaka, K Tanaka, K Tanaka, T Tanaka, T Tanaka, S Tanioka, E N Tapia San Martin, S Telada, T Tomaru, Y Tomigami, T Tomura, F Travasso, L Trozzo, T Tsang, J-S Tsao, K Tsubono, S Tsuchida, T Tsutsui, T Tsuzuki, D Tuyenbayev, N Uchikata, T Uchiyama, A Ueda, T Uehara, S Ueki, K Ueno, G Ueshima, F Uraguchi, T Ushiba, M H P M van Putten, H Vocca, J Wang, T Washimi, C Wu, H Wu, S Wu, W-R Xu, T Yamada, K Yamamoto, K Yamamoto, T Yamamoto, K Yamashita, R Yamazaki, Y Yang, K Yokogawa, J Yokoyama, T Yokozawa, T Yoshioka, H Yuzurihara, S Zeidler, M Zhan, H Zhang, Y Zhao, Z-H Zhu, P Brockill, J A Clark, J Zweizig
Progress of Theoretical and Experimental Physics 2023 ( 10 ) 2023.9
Phase refractive index measurement of thick glass plates with a spectrally resolved interferometer Reviewed
Kaining Zhang, Osami Sasaki, Songjie Luo, Samuel Choi, Takamasa Suzuki, Jixiong Pu
Optics Continuum 2 ( 3 ) 683 - 683 2023.3
Haosen Pu, Osami Sasaki, Takamasa Suzuki, Samuel Choi
Optics Continuum 1 ( 11 ) 2287 - 2287 2022.10
External-cavity laser diode using acousto-optic deflector as tunable grating Reviewed
Takamasa Suzuki, Yuzuki Kaneko, Samuel Choi, Osami Sasaki
Optics Letters 47 ( 7 ) 1871 - 1871 2022.3
Haruka Yamaguchi, Jotaro On, Takao Morita, Takamasa Suzuki, Yasuo Okada, Junya Ono, Andreas Evdokiou
International Journal of Molecular Sciences 22 ( 22 ) 12213 - 12213 2021.11
Kaining Zhang, Osami Sasaki, Samuel Choi, Songjie Luo, Takamasa Suzuki, Jixiong Pu
Applied Optics 60 ( 31 ) 10009 - 10009 2021.11
Optical coherence tomography using nonstationary signal processing based on continuous wavelet transform Invited Reviewed
Takamasa Suzuki, Jiro Shimazaki, Osami Sasaki, Samuel Choi
Twelfth International Conference on Information Optics and Photonics 2021.11
Large thickness measurement of glass plates with a spectrally resolved interferometer using two positions of a reference surface and a compensation glass Reviewed
Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Jixiong Pu
Optical Metrology and Inspection for Industrial Applications VIII 2021.10
Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Yongxin Liu, Jixiong Pu
Engineering Research Express 3 ( 2 ) 025044 - 025044 2021.6
Rapid optical tomographic vibrometry using a swept multi-gigahertz comb
Samuel Choi, Takeru Ota, Fumiaki Nin, Tatsutoshi Shioda, Takamasa Suzuki, Hiroshi Hibino
Optics Express 29 ( 11 ) 16749 - 16749 2021.5
Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Yongxin Liu, Jixiong Pu
OSA Continuum 4 ( 6 ) 1792 - 1792 2021.5
Vibration distribution measurement using downsampling phase-shifting interferometer
Y. Ohara, T. Suzuki, S. Choi, O. Sasaki
Opt. Eng. 59 ( 3 ) 034112_1 - 034112_10 2020.3
Dual scanning white-light interferometer for exact thickness measurement of glass plate with large thickness Reviewed
K. Zhang, O. Sasaki, S. Luo, T. Suzuki, Y. Liu, J. Pu
Meas. Sci. and Tech. 31 ( 4 ) 045009_1 2020.1
An arm length stabilization system for KAGRA and future
T Akutsu
Class. and Quantum Grav. 37 ( 3 ) 1 - 21 2019.11
Near-Infrared Photoimmunotherapy Using a Small Protein Mimetic for HER2-Overexpressing Breast Cancer Reviewed International journal
H. Yamaguchi, N. Pantarat, T. Suzuki, A. Evdokiou
Int. J. Mol. Sci. 20 ( 23 ) 5838_1 - 5838_14 2019.11
Precise vibration measurement techniques based on laser diode interferometry Invited Reviewed
T. Suzuki, Y. Ohara, T. Sumizawa, S. Choi
Proc. of ISOM ’19 Tu-I-01 - Tu-I-01 2019.10
Acousto-optically tuned external-cavity laser diode for optical coherence tomography with continuous wavelet transform Reviewed
T. Suzuki, N. Sugawara, S. Choi, O. Sasaki
Opt. Eng. 58 ( 10 ) 104108_1 - 104108_6 2019.10
Vibration distribution measurement using down sampling phase shifting interferometer Reviewed
Y. Ohara, T. Suzuki, S. Choi
Proc of ISMTII2019 ID-55_1-5 - ID-55_5 2019.9
Step profile measurement using full field SD-OCT based on wavelet transform Reviewed
H. Yamaoka, T. Suzuki, S. Choi
Proc of ISMTII2019 ID-99_1 - ID-99_6 2019.9
Real-time vibration measurement with a fiber coupler laser diode interferometer utilizing synchronous detection Reviewed
T. Sumizawa, T. Suzuki, S. Choi
Proc of ISMTII2019 ID-68_1 - ID-68_6 2019.9
Thickness distribution measurement with a full-field pulsed SD-OCT Reviewed
T. Suzuki, B. Liu, S. Choi, O. Sasaki
Technical digest of OIE2019 73 - 74 2019.8
3D thickness measurement using pulse-driven optical coherence tomography based on wavelet transform Reviewed
T. Suzuki, B. Liu, S. Choi
Proc. of SPIE Vol. 11102 111021A_1 - 111021A_8 2019.8
Full-field optical coherence tomography with an acousto-optically tuned external-cavity laser diode Invited Reviewed
T. Suzuki, N. Sugawara, S. Choi
Proc. of SPIE Vol. 11209 1120922_1 - 1120922_8 2019.8
First cryogenic test operation of underground km-scale gravitational-wave observatory KAGRA Reviewed
T Akutsu
Class. and Quantum Grav. 36 ( 16 ) 1 - 23 2019.7
Signal correction by detection of scanning position in a white-light interferometer for exact surface profile measurement Reviewed
Songjie Luo, Takamasa Suzuki, Osami Sasaki, Samuel Choi, Ziyang Chen, Jixiong Pu
Appl. Opt. 58 ( 13 ) 3544 - 3558 2019.4
Imaging of metastatic cancer cells in sentinel lymph nodes using affibody probes and possibility of a theranostic approach Reviewed
M. Tsuchimochi, H. Yamaguchi, K. Hayama, Y. Okada Y, T. Kawase, T. Suzuki, N. Tsubokawa, N. Wada, A. Ochiai, S. Fujii, H. Fujii
Int. J. Mol. Sci. 20 ( 2 ) 427_1 - 427_24 2019.1
OKA Tetsuo, YAMAUCHI Takeshi, YAMAGIWA Kazuaki, SATO Takashi, ABE Kazuhisa, SUZUKI Takamasa, SUZUKI Toshio, NISHIMURA Shin-ya, MURAKAMI Masato
JSEE Annual Conference International Session Proceedings 2019 ( 0 ) 58 - 61 2019
Improvement of wavelength-scanning range in acousto-optically tuned external-cavity laser diode Reviewed
N. Sugawara, T. Suzuki, S. Choi
Proc. of2018 Joint Symposia on Optics 31aAJ8 - 31aAJ8 2018.10
Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement Reviewed
S. Luo, O. Sasaki, S. Choi, T. Suzuki, J. Pu
Proc. of SPIE 10819 108190N_1 - 108190N_7 2018.10
Full-field optical coherence tomography using acousto-optically tuned external-cavity laser diode and wavelet transform Reviewed
T. Suzuki, G. Suda, S. Choi, O. Sasaki
Proc. of Frontiers in Optics 2018 FM3D.3 - FM3D.3 2018.9
佐藤孝, 鈴木孝昌, 清水忠明, 坂本秀一, 佐々木朋裕, 岡徹雄
電気学会研究会資料 2018 ( 1 ) 65 - 69 2018.3
2F17 Educational Project for Students Learning Science and Mathematics Featured by R&D Activities Including Freshman Grade Students Reviewed
OKA Tetsuo, YAMAUCHI Takeshi, ABE Kazuhisa, NARUMI Takatsune, SATO Takashi, SUZUKI Takamasa
Proceedings of Annual Conference of Japanese Society for Engineering Education 2018 ( 0 ) 334 - 335 2018
Full-field optical coherence tomography using acousto-optically tuned external-cavity laser diode in Littrow configuration Reviewed
G. Suda, T. Suzuki, S. Choi, O. Sasaki
Proc. of OIE'17 P5 - P5 2017.9
Wavelength scanning VCSEL interferometer using wavelet analysis Invited Reviewed
T. Suzuki, R. Shintate, C. Samuel, O. Sasaki
Proc. of OIE'17 S7 - S7 2017.9
Multi-frequency swept en-face optical coherence microscopy with supercontinuum comb for in-vivo measurement of inner ear Invited Reviewed
S. Choi, F. Nin, T. Ota, K. Sato, T. Suzuki, H. Hibino
Proc. of OIE'17 S6 - S6 2017.9
Measurement of vibration distribution using down-sampling phase-shifting interferometer Reviewed
K. Kurita, T. Suzuki, S. Choi, O. Sasaki
Proc. of OIE'17 P8 - P8 2017.9
Compensation technique for nonlinear interference signal Reviewed
T. Hanyu, T. Suzuki, S. Choi, O. Sasaki
Proc. of OIE'17 P7 - P7 2017.9
Time-domain super luminescent diode interferometer using wavelet transform Reviewed
T. Sugai, T. Suzuki, S. Choi, O. Sasaki
Proc. of OIE'17 P6 - P6 2017.9
A signal analyzing technique using continuous wavelet transform in spectral interferometry Reviewed
T. Serizawa, T. Suzuki, S. Choi, O. Sasaki
Proc. of ICO-24 M1D-04 2017.8
3-D surface profile measurement using spectral interferometry based on continuous wavelet transform Reviewed
Takuma Serizawa, Takamasa Suzuki, Samuel Choi, Osami Sasaki
OPTICS COMMUNICATIONS 396 216 - 220 2017.8
Acousto-optically tuned eternal-cavity laser diode based on littrow configuration Reviewed
G. Suda, T. Suzuki, S. Choi, O. Sasaki
Proc. of International conference on Optoacoustics (ICOA2017) 8 - 8 2017.5
Time-domain super luminescent diode interferometer using wavelet transform Reviewed
T. Sugai, T. Suzuki, S. Choi, O. Sasaki
Proc. of International conference on Optoacoustics (ICOA2017) 11 - 11 2017.5
Vibration distribution measurement using down sampling phase shifting interferometer Reviewed
K. Kurita, T. Suzuki, S. Choi, O. Sasaki
Proc. of International conference on Optoacoustics (ICOA2017) 10 - 10 2017.5
Time-domain low-coherence interferometry compensating nonlinearity of modulation Reviewed
T. Hanyu, T. Suzuki, S. Choi, O. Sasaki
Proc. of International conference on Optoacoustics (ICOA2017) 9 - 9 2017.5
Development of Engineering Education Program for Students before Starting Graduation Researches on Forefront Technologies Reviewed
Tetsuo Oka, Takamasa Suzuki, Kazuhisa Abe, Takeshi Yamauchi, Kazuaki Yamagiwa, Takashi Sato, Yuji Tanabe, Takatsune Narumi
2017 7TH WORLD ENGINEERING EDUCATION FORUM (WEEF) 136 - 139 2017
Vibration distribution measurement using phase-shifting interferometry and down-sampling technique Reviewed
Takamasa Suzuki, Ryo Umeki, Samuel Choi, Osami Sasaki
Optics InfoBase Conference Papers 2017 2017
OKA Tetsuo, SATO Takashi, SUZUKI Takamasa, TSUBOI Nozomu, YAMAGIWA Kazuaki, SUZUKI Toshio, OGURA Kazuo, NISHIMURA Shin-ya
JSEE Annual Conference International Session Proceedings 2017 ( 0 ) 25 - 30 2017
Simultaneous measurement of thickness and refractive index using phase shifted Coherent Gradient Sensor Reviewed
Reena Disawal, Takamasa Suzuki, Shashi Prakash
OPTICS AND LASER TECHNOLOGY 86 85 - 92 2016.12
Laser diode interferometer utilizing polarization technique Invited Reviewed
T. Suzuki, S. Choi, O. Sasaki
Proc. of SIOT2016 SS2-11, p1 - SS2-11, p2 2016.11
Spectral domain optical coherence tomography using wavelet transform Reviewed
T. Serizawa, T. Suzuki, S. Choi, O. Sasaki
Proc. of OPIC 2016 BISCp6-18 2016.5
WIDE-FIELD HETERODYNE VIBROMETRY FOR MEASUREMENT OF SURFACE VIBRATIONS IN BIOLOGICAL TISSUES Reviewed
Samuel Choi, Fumiaki Nin, Takamasa Suzuki, Hiroshi Hibino
2016 INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS (OMN) 2016
Wide-field heterodyne interferometric vibrometry for two-dimensional surface vibration measurement Reviewed
Samuel Choi, Yuta Maruyama, Takamasa Suzuki, Fumiaki Nin, Hiroshi Hibino, Osami Sasaki
OPTICS COMMUNICATIONS 356 343 - 349 2015.12
Profile measurement of thin films by backpropagation of multiple-wavelength optical fields with two sinusoidal phase-modulating interferometers Reviewed
Osami Sasaki, Jian Xin, Samuel Choi, Takamasa Suzuki
OPTICS COMMUNICATIONS 356 578 - 581 2015.12
Self-pulsation laser diode interferometer based on spectral-domain optical coherence tomography Invited Reviewed
T. Suzuki, Y. Ueno, S. Choi
Technical digest of OIE2015 28 - 29 2015.9
Phase-shifting interferometer with pulse modulation based on a downsampling technique Reviewed
Takuma Serizawa, Takamasa Suzuki, Samuel Choi
OPTICAL ENGINEERING 54 ( 8 ) 085107_1 - 085107_4 2015.8
Multifrequency swept common-path en-face OCT for wide-field measurement of interior surface vibrations in thick biological tissues Reviewed
Samuel Choi, Tomoya Watanabe, Takamasa Suzuki, Fumiaki Nin, Hiroshi Hibino, Osami Sasaki
OPTICS EXPRESS 23 ( 16 ) 21078 - 21089 2015.8
Optical multi-frequency swept sensing for wide-field vibration measurement of interior surfaces in biological tissue Reviewed
S. Choi, F. Nin, H. Hibino, T. Suzuki
Progress in Biomedical Optics and Imaging - Proceedings of SPIE 9792 2015
Optical multi-frequency swept sensing for wide-field vibration measurement of interior surfaces in biological tissue Reviewed
S. Choi, F. Nin, H. Hibino, T. Suzuki
BIOPHOTONICS JAPAN 2015 9792 2015
Two-dimensional thickness measurement using acousto-optically tuned external-cavity laser diode Reviewed
Takamasa Suzuki, Shingo Abe, Samuel Choi
OPTICAL SYSTEMS DESIGN 2015: OPTICAL FABRICATION, TESTING, AND METROLOGY V 9628 96281K_1 - 96281K_8 2015
Three-dimensional step-height measurement using sinusoidal wavelength scanning interferometer with four-step phase-shift method Reviewed
Samuel Choi, Shouhei Takahashi, Osami Sasaki, Takamasa Suzuki
OPTICAL ENGINEERING 53 ( 8 ) 084110_1 - 084110_6 2014.8
Multi-frequency scanning interferometry using variable spatial spectral filter Reviewed
Samuel Choi, Ryoko Sato, Heiichi Kato, Osami Sasaki, Takamasa Suzuki
OPTICS COMMUNICATIONS 316 168 - 173 2014.4
Low-coherence interferomety based on continuous wavelet transform Reviewed
Takamasa Suzuki, Hiroo Matsui, Samuel Choi, Osami Sasaki
OPTICS COMMUNICATIONS 311 172 - 176 2014.1
Full-field step profile measurement with sinusoidal wavelength scanning interferometer Reviewed
Samuel Choi, Osami Sasaki, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 9110 2014
Low-coherence interferometer using a pulsation laser diode Invited Reviewed
Takamasa Suzuki, Yusuke Ueno, Samuel Choi, Osami Sasaki
DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS III 9110 911009_1 - 911009_6 2014
Wavelength-scanning interferometers for shape measurement of thin films by backpropagation of multiple-wavelength optical fields Invited Reviewed
O. Sasaki, J. Xin, S. Choi, T. Suzuki
Technical digest of OIE13 27 - 28 2013.9
Wide-range wavelength tuning in a VCSEL based on pulsed modulation Invited Reviewed
T. Suzuki, T. Ishizuka, S. Choi, O. Sasaki
Technical digest of OIE13 23 - 24 2013.9
Wavelength-scanning interferometers for shape measurement of thin films by backpropagation of multiple-wavelength optical fields Reviewed
O. Sasaki, X. Jian, C. Samuel, T. Suzuki
Proc. CLEO-PR 2013 TuF4-4 2013.7
Profile measurement of glass sheet using multiple wavelength backpropagation interferometry Reviewed
Samuel Choi, Kohei Otsuki, Osami Sasaki, Takamasa Suzuki
Applied Optics 52 ( 16 ) 3726 - 3731 2013.6
Lens Distortion Estimation and Compensation for Sheet-Metal Inspection System Reviewed
Norihisa Terasawa, Shinya Kitazawa, Hidenori Watanabe, Shogo Muramatsu, Takamasa Suzuki, Mitsuyoshi Murata, Toshiro Oitate
Proc. of 2013 International Workshop on Advanced Image Technology (IWAIT) 648 - 653 2013.1
One-dimensional surface profile measurement by detection of reflecting direction of a scanned laser beam Reviewed
Osami Sasaki, Ryo Shinozaki, Takamasa Suzuki
INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN2013) 8769 2013
Coaxial phase-shifting laser diode interferometer based on pulse modulation Invited Reviewed
Takamasa Suzuki, Takuma Serizawa, Osami Sasaki, Samuel Choi
DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS II 8839 88390A_1 - 88390A_6 2013
Surface profile measurement of a diffraction grating by a laser beam scanning interferometer using sinusoidal phase modulation Invited Reviewed
Osami Sasaki, Takuya Kubota, Samuel Choi, Takamasa Suzuki
DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS II 8839 883906_1 - 883906_7 2013
Multi-frequency Light Source Using Spatial Light Modulator for Profilometry Reviewed
Samuel Choi, Shunsuke Takatsuka, Osami Sasaki, Takamasa Suzuki
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR) 2013
OCT based on multi-frequency sweeping Fizeau interferometer with phase modulating method Reviewed
S. Choi, T. Watanabe, O. Sasaki, T. Suzuki
DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS II 8839 2013
Step-height measurement with a low coherence interferometer using continuous wavelet transform Reviewed
Zhang Jian, Takamasa Suzuki, Samuel Choi, Osami Sasaki
2013 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS 9046 9046-96_1 - 9046-96_7 2013
Time-Shared Multiple Optical Traps Using a Pulsed Laser Diode Reviewed
Takamasa Suzuki, Hiroyuki Takayama, Osami Sasaki, Samuel Choi
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR) WJ3-4 2013
Phase-shifting laser diode interferometer using pulse modulation Reviewed
Takamasa Suzuki, Tsubasa Adachi, Osami Sasaki, Samuel Choi
APPLIED OPTICS 51 ( 18 ) 4109 - 4112 2012.6
Step-height measurement by low-coherence interferometry based on wavelet transform Reviewed
T. Suzuki, S. Atsumi, O. Sasaki, S. Choi
Imaging and Applied Optics Technical Digest 2012.6
Utilization of frequency information in a linear wavenumber-scanning interferometer for profile measurement of a thin film Reviewed
Osami Sasaki, Satoshi Hirakubo, Samuel Choi, Takamasa Suzuki
Applied Optics 51 ( 13 ) 2429 - 2435 2012.5
透過型平板金属加工検査システムのためのレンズ歪補正に関する検討(若葉研究者の集い2,サマーセミナー2012~高精細化時代のビジョン技術~)
寺澤 憲久, 北澤 伸哉, 渡辺 秀典, 村松 正吾, 鈴木 孝昌, 村田 光由, 追立 俊朗
映像情報メディア学会技術報告 36 23 - 26 2012
Multi-frequency sweeping sinusoidal phase modulated Fizeau interferometer for OCT Reviewed
S. Choi, J. Hukumoto, O. Sasaki, T. Suzuki
Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012 568 - 569 2012
Computerized Sheet-Metal Inspection Based on the Cross Network Communication Reviewed
Takamasa Suzuki, Kotaro Sato, Shogo Muramatsu, Mitsuyoshi Murata, Toshiro Oitate
MECHANICAL ENGINEERING AND MATERIALS, PTS 1-3 152-154 331 - + 2012
Real-time displacement measurement using VCSEL interferometer Reviewed
Takamasa Suzuki, Noriaki Yamada, Osami Sasaki, Samuel Choi
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II 8563 2012
Image detection of inner wall surface of holes in metal sheets through polarization using a 3D TV monitor Reviewed
Takamasa Suzuki, Katsunori Nakano, Shogo Muramatsu, Toshiro Oitate
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II 8563 2012
Absolute measurement of optical surface profile with a Fizeau interferometer Reviewed
Osami Sasaki, Akihiro Watanabe, Samuel Choi, Takamasa Suzuki
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II 8563 2012
Multi-frequency sweeping interferometry using spatial optical frequency modulation Reviewed
Samuel Choi, Heiichi Kato, Osami Sasaki, Takamasa Suzuki
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II 8563 2012
Sinusoidal wavelength-scanning interferometer for profile measurement of metal surfaces Reviewed
Osami Sasaki, Takahiro Kurashige, Samuel Choi, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 8493 2012
Rapid wavelength scanning based on acousto-optically tuned external-cavity laser diode Reviewed
Takamasa Suzuki, Ryu-ichi Nagai, Osami Sasaki, Samuel Choi
OPTICS COMMUNICATIONS 284 ( 19 ) 4615 - 4618 2011.9
Phase-shifting interferometer using a pulsed laser diode Reviewed
T. Suzuki, T. Adachi, O. Sasaki, S. Choi
Proc. The ninth Japan-Finland Joint Symposium on Optics in Engineering 2011.9
Frequency comb generator using spatial frequency optical filter and its interferometeric characteristics Reviewed
S. Choi, H. Kato, O. Sasaki, T. Suzuki
Proc. The ninth Japan-Finland Joint Symposium on Optics in Engineering 2011.9
Sinusoidal wavelength-scanning interferometers for shape measurement of thin films Reviewed
O. Sasaki, H. Ueno, T. Suzuki
Proc. The ninth Japan-Finland Joint Symposium on Optics in Engineering 2011.9
Statistical Edge Detector with GMM Classifier Reviewed
Hidenori Watanabe, Yuji Kikuchi, Shogo Muramatsu, Toshiro Oitate, Mitsuyoshi Murata, Takamasa Suzuki
Proc. of 2011 26th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) 611 - 614 2011.6
Enhancement of optical gradient force employed in optical tweezers using a pulsed laser diode Reviewed
T. Suzuki, T. Maeda, O. Sasaki, S. Choi
Proc. 2011 OSA Optics & Photonics Congress OTMD4p 2011.4
Spectral interferometer using sinusoidal phase modulation and back-propagation method Reviewed
S. Choi, K. Otsuki, O. Sasaki, T. Suzuki
2011 Int. Quantum Electron. Conf., IQEC 2011 and Conf. Lasers and Electro-Optics, CLEO Pacific Rim 2011 Incorporating the Australasian Conf. Optics, Lasers and Spectroscopy and the Australian Conf. 325 - 326 2011
Beam scanning laser interferometer with high spatial resolution over a large field of view Invited Reviewed
Osami Sasaki, Tsuyoshi Saito, Samuel Choi, Takamasa Suzuki
2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS 8201 0J-1 - 0J-7 2011
Profile measurement of thin films by linear wavenumber-scanning interferometry Reviewed
Osami Sasaki, Satoshi Hirakubo, Samuel Choi, Takamasa Suzuki
DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS 8133 0K 2011
Online optical verification system for sheet-metal processing Invited Reviewed
Takamasa Suzuki, Kotaro Sato, Shogo Muramatsu, Mitsuyoshi Murata, Toshiro Oitate
2011 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS 8201 0B-1 - 0B-12 2011
Profilometry using optical comb light source and sinusoidal phase modulation technique in Fizeau-type interferometer Reviewed
S. Choi, H. Miyatsuka, O. Sasaki, T. Suzuki
Proc. of Photonics Asia 2010 7855 19 2010.10
Profile measurement with a spectral interferometer and the multiwavelength back-propagation method Reviewed
K. Otsuki, S. Choi, O. Sasaki, T. Suzuki
Proc. of Photonics Asia 2010 7855 26 2010.10
Three-dimensional profile measurement by use of phase-shifting digital holography based on a feedback technique Reviewed
T. Suzuki, S. Suzuki, O Sasaki
Abstract Booklet of the 2010 International Symposium on Organic and Inorganic Materials and Related Nonotechnologies 32 2010.6
Step height measurement using a wavelength-selective multimode laser diode Reviewed
T. Suzuki, A. Nomura, O Sasaki
Technical Digest of OSA Topical Meeting OMA4 2010.6
Static wavelength scanning using tunable external cavity laser diode Reviewed
Takamasa Suzuki, Ryuichi Nagai, Osami Sasaki
OPTICAL ENGINEERING 49 ( 2 ) 020502_1 - 020502_3 2010.2
Disturbance-free laser diode Sagnac interferometer using direct phase modulation Reviewed
Takamasa Suzuki, Yasuhito Ban-nai, Masato Shirai, Osami Sasaki
OPTICS COMMUNICATIONS 283 ( 1 ) 104 - 108 2010.1
Multiple-wavelength interferometers using backpropagation of optical fields for profile measurement of thin glass sheets Reviewed
Osami Sasaki, Choi Samuel, Takamasa Suzuki
INTERFEROMETRY XV: TECHNIQUES AND ANALYSIS 7790 77900U 2010
Profilometry using Fizeau-interferometer based on optical comb interferometry and sinusoidal phase modulation method Reviewed
Samuel Choi, Hidetaka Miyatsuka, Osami Sasaki, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 7855 2010
Profile measurement based on spectral interferometer with multi-wavelength back-propagation methods Reviewed
Kohei Otsuki, Samuel Choi, Osami Sasaki, Takamasa Suzuki
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS 7855 26 2010
Sinusoidal wavelength-scanning common-path interferometer with a beam-scanning system for measurement of film thickness variations Reviewed
Osami Sasaki, Takafumi Morimatsu, Samuel Choi, Takamasa Suzuki
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS 7855 78550K 2010
VCSEL's frequency stabilization of an external cavity diode laser - Countermeasures against atmospheric temperature variations Reviewed
Mutsuki Motojima, Kohei Doi, Takashi Sato, Masashi Ohkawa, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 7597 2010
Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control Reviewed
Takamasa Suzuki, Tsutomu Takahashi, Osami Sasaki
APPLIED OPTICS 48 ( 29 ) 5561 - 5566 2009.10
Yasuo Ohdaira, Kazumasa Banba, Kengo Murotani, Takamasa Suzuki, Osami Sasaki, Akira Baba, Kazunari Shinbo, Keizo Kato, Futao Kaneko
Molecular Crystals and Liquid Crystals 504 ( 1 ) 114 - 123 2009.6
Evaluation of photoreactive azo dye molecular thin films utilizing an optical interferometer with evanescent wave illumination Reviewed
Yasuo Ohdaira, Kazumasa Banba, Kengo Murotani, Takamasa Suzuki, Osami Sasaki, Akira Baba, Kazunari Shinbo, Keizo Kato, Futao Kaneko
Molecular Crystals and Liquid Crystals 504 ( 1 ) 114 - 123 2009.1
Coherence controlled light source based on a multimode laser diode Reviewed
T. Suzuki, A. Nomura, O. Sasaki
Proc. of International Symposium on Fusion Technology 2009 26 2009.1
Measurement of thin film shape with a sinusoidal wavelength scanning interferometer using a white light source Reviewed
Osami Sasaki, Hiroshi Ueno, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 7511 7511B 2009
Sinusoidal wavelength-scanning interferometer using an acousto-optic tunable filter with double feedback control for real-time distance measurement Reviewed
Osami Sasaki, Daiki Matsubara, Takamasa Suzuki
2008 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND APPLICATIONS 7160 2009
Interference fringe analysis using wavelet transform Invited Reviewed
Takamasa Suzuki, Ryo Kiyohara, Mika Ichikawa, Osami Sasaki
2008 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND APPLICATIONS 7160 716002_1 - 716002_12 2009
Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer Reviewed
Osami Sasaki, Ryota Yamamura, Kazushi Yokoyama, Takamasa Suzuki
OPTICAL INSPECTION AND METROLOGY FOR NON-OPTICS INDUSTRIES 7432 74320 2009
Real-Time Displacement Measurement by Use of a Coaxial Type of Laser Diode Interferometer Reviewed
Takamasa Suzuki, Shohei Sato, Osami Sasaki
2009 LASERS & ELECTRO-OPTICS & THE PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1 AND 2 381 - + 2009
A tunable external cavity laser diode with no mechanical movement Invited Reviewed
Takamasa Suzuki, Ryuichi Nagai, Osami Sasaki
Proceedings of SPIE - The International Society for Optical Engineering 7511 1 - 9 2009
A tunable external cavity laser diode with no mechanical movement Invited Reviewed
Takamasa Suzuki, Ryuichi Nagai, Osami Sasaki
Proceedings of SPIE - The International Society for Optical Engineering 7511 7511O-1 - 7511O-9 2009
Wavelength-scanning interferometry using backpropagation of optical fields for shape measurement of thin plate Reviewed
O. Sasaki, H. Ashitate, T. Suzuki
Proc. of ICO21-2008 Congress 284 2008.7
A static wavelength scanning in a tunable external cavity laser diode Reviewed
T. Suzuki, S. Nagasaki, O. Sasaki
Proc. of ICO21-2008 Congress 237 2008.7
Stabilization of the spectral intensity of a laser diode in the dual color mode Reviewed
T. Suzuki, Y. Sano, O. Sasaki
Proc. of ICO21-2008 Congress 282 2008.7
Multi-period fringe projection interferometry using back-propagation method for shape measurement of glass plate Reviewed
Hai Huan, Osami Sasaki, Takamasa Suzuki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING III 6829 68290C 2008
Phase-shifting laser diode Sagnac interferometer for surface profile measurement - art. no. 68290A Reviewed
Takamasa Suzuki, Masato Shirai, Osami Sasaki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING III 6829 A8290 - A8290 2008
Multiperiod fringe projection interferometry using a backpropagation method for surface profile measurement Reviewed
Hai Huan, Osami Sasaki, Takamasa Suzuki
Applied Optics 46 ( 29 ) 7268 - 7274 2007.10
Step-profile measurement by backpropagation of multiple-wavelength optical fields Reviewed
Osami Sasaki, Hisashi Tai, Takamasa Suzuki
Optics Letters 32 ( 18 ) 2683 - 2685 2007.9
Extension of distance measurement range in a sinusoidal wavelength-scanning interferometer using a liquid-crystal wavelength filter with double feedback control Reviewed
Osami Sasaki, Akihiro Saito, Takamasa Suzuki, Mitsuo Takeda, Takashi Kurokawa
Applied Optics 46 ( 23 ) 5800 - 5804 2007.8
A tunable external cavity laser diode possessing a stable wavelength Reviewed
Takamasa Suzuki, Takanori Endo, Tatsuo Iwana, Osami Sasaki
OPTICAL REVIEW 14 ( 1 ) 23 - 28 2007.1
Two-wavelength snap-shot interferometer for disturbance-free step-height measurement Reviewed
T. Suzuki, H. Takahashi, K. Yokoyama, O. Sasaki
2007 PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1-4 1420 - 1421 2007
Two-wavelength snap-shot interferometer for disturbance-free step-height measurement Reviewed
T. Suzuki, H. Takahashi, K. Yokoyama, O. Sasaki
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest 790 - 791 2007
Movement measurement with a grating interferometer using sinusoidal phase-modulation Reviewed
Hai Huan, Osami Sasaki, Takamasa Suzuki
OPTICS COMMUNICATIONS 267 ( 2 ) 341 - 346 2006.11
Disturbance free phase-shifting laser diode interferometer Reviewed
T. Suzuki, T. Takahashi, O. Sasaki
Proc. of Frontiers in Optics 2006 on CD-ROM OFWD3 - OFWD3 2006.10
K. Yokoyama, T. Kodera, Y. Nagai, T. Suzuki
41 ( 8 ) 417 - 422 2006.8
Two-dimensional small-rotation-angle measurement using an imaging method Reviewed
T Suzuki, T Endo, O Sasaki, JE Greivenkamp
OPTICAL ENGINEERING 45 ( 4 ) 043604_1 - 043604_7 2006.4
Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern Reviewed
JH Li, O Sasaki, T Suzuki
OPTICS COMMUNICATIONS 260 ( 2 ) 398 - 402 2006.4
Measurement of sectional profile of V-shaped metal cylinders using a sinusoidally vibrating interference pattern Reviewed
JH Li, O Sasaki, T Suzuki
OPTICAL ENGINEERING 45 ( 2 ) 023601_1 - 023601_5 2006.2
In-process inspection of surface-profile properties by detecting laser beam deflection Reviewed
R Shinozaki, O Sasaki, T Suzuki
OPTICAL ENGINEERING 45 ( 1 ) 013601_1 - 013601_5 2006.1
Sinusoidal phase modulating laser diode interferometer for on-machine surface profile measurement Reviewed
XF Zhao, T Suzuki, T Masutomi, O Sasaki
OPTICAL ENGINEERING 44 ( 12 ) 125602_1 - 125602_7 2005.12
Improvement of estimation accuracy on thermal elongation of ball-screw Reviewed
T. Kosaka, K. Yokoyama, K. Saito, T. Suzuki
71 ( 12 ) 1525 - 1530 2005.12
Sinusoidal wavelength-scanning interferometer using an acousto-optic tunable filter for measurement of thickness and surface profile of a thin film Reviewed
H Akiyama, O Sasaki, T Suzuki
OPTICS EXPRESS 13 ( 25 ) 10066 - 10074 2005.12
Wavelength control in tunable external cavity laser diode Reviewed
T. Suzuki, T. Iwana, O. Sasaki
Proc. of The 89th OSA annual meeting on CD-ROM JTuC8 - JTuC8 2005.10
Thickness and surface profile measurement by a sinusoidal wavelength-scanning interferometer Reviewed
Hisashi Akiyama, Osami Sasaki, Takamasa Suzuki
Optical Review 12 ( 4 ) 319 - 323 2005.7
Two-grating interferometer with sinusoidal phase modulation for surface profile measurement Reviewed
YD Xu, O Sasaki, T Suzuki
OPTICAL ENGINEERING 44 ( 4 ) 043601_1 - 043601_6 2005.4
One-dimensional surface profile measurement with a fast scanning method by detecting angular deflection of a laser beam Reviewed
R Shinozaki, O Sasaki, T Suzuki
Advanced Materials and Devices for Sensing and Imaging II 5633 31 - 39 2005
Sinusoidal wavelength-scanning interferometer for measurement of thickness and surface profile of thin films Reviewed
Hisashi Akiyama, Osami Sasaki, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 6024 0101-3 - 0101-3 2005
Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern Reviewed
Jinhuan Li, Osami Sasaki, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 6024 0101-31 - 0101-31 2005
Measurement of sectional profile of a thread gauge using a sinusoidally vibrating light with sinusoidal intensity Reviewed
JH Li, O Sasaki, T Suzuki
Advanced Materials and Devices for Sensing and Imaging II 5633 17 - 22 2005
Vibration insensitive interferometer using sinusoidal phase-modulation and feedback control Reviewed
Osami Sasaki, Hidetaka Iwai, Takamasa Suzuki
Proceedings of SPIE - The International Society for Optical Engineering 6024 0101-25 - 0101-25 2005
Displacement sensor by a sinusoidal phase-modulating laser diode interferometer using optical fibers Reviewed
O Sasaki, Y Arakawa, T Suzuki
2005 PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS 1014 - 1015 2005
Wide range two-dimensional small rotation-angle measurement by use of fringe projection Reviewed
T Suzuki, T Endo, JE Greivenkamp, O Sasaki
Advanced Materials and Devices for Sensing and Imaging II 5633 185 - 192 2005
Direct phase modulating laser diode interferometer for in-process measurement using sinusoidal signal synchronized with the CCD camera's exposure time Reviewed
XF Zhao, T Suzuki, T Masutomi, O Sasaki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING II 5633 272 - 279 2005
Displacement sensor by a sinusoidal phase-modulating laser diode interferometer using optical fibers Reviewed
Osami Sasaki, Yousuke Arakawa, Takamasa Suzuki
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest 2005 1695 - 1696 2005
Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer Reviewed
Takamasa Suzuki, Toshihiko Sato, Osami Sasaki
Proceedings of SPIE - The International Society for Optical Engineering 6024 0101-12 - 0101-12 2005
Real-time estimation of ball-screw thermal elongation based upon temperature distribution of ball-screw Reviewed
Takehiko Kodera, Kazuhiro Yokoyama, Kazuo Miyaguchi, Yutaka Nagai, Takamasa Suzuki, Masami Masuda, Takanori Yazawa
JSME International Journal, Series C: Mechanical Systems, Machine Elements and Manufacturing 47 ( 4 ) 1175 - 1181 2004.12
Remote-control data-transmission system of rotating spindle temperature Reviewed
K. Yokoyama, T. Suzuki, S. Kobayashi, Y. Nagai
Journal of the Japan Society for Precision Engineering. Supplement. Contributed papers 70 ( 12 ) 1559 - 1564 2004.12
Interferometric displacement sensors using sinusoidal phase-modulation and optical fibers Reviewed
O. Sasaki, T. Suzuki
Proc. of Photonics Asia 2004 Vol.5633 120 - 129 2004.11
Real-time range finder based on phase- and modulation-amplitude-locked laser diode interferometry Reviewed
T Suzuki, T Iwana, O Sasaki
OPTICAL ENGINEERING 43 ( 11 ) 2742 - 2746 2004.11
Disturbance-free distributed Bragg reflector laser-diode interferometer with a double sinusoidal phase-modulating technique for measurement of absolute distance Reviewed
T Suzuki, T Ohizumi, T Sekimoto, O Sasaki
APPLIED OPTICS 43 ( 23 ) 4482 - 4487 2004.8
Optical telemeter system of strain-gauge output in rotating object Reviewed
K. Yokoyama, M. Sato, T. Suzuki
Journal of the Japan Society for Precision Engineering. Supplement. Contributed papers 70 ( 8 ) 1101 - 1105 2004.8
Measurement of sectional profile of a metal cylinder using a sinusoidally vibrating light with sinusidal intensity Reviewed
J. Li, O. Sasaki, T. Suzuki
Proc. of ICO 2004 437 - 438 2004.7
Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam Reviewed
R Shinozaki, O Sasaki, T Suzuki
APPLIED OPTICS 43 ( 21 ) 4157 - 4163 2004.7
Two-grating interferometer with sinusoidal phase modulation for surface profile Reviewed
Y. Xu, O. Sasaki, T. Suzuki
Proc. of ICO 2004 3 - 4 2004.7
Absolute distance measurement with a disturbance-free DSPM DBR laser diode interferometer Reviewed
T. Suzuki, T. Ohizumi, O. Sasaki
Proc. of ICO 2004 209 - 210 2004.7
Position measurement of reflecting surfaces by back-propagation of multiple-wavelength optical fields Reviewed
O. Sasaki, K. Masui, T. Suzuki
Proc. of ICO 2004 417 - 418 2004.7
Thickness and surface profile measurement by a sinusoidal wavelength-scanning interferometer Reviewed
H. Akiyama, O. Sasaki, T. Suzuki
Proc. of ICO 2004 419 - 420 2004.7
Real-time measurement of one-dimensional step profile with a sinusoidal wavelength-scanning interferometer using double feedback control Reviewed
O Sasaki, K Honma, T Suzuki
OPTICAL ENGINEERING 43 ( 6 ) 1329 - 1333 2004.6
Two-dimensional small rotation-angle measurement by use of fringe projection Reviewed
T. Endo, T. Suzuki, O. Sasaki
Proc. of EM-NANO 2004 110 - 110 2004.6
Direct phase modulating interferometer by use of injection mode-locking laser diode Reviewed
K. Aoki, T. Suzuki, Y. Ohdaira, O. Sasaki
Proc. of EM-NANO 2004 111 - 111 2004.6
Sinusoidal phase modulating laser diode interferometer with double feedback loops for distance measurement Reviewed
T. Iwana, T. Suzuki, O. Sasaki
Proc. of EM-NANO 2004 114 - 114 2004.6
In-process surface profile measurement with a stroboscopic two wavelength interferometer Reviewed
M. Ohida, T. Suzuki, O. Sasaki
Proc. of EM-NANO 2004 250 - 250 2004.6
Polarizing Sagnac interferometer with a direct-modulated laser diode Reviewed
M. Shirai, T. Suzuki, O. Sasaki
Proc. of EM-NANO 2004 251 - 251 2004.6
Direct phase modulating laser diode interferometer using sinusoidal signal synchronized to the CCD camera’s shutter pulse Reviewed
X. Zhao, T. Masutomi, T. Suzuki, O. Sasaki
Proc. of EM-NANO 2004 252 - 252 2004.6
Interferometric fringe analysis by use of wavelet transform Reviewed
T. Suzuki, J. Sato, O. Sasaki
Proc. of EM-NANO 2004 86 - 86 2004.6
Interferometric displacement measurement by use of a time-shared two-wavelength laser diode Reviewed
T. Suzuki, M. Mitomi, O. Sasaki
Proc. of CLEO/IQEC conference 2004 on technical digest CD-ROM, CTuX3 CTuX3 2004.5
Sinusoidal phase-modulating laser diode interferometer capable of accelerated operations on four integrating buckets Reviewed
XF Zhao, T Suzuki, O Sasaki
OPTICAL ENGINEERING 43 ( 3 ) 678 - 683 2004.3
Sinusoidal phase modulating laser diode interferometer using an additive operating type of integrating bucket method Reviewed
X. Zhao, T. Suzuki, O. Sasaki
Optical Engineering 43 ( 3 ) 678 - 683 2004.3
Double-grating interferometer for measurement of cylinder diameters Reviewed
YD Xu, O Sasaki, T Suzuki
APPLIED OPTICS 43 ( 3 ) 537 - 541 2004.1
Modulation-amplitude-locked laser diode interferometry for distance measurement Reviewed
T Suzuki, T Iwana, O Sasaki
TWO- AND THREE-DIMENSIONAL VISION SYSTEMS FOR INSPECTION, CONTROL, AND METROLOGY 5265 120 - 126 2004
Stroboscopic step height measurement with two-wavelength interferometer using single diode laser source Reviewed
XF Zhao, T Suzuki, S Sasaki
TWO- AND THREE-DIMENSIONAL VISION SYSTEMS FOR INSPECTION, CONTROL, AND METROLOGY 5265 127 - 133 2004
Dual-color operation of a laser diode under current and temperature control Reviewed
T Suzuki, N Hido, XF Zhao, O Sasaki
APPLIED OPTICS 42 ( 33 ) 6640 - 6644 2003.11
K. Yokoyama, Y. Nagai, T. Suzuki
Journal of the Japan Society of Precision Engineering 69 ( 11 ) 1600 - 1604 2003.11
Real time estimation of ball-screw thermal elongation base upon temperature distributuion of ball screw Reviewed
T. Kodera, K. Yokoyama, K. Miyaguchi, Y. Nagaii, T. suzuki, M. Masuda, T. Yazawa
Proc. of International conference on Leading Edge Manufacturing in 21st Century (LEM21) 2003 495 - 500 2003.11
Optical telemeter system of rotating spindle temperature by adopting one-chip micro-controller - development of the system and measurement accuracy - Reviewed
K. Yokoyama, Y. Nagaii, T. suzuki, S. Kobayashi, T. Kodera
Proc. of International conference on Leading Edge Manufacturing in 21st Century (LEM21) 2003 489 - 494 2003.11
Grating interferometer using +/- 1st order beams for step-profile altitude difference measurement Reviewed
Y Xu, O Sasaki, T Suzuki
OPTICAL REVIEW 10 ( 6 ) 514 - 517 2003.11
Y. Nagai, K. Yokoyama, T. Suzuki, T. Kodera
Journal of the Japan Society of Precision Engineering 69 ( 10 ) 1480 - 1486 2003.10
Double-grating interferometer with a one-to-one correspondence with a Michelson interferometer Reviewed
YD Xu, O Sasaki, T Suzuki
OPTICS LETTERS 28 ( 19 ) 1751 - 1753 2003.10
Optical method for detecting displacement of a car in stereo images Reviewed
S Sasaki, K Sakata, T Suzuki
OPTICAL ENGINEERING 42 ( 7 ) 2092 - 2095 2003.7
Two-dmensional rotation angle measurement using a sinusoidal phase-modulating baser diode interferometer Reviewed
O Sasaki, C Togashi, T Suzuki
OPTICAL ENGINEERING 42 ( 4 ) 1132 - 1136 2003.4
Double sinusoidal phase-modulating distributed-Bragg-reflector laser-diode interferometer for distance measurement Reviewed
T Suzuki, H Suda, O Sasaki
APPLIED OPTICS 42 ( 1 ) 60 - 66 2003.1
Stroboscopic two-wavelength interferometer for in-line displacement measurement Reviewed
Takamasa Suzuki, Masanori Ohida, Kazuhiro Yokohama, Osami Sasaki
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest 2 638 - 638 2003
Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control Reviewed
O Sasaki, K Akiyama, T Suzuki
OPTICS FOR THE QUALITY OF LIFE, PTS 1 AND 2 4829 853 - 855 2003
Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control Reviewed
O. Sasaki, K. Akiyama, T. Suzuki
Proc. of SPIE 19th congress of the international commision for Optics Vol.4829 829 - 830 2002.8
Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement Reviewed
O Sasaki, K Akiyama, T Suzuki
APPLIED OPTICS 41 ( 19 ) 3906 - 3910 2002.7
Measurement of sectional profile of a cylinder using a sinusoidally vibrating light with sinusoidal intensity Reviewed
JH Li, O Sasaki, T Suzuki
OPTICAL REVIEW 9 ( 4 ) 159 - 162 2002.7
Two-wavelength laser diode interferometer with time-sharing sinusoidal phase modulation Reviewed
T Suzuki, T Yazawa, O Sasaki
APPLIED OPTICS 41 ( 10 ) 1972 - 1976 2002.4
Disturbance-free high-speed sinusoidal phase-modulating laser diode interferometer Reviewed
T Suzuki, T Maki, Zhao, X, O Sasaki
APPLIED OPTICS 41 ( 10 ) 1949 - 1953 2002.4
Photothermal phase-modulating laser diode interferometer with high-speed feedback control Reviewed
XF Zhao, T Suzuki, O Sasaki
OPTICAL REVIEW 9 ( 1 ) 13 - 17 2002.1
Evaluation method of resistant torque acting on rotating spindle system including rolling bearing (evaluation under high-d<inf>m</inf> · N condition) Reviewed
Kazuhiro Yokoyama, Takamasa Suzuki, Masami Masuda, Hiroyasu Iwabe, Takanori Yazawa
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering 68 ( 1 ) 93 - 97 2002.1
Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer Reviewed
T Suzuki, T Sekimoto, S Sasaki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING 4919 339 - 346 2002
Coaxial type of self-mixing interferometer equipped with a wavelength stabilizing system Reviewed
T Suzuki, T Irisawa, K Yokoyama, O Sasaki
INTERFEROMETRY XI: TECHNIQUES AND ANALYSIS 4777 49 - 56 2002
Sinusoidal wavelength-scanning superluminescent diode interferometer for two-dimensional step-profile measurement Reviewed
S Sasaki, Y Shimakura, T Suzuki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING 4919 220 - 226 2002
Sinusoidal wavelength-scanning interferometer with double feedback control for real-time measurement of one-dimensional step-profile Reviewed
S Sasaki, K Honma, T Suzuki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING 4919 227 - 234 2002
Laser diode interferometers equipped with an electrical feedback loop Invited Reviewed
T Suzuki, O Sasaki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING 4919 256 - 268 2002
Sinusoidal phase modulating laser diode interferometer using an additive operating type of integrating bucket method Reviewed
XF Zhao, T Suzuki, O Sasaki
ADVANCED MATERIALS AND DEVICES FOR SENSING AND IMAGING 4919 275 - 282 2002
K. Yokoyama, T. Suzuki, S. Kobayashi, Y. Matsudaira, Y. Nagai
Journal of the Japan Society of Precision Engineering 67 ( 12 ) 2037 - 2041 2001.12
Characteristic of two-wave mixing with linear and repeated phase-modulated laser light Reviewed
T. Manabe, O. Sasaki, T. Suzuki
30 ( 12 ) 820 - 826 2001.12
Displacement measurement with a self-mixing interferometer equipped with a wavelength compensation system Reviewed
T. Suzuki, T. Irisawa, O. Sasaki
Proc. of SPIE International Symposium on optoelectronics, photonics, and imaging 83 - 83 2001.9
Phase-locked phase-shifting laser diode interferometer with photothermal modulation Reviewed
T Suzuki, XF Zhao, O Sasaki
APPLIED OPTICS 40 ( 13 ) 2126 - 2131 2001.5
Small-rotation-angle measurement using an imaging method Reviewed
T Suzuki, H Nakamura, O Sasaki, JE Greivenkamp
OPTICAL ENGINEERING 40 ( 3 ) 426 - 432 2001.3
High-speed sinusoidal phase modulating laser diode interferometer with a feedback control to eliminate external disturbance Reviewed
T Suzuki, T Maki, O Sasaki
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001) 4416 392 - 395 2001
Step-height measurement with a two-wavelength laser diode interferometer using time-sharing sinusoidal phase modulation. Reviewed
T Suzuki, T Yazawa, O Sasaki
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001) 4416 46 - 49 2001
Measurement of cylinder diameter by using sinusoidally vibrating sinusoidal gratings Reviewed
O Sasaki, K Hashimoto, Y Fujimori, T Suzuki
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001) 4416 35 - 38 2001
F. Sano, O. Sasaki, T. Suzuki
Japanese journal of optics 第29巻, 第10号 ( 10 ) 635 - 639 2000.10
Measurement of small vibration amplitudes of a rough surface by an interferometer with a self-pumped phase-conjugate mirror Reviewed
XZ Wang, O Sasaki, T Suzuki, T Maruyama
APPLIED OPTICS 39 ( 25 ) 4593 - 4597 2000.9
Sinusoidal wavelength-scanning superluminescent diode interferometer with feedback control for real-time distance measurement Reviewed
K. Akiyama, O. Sasaki, T. Suzuki
第29巻, 第9号 580 - 585 2000.9
Sinusoidal wavelength-scanning interferometer with a superluminescent diode for step-profile measurement Reviewed
O Sasaki, N Murata, T Suzuki
APPLIED OPTICS 39 ( 25 ) 4589 - 4592 2000.9
Tomographic imaging by two-wave mixing with a wavelength-scanning laser diode Reviewed
O Sasaki, J Yamagishi, T Manabe, T Suzuki
OPTICS LETTERS 25 ( 16 ) 1174 - 1176 2000.8
Sinusoidal wavelength-scanning interferometric reflectometry Reviewed
O Sasaki, T Kuwahara, R Hara, T Suzuki
APPLIED OPTICS 39 ( 22 ) 3847 - 3853 2000.8
Real-time displacement measurement with a two-wavelength sinusoidal phase-modulating laser diode interferometer Reviewed
T Suzuki, K Kobayashi, O Sasaki
APPLIED OPTICS 39 ( 16 ) 2646 - 2652 2000.6
Phase-locked phase-shifting laser diode interferometry with a photothermal modulation Reviewed
T. Suzuki, X. Zhao, O. Sasaki
Proc. of OSA summer topical meeting on optical fabrication and testing Vol.42 94 - 96 2000.6
Laser-diode interferometer with a photothermal modulation Reviewed
T Suzuki, M Matsuda, O Sasaki, T Maruyama
APPLIED OPTICS 38 ( 34 ) 7069 - 7075 1999.12
Exact measurements of surface profiles of a glass plate by a superluminescent diode interferometer Reviewed
O Sasaki, T Nakada, T Suzuki
OPTICAL ENGINEERING 38 ( 10 ) 1679 - 1682 1999.10
Measurement of spatially nonuniform phase changes of a light beam utilizing the reflectivity characteristic of a self-pumped phase-conjugate mirror Reviewed
XZ Wang, O Sasaki, T Suzuki, T Maruyama
OPTICAL ENGINEERING 38 ( 9 ) 1553 - 1559 1999.9
Self-mixing type of phase-locked laser diode interferometer Reviewed
T Suzuki, S Hirabayashi, O Sasaki, T Maruyama
OPTICAL ENGINEERING 38 ( 3 ) 543 - 548 1999.3
Optical Haar wavelet transforms for feature extraction,' Asian Journal of Physics Reviewed
O.Sasaki, M.Fujiwara, T.Suzuki
Asian Journal of Physics 8 ( 3 ) 265 - 271 1999.3
Optical telemetering of temperature information in rotating spindle (2nd report) - on-line estimation of thermal elongation and thermal displacement of rotating spindle Reviewed
K. Yokoyama, S. Endo, T. Suzuki, Y. Matsudaira
第65巻, 第1号 ( 1 ) 150 - 154 1999.1
Sinusoidal phase-modulating superluminescent diode interferometer with Fabry-Perot Etalone for step-profile measurement Reviewed
K Tsuji, O Sasaki, T Suzuki
OPTICAL REVIEW 6 ( 1 ) 62 - 67 1999.1
Small rotation angle measurement using an imaging method Reviewed
T Suzuki, H Nakamura, JE Greivenkamp, O Sasaki
THREE-DIMENSIONAL IMAGING, OPTICAL METROLOGY, AND INSPECTION V 3835 14 - 21 1999
Rotation angle measurement using an imaging method Reviewed
T Suzuki, H Nakamura, JE Greivenkamp, O Sasaki
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99) 3740 136 - 139 1999
Sinusoidal wavelength-scanning interferometers using a superluminescent diode Reviewed
O Sasaki, N Murata, K Akiyama, T Suzuki
INTERFEROMETRY '99: APPLICATIONS 3745 196 - 204 1999
Sinusoidal wavelength-scanning interferometric reflectometry Reviewed
O Sasaki, T Kuwahara, R Hara, T Suzuki
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99) 3740 618 - 621 1999
Sinusoidal phase modulating laser diode interferometer using a photo-thermal modulation Reviewed
T Suzuki, M Matsuda, O Sasaki, T Maruyama
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99) 3740 98 - 101 1999
Optical data transmission system of the temperature information in rotating spindle (1st report) - Development of the system and measuring accuracy Reviewed
K Yokoyama, T Suzuki, S Endo, H Hoshina
PRECISION ENGINEERING, NANOTECHNOLOGY, VOL 1, PROCEEDINGS Vol.1 76 - 79 1999
Optical data transmission system of the temperature information in rotating spindle (2nd report) - Inner-race temperature of rolling bearing and estimation accuracy of axial thermal elongation Reviewed
K Yokoyama, T Suzuki, S Endo, Y Matsudaira
PRECISION ENGINEERING, NANOTECHNOLOGY, VOL 1, PROCEEDINGS Vol.1 80 - 83 1999
Optical character recognition using a memory matrix generated from singular value decomposition Reviewed
O Sasaki, K Sakata, A Shibahara, T Suzuki
OPTICAL ENGINEERING 37 ( 9 ) 2592 - 2596 1998.9
K. Yokoyama, S. Endo, T. Suzuki
第64巻, 第9号 ( 9 ) 1355 - 1360 1998.9
Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement Reviewed
Osami Sasaki, Yoshihiro Ikeada, Takamasa Suzuki
Applied Optics 37 ( 22 ) 5126 - 5131 1998.8
Superluminescent diode interferometer using sinusoidal phase modulation for step-profile measurement Reviewed
O Sasaki, Y Ikeada, T Suzuki
APPLIED OPTICS 37 ( 22 ) 5126 - 5131 1998.8
Optical character recognition with feature extraction and associative memory matrix Reviewed
O Sasaki, A Shibahara, T Suzuki
OPTICAL ENGINEERING 37 ( 6 ) 1827 - 1833 1998.6
Roof-angle error measurement using an imaging method Reviewed
T. Suzuki, J. E. Greivenkamp
Proc. of OSA summer topical meeting on optical fabrication and testing Vol.12 160 - 162 1998.6
K. Tsuji, O. Sasaki, T. Suzuki
Japanese journal of optics 第27巻, 第1号 ( 1 ) 33 - 39 1998.1
Sinusoidal wavelength-scanning interferometers Reviewed
O Sasaki, K Tsuji, S Sato, T Kuwahara, T Suzuki
LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS 3478 37 - 44 1998
Real-time vibration measurement using a feedback type of laser diode interferometer with an optical fiber Reviewed
T Suzuki, T Okada, O Sasaki, T Maruyama
OPTICAL ENGINEERING 36 ( 9 ) 2496 - 2502 1997.9
Wavelength-multiplexed phase-locked laser diode interferometer using a phase-shifting technique Reviewed
T Suzuki, T Muto, O Sasaki, T Maruyama
APPLIED OPTICS 36 ( 25 ) 6196 - 6201 1997.9
Vibration Amplitude measurement for rough surface with an interferometer using a phase-conjugate laser light Reviewed
X. Wang, O. Sasaki, T. Kikuchi, N. Ito, T. Suzuki, T. Maruyama
Proc. of 1997 Topical meeting on Photorefractive Materials, Effects and Devices 208 - 211 1997.9
Double sinusoidal phase-modulating laser-diode interferometer using self-pumped phase-conjugate wave for measuring displacements of rough surface Reviewed
O. Sasaki, T. Manabe, X. Wang, T. Suzuki
Proc. of 1997 Topical meeting on Photorefractive Materials, Effects and Devices 523 - 526 1997.9
High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns Reviewed
XL Dai, O Sasaki, JE Greivenkamp, T Suzuki
APPLIED OPTICS 36 ( 25 ) 6190 - 6195 1997.9
Self-mixing type of phase-locked laser diode interferometer Reviewed
T Suzuki, S Hirabayashi, O Sasaki, T Maruyama
OPTICAL MANUFACTURING AND TESTING II 3134 512 - 519 1997
Two-wavelength laser diode interferometer with a time-sharing heterodyne modulation Reviewed
T Suzuki, T Aizaki, O Sasaki, T Maruyama
LASERS AS TOOLS FOR MANUFACTURING II 2993 192 - 199 1997
Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns Reviewed
XL Dai, O Sasaki, JE Greivenkamp, T Suzuki
APPLIED OPTICS 35 ( 28 ) 5657 - 5666 1996.10
Prifile measurement of multiple surfaces by heterodyne sinusoidal phase-modulating interferometry Reviewed
T. Nakada, O. Sasaki, K. Tsuji, T. Suzuki
Japanese journal of optics 25 ( 8 ) 473 - 477 1996.8
High-accuracy wide-range rotation angle measurement by using two parallel interference patterns Reviewed
X. Dai, O. Sasaki, J. E. Greivenkamp, T. Suzuki
Proc. of International Workshop on Interferometry 85 - 86 1996.8
Optical telemetering of temperature information in rotating spindle (2nd report) - development of high-speed multichannel optical telemetering system - Reviewed
K. Yokoyama, T. Suzuki, H. Hoshina
62 ( 7 ) 1009 - 1014 1996.7
Absolute distance measurement using wavelength-multiplexed phase-locked laser diode interferometry Reviewed
T Suzuki, O Sasaki, T Maruyama
OPTICAL ENGINEERING 35 ( 2 ) 492 - 497 1996.2
Evaluation of friction torque of rolling bearing Reviewed
K. Yokoyama, A. Tohyama, T. Suzuki
62 ( 2 ) 210 - 214 1996.2
Feedback type of laser diode interferometer with an optical fiber Reviewed
T Suzuki, T Okada, O Sasaki, T Maruyama
LASER INTERFEROMETRY VIII: TECHNIQUES AND ANALYSIS 2860 225 - 231 1996
K. Yokoyama, T. Suzuki, T. Hirakura, T. Moriwaki
Journal of the Japan Society of Precision Engineering 61 ( 11 ) 1583 - 1588 1995.11
EXACT MEASUREMENT OF FLAT SURFACE PROFILES BY OBJECT SHIFTS IN A PHASE-CONJUGATE FIZEAU INTERFEROMETER Reviewed
O SASAKI, Y TAKEBAYASHI, XZ WANG, T SUZUKI
OPTICAL ENGINEERING 34 ( 10 ) 2957 - 2963 1995.10
MEASUREMENT OF SMALL ROTATION ANGLES BY USING A PARALLEL INTERFERENCE PATTERN Reviewed
XL DAI, O SASAKI, JE GREIVENKAMP, T SUZUKI
APPLIED OPTICS 34 ( 28 ) 6380 - 6388 1995.10
RESPONSE CHARACTERISTICS OF A SELF-PUMPED PHASE-CONJUGATE MIRROR TO SPATIALLY NONUNIFORM PHASE-CHANGES OF AN INCIDENT WAVE AND THEIR APPLICATIONS Reviewed
XZ WANG, O SASAKI, T SUZUKI, T MARUYAMA
OPTICAL ENGINEERING 34 ( 4 ) 1184 - 1190 1995.4
Evaluation of friction torque and heat quantity generated in spindle (1st report) - development of evaluation system and evaluation of air spindle characteristics - Reviewed
K. Yokoyama, T. Suzuki, T. Hirakura, T. Moriwaki
61 ( 4 ) 511 - 515 1995.4
Measurement of small rotation angles by using a parallel interference pattern Reviewed
Xiaoli Dai, Osami Sasaki, John E. Greivenkamp, Takamasa Suzuki
Applied Optics 34 ( 28 ) 6380 - 6388 1995
High-speed multichannel optical telemetering system Reviewed
T Suzuki, K Yokoyama, H Hoshina
MACHINE TOOL, IN-LINE, AND ROBOT SENSORS AND CONTROLS 2595 11 - 18 1995
Absolute measurement of spherical surfaces using phase-conjugate waves Reviewed
O SASAKI, Y TAKEBAYASHI, T SUZUKI
INTERNATIONAL CONFERENCE ON OPTICAL FABRICATION AND TESTING 2576 193 - 197 1995
Sinusoidal phase-modulating laser diode interferometer using a self-pumped phase-conjugate mirror Reviewed
T SUZUKI, J HASEGAWA, O SASAKI, T MARUYAMA
INTERNATIONAL CONFERENCE ON OPTICAL FABRICATION AND TESTING 2576 299 - 307 1995
Response characteristics of self-pumped phase-conjugate wave to nonuniform phase changes of incident wave and their applications Reviewed
X. Wang, O. Sasaki, T. Suzuki, T. Maruyama
Proc. of ICO Topical meeting 148 - 148 1994.9
Superluminecent diode interferometer using sinusoidal phase-modulation for step profile measurement Reviewed
O. Sasaki, Y. Ikeda, T. Suzuki
Proc. of ICO Topical meeting 146 - 146 1994.9
REAL-TIME 2-DIMENSIONAL SURFACE PROFILE MEASUREMENT IN A SINUSOIDAL PHASE-MODULATING LASER-DIODE INTERFEROMETER Reviewed
T SUZUKI, O SASAKI, J KANEDA, T MARUYAMA
OPTICAL ENGINEERING 33 ( 8 ) 2754 - 2759 1994.8
SINUSOIDAL PHASE-MODULATING FIZEAU INTERFEROMETER USING A SELF-PUMPED PHASE CONJUGATOR FOR SURFACE PROFILE MEASUREMENTS Reviewed
XZ WANG, O SASAKI, Y TAKEBAYASHI, T SUZUKI, T MARUYAMA
OPTICAL ENGINEERING 33 ( 8 ) 2670 - 2674 1994.8
高精度実時間半導体レーザ干渉計に関する研究
鈴木孝昌
1994.3
IMPROVEMENT OF RESPONSE-TIME WITH AN ADDITIONAL BIAS BEAM IN A BATIO3 SELF-PUMPED PHASE-CONJUGATE MIRROR Reviewed
T SUZUKI, T SATO
APPLIED OPTICS 32 ( 21 ) 3959 - 3961 1993.7
REAL-TIME DISPLACEMENT MEASUREMENT USING SYNCHRONOUS DETECTION IN A SINUSOIDAL PHASE MODULATING INTERFEROMETER Reviewed
T SUZUKI, O SASAKI, S TAKAYAMA, T MARUYAMA
OPTICAL ENGINEERING 32 ( 5 ) 1033 - 1037 1993.5
SINUSOIDAL PHASE-MODULATING FIZEAU INTERFEROMETER USING PHASE-CONJUGATE WAVE Reviewed
O SASAKI, XZ WANG, Y TAKEBAYASHI, T SUZUKI
INTERFEROMETRY VI: TECHNIQUES AND ANALYSIS 2003 12 - 20 1993
DIFFERENTIAL TYPE OF PHASE-LOCKED LASER DIODE INTERFEROMETER FREE FROM EXTERNAL DISTURBANCE Reviewed
T SUZUKI, O SASAKI, K HIGUCHI, T MARUYAMA
APPLIED OPTICS 31 ( 34 ) 7242 - 7248 1992.12
NOVELTY IMAGING-SYSTEM WITH A DESIRED LONG-TIME SCALE USING BATIO3 AND A CONTROLLED SHUTTER SEQUENCE Reviewed
T SUZUKI, T SATO
APPLIED OPTICS 31 ( 5 ) 606 - 612 1992.2
Characteristic of the elimination of disturbance in the sinusoidal phase modulating laser diode interferometer Reviewed
K. Maeyama, O. Sasaki, T. Suzuki, T. Maruyama
21 ( 2 ) 113 - 118 1992.2
PHASE LOCKED LASER DIODE INTERFEROMETER Reviewed
O SASAKI, T SUZUKI, K HIGUCHI
LASER INTEROMETRY IV : COMPUTER-AIDED INTERFEROMETRY 1553 77 - 83 1992
2-WAVELENGTH SINUSOIDAL PHASE MODULATING LASER-DIODE INTERFEROMETER INSENSITIVE TO EXTERNAL DISTURBANCES Reviewed
O SASAKI, H SASAZAKI, T SUZUKI
APPLIED OPTICS 30 ( 28 ) 4040 - 4045 1991.10
PHASE-LOCKED LASER DIODE INTERFEROMETER - HIGH-SPEED FEEDBACK-CONTROL SYSTEM Reviewed
T SUZUKI, O SASAKI, K HIGUCHI, T MARUYAMA
APPLIED OPTICS 30 ( 25 ) 3622 - 3626 1991.9
DOUBLE SINUSOIDAL PHASE-MODULATING LASER DIODE INTERFEROMETER FOR DISTANCE MEASUREMENT Reviewed
O SASAKI, T YOSHIDA, T SUZUKI
APPLIED OPTICS 30 ( 25 ) 3617 - 3621 1991.9
Two-wavelength sinusoidal phase/modulating laser-diode interferometer insensitive to external disturbances Reviewed
Osami Sasaki, Hiroyuki Sasazaki, Takamasa Suzuki
Applied Optics 30 ( 28 ) 1991
Double sinusoidal phase-modulating laser diode interferometer for distance measurement Reviewed
Osami Sasaki, Tadahiko Yoshida, Takamasa Suzuki
Applied Optics 30 ( 25 ) 3617 - 3621 1991
SINUSOIDAL PHASE MODULATING LASER DIODE INTERFEROMETER WITH A FEEDBACK-CONTROL SYSTEM TO ELIMINATE EXTERNAL DISTURBANCE Reviewed
O SASAKI, K TAKAHASHI, T SUZUKI
OPTICAL ENGINEERING 29 ( 12 ) 1511 - 1515 1990.12
REAL-TIME DISPLACEMENT MEASUREMENT IN SINUSOIDAL PHASE MODULATING INTERFEROMETRY Reviewed
T SUZUKI, O SASAKI, K HIGUCHI, T MARUYAMA
APPLIED OPTICS 28 ( 24 ) 5270 - 5274 1989.12
Phase locked laser diode interferometry for surface profile measurement Reviewed
Takamasa Suzuki, Osami Sasaki, Takeo Maruyama
Applied Optics 28 ( 20 ) 4407 - 4410 1989.10
PHASE LOCKED LASER DIODE INTERFEROMETRY FOR SURFACE PROFILE MEASUREMENT Reviewed
T SUZUKI, O SASAKI, T MARUYAMA
APPLIED OPTICS 28 ( 20 ) 4407 - 4410 1989.10
SINUSOIDAL PHASE MODULATING LASER DIODE INTERFEROMETER WITH FEEDBACK-CONTROL SYSTEM TO ELIMINATE EXTERNAL DISTURBANCE Reviewed
O SASAKI, K TAKAHASHI, T SUZUKI
FRINGE PATTERN ANALYSIS 1163 14 - 21 1989
フィードバック型半導体レーザ干渉計の動作解析 Reviewed
鈴木孝昌, 佐々木修己, 丸山武男
光学 17 ( 12 ) 670 - 675 1988.12
電気の不思議
鈴木孝昌( Role: Joint author)
コロナ社 1995.10
Light Scattering and Reflection Characteristics Measurement System Using Michelson Interferometer-Measurement of Amplitude Reflectance of Glass Surfaces for Operation Test-
石井千皓, 中川瑞輝, 大河正志, 鈴木孝昌
Optics & Photonics Japan講演予稿集(CD-ROM) 2022 2022
2018 ( 1 ) 57 - 60 2018.3
2018 ( 1 ) 61 - 64 2018.3
International Cooperative Researches on Engineering Education Conducted by Niigata University
2017 ( 1 ) 69 - 72 2017.3
Student's International Activities in Two Decades in Faculty of Engineering, Niigata University
JSEE Annual Conference International Session proceedings : international cooperation in engineering education 31 - 34 2017
2016 ( 17 ) 45 - 48 2016.9
2014年日本光学界の研究動向 「9.干渉計測」 Invited
鈴木孝昌
光学 44 ( 4 ) 150 - 152 2015.4
Discussion about approving credits in engineering field between Germany and Japan-Globalization of engineering education-
佐藤孝, 坂本秀一, 清水忠明, 岡徹雄, 田邊裕治, 後藤康志, 佐々木朋裕, 鈴木孝昌
電気学会教育フロンティア研究会資料 FIE-15 ( 11-22 ) 2015
3H14 JASSO Scholarship for Aspiring Globalization of Engineering Students
SAKAMOTO Shuichi, SATO Takashi, SHIMIZU Tadaaki, SUZUKI Takamasa, OKA Tetsuo, SHIRAI Kenji
26 ( 62 ) 586 - 587 2014.8
D-11-35 Study on Sheet-Metal Inspection System Using A Multi-Camera Array
Chen Yangchao, Terasawa Norihisa, Muramatsu Shogo, Suzuki Takamasa, Oitate Toshiro
Proceedings of the IEICE General Conference 2014 ( 2 ) 35 - 35 2014.3
D-11-34 Scale Correction in Sheet-Metal Inspection System with Digital Camera
Oshiki Tomohiro, Terasawa Norihisa, Muramatsu Shogo, Suzuki Takamasa, Oitate Toshiro
Proceedings of the IEICE General Conference 2014 ( 2 ) 34 - 34 2014.3
Step-height measurement using self-pulsation laser diode Based on Fourier-domain OCT
54 - 57 2014
Kinect-Based Gesture Recognition for Metal Sheet Inspection System
YAO Hai, TERASAWA Norihisa, MURAMATSU Shogo, SUZUKI Takamasa, OITATE Toshiro
ITE Technical Report 37 ( 7 ) 89 - 90 2013.2
Short-Term Student Exchanges for Aspiring Globalization of Engineering Students
SATO T., SAKAMOTO S., SHIMIZU T., SUZUKI T., IKEDA H., GOTO Y., ANJA Hopf, OKA T.
2012 ( 35 ) 63 - 67 2012.12
Short Exchange Programs for Motivating Engineering Students to Study Abroad
SATO Takashi, SAKAMOTO Shuichi, SHIMIZU Tadaaki, SUZUKI Takamasa, IWABE Hiroyasu, OKA Tetsuo, GOTO Yasushi, YAMAGIWA Kazuaki, HOPF Anja, NARUMI Takatsune
2012 ( 1 ) 71 - 74 2012.3
KITAZAWA Shinya, WASHIZU Toru, WATANABE Hidenori, SATO Kotaro, TERASAWA Norihisa, HIROSAWA Akira, MURAMATSU Shogo, SUZUKI Takamasa, MURATA Mitsuyoshi, OITATE Toshiro
IEICE technical report. Signal processing 111 ( 486 ) 1 - 6 2012.3
A Proposal about the International Cooperation of Students in Engineering Fields
SATO Takashi, SAKAMOTO Shuichi, SHIMIZU Tadaaki, SUZUKI Takamasa, IKEDA Hideki, OKA Tetsuo, TANABE Yuji, OHKAWA Hideo
The Papers of Technical Meeting on Frontiers in Education, IEE Japan 2011 ( 1 ) 87 - 90 2011.3
11 - 14 2011
P-14 Good Practice for Education "Departure from Superficial Learning" : Case in Electrical and Electronic Engineering Design Education
OHDAIRA Yasuo, MURAMATSU Shougo, SHINBO Kazunari, FUKUI Satoshi, SUZUKI Takamasa
22 684 - 685 2010.8
1-212 Consideration about Engineering Education from International Point of View
SATO Takashi, SAKAMOTO Shuichi, SHIMIZU Tadaaki, SUZUKI Takamasa, TANABE Yuji, OHKAWA Hideo
22 222 - 223 2010.8
SATO Takashi, SAKAMOTO Shuichi, SHIMIZU Tadaaki, SUZUKI Takamasa, IKEDA Hideki, OKA Tetsuo, TANABE Yuji, OHKAWA Hideo
The Papers of Technical Meeting on Frontiers in Education, IEE Japan 2009 ( 17 ) 7 - 10 2009.8
P-11 Good Practice for Education "Departure from Superficial Learning" : Case in Department of Electrical and Electronic Engineering
SUZUKI Takamasa, SUGAWARA Akira, SHINBO Kazunari, HUKUI Satoshi, SHIMIZU Hidehiko, OHDAIRA Yasuo
21 604 - 605 2009.8
4-208 Meaning of the International Activities for the Students in Engineering : International Co-operation with Magdeburg University in Germany
SATO Takashi, SAKAMOTO Shuichi, SHIMIZU Tadaaki, SUZUKI Takamasa, TANABE Yuji, OHKAWA Hideo
21 270 - 271 2009.8
応用物理学会の教育・公益事業の取組みとして~北陸・信越支部による「リフレッシュ理科教室」~
坪井望, 鈴木孝昌, 大河正志, 新保一成, 大平泰生, 馬場暁, 岩野春男, 丸山武男
応用物理学会学術講演会講演予稿集 70th 2009
7-322 Differences of Engineering Education in German University and Japanese University
SATO Takashi, SAKAMOTO Shuichi, SHIMIZU Tadaaki, SUZUKI Takamasa, HASEGAWA Tomiichi, OHKAWA Hideo
20 574 - 575 2008.7
2008 31 - 34 2008
SASAKI Osami, SUZUKI Takamasa
Journal of the Japan Society of Precision Engineering Vol.69, No.10, pp. 1379-1382 ( 10 ) 1379 - 1382 2003
Improvement of Positioning Accuracy by Compensation for Thermal Elongation of Ball-Screw
Kodera Takehiko, Yokoyama Kazuhiro, Miyaguchi Kazuo, Nagai Yutaka, Suzuki Takamasa, Masuda Masami, Yazawa Takanori
Proceedings of JSPE Semestrial Meeting 2003 ( 0 ) 234 - 234 2003
回転軸温度情報のリモコン式データ伝送システムの研究
横山 和宏, 鈴木 孝昌, 小林 滋, 永井 豊
精密工学会大会学術講演会講演論文集 2002 ( 2 ) 67 - 67 2002.10
ボールねじ熱膨張の補正による位置決め精度向上の研究:第1報温度分布と熱膨張の推定
小寺 岳彦, 横山 和宏, 鈴木 孝昌, 宮口 和男, 永井 豊, 桝田 正美, 矢沢 孝哲
精密工学会大会学術講演会講演論文集 2002 ( 1 ) 6 - 6 2002.3
ワンチップマイコンを用いた光学式非接触データ伝送システムの開発 : 第4報システムの使用上のノウハウ
永井 豊, 横山 和宏, 鈴木 孝昌, 小林 滋, 小寺 岳彦
精密工学会大会学術講演会講演論文集 2002 ( 1 ) 4 - 4 2002.3
フィードバック型半導体レーザ干渉計による超精密計測技術
鈴木孝昌
応用光学 2001.12
N3 光熱変調を用いたフィードバック型2重正弦波位相変調半導体レーザ干渉計
須田, 広美, 鈴木, 孝昌, 佐々木, 修己
電子情報通信学会信越支部大会講演論文集 13 285 - 286 2001.10
佐々木修己, 鈴木孝昌
光技術コンタクト 39 ( 8 ) 501 - 509 2001.8
2000年光学界の進展 「9.干渉計測」
鈴木孝昌
光学 2001.4
ワンチップマイコンを用いた光学式非接触データ伝送システムの開発 : 第1報 マイコン利用による小電力化, 小型化
横山 和宏, 鈴木 孝昌, 小林 滋, 松平 雄策
精密工学会大会学術講演会講演論文集 2000 ( 2 ) 118 - 118 2000.9
ワンチップマイコンを用いた光学式接触データ伝達システムの開発 : 第2報 システムの測定精度, 伝送可能範囲
松平 雄策, 鈴木 孝昌, 小林 滋, 横山 和宏
精密工学会大会学術講演会講演論文集 2000 ( 2 ) 119 - 119 2000.9
Sinusoidal wavelength-scanning SLD interferometer with feedback control for real-time distance measurement
AKIYAMA Kazuhiro, SASAKI Osami, SUZUKI Takamasa
23 119 - 125 1999.6
半導体レーザ駆動回路の製作
鈴木孝昌
トランジスタ技術 1999.4
回転体内部における温度情報の非接触式光転送システムの開発 (第3報 フィルタリング・データ処理, 主軸各部の温度測定と主軸膨張の推定)
遠藤 覚, 横山 和宏, 鈴木 孝昌
精密工学会大会学術講演会講演論文集 1998 ( 1 ) 153 - 153 1998.3
回転体内部における温度情報の非接触式光転送システムの開発 (第2報 計測可能時間の延長と, 熱電対高温接点を主軸へ接触させた場合の現象)
遠藤 覚, 横山 和宏, 鈴木 孝昌
精密工学会大会学術講演会講演論文集 1997 ( 2 ) 32 - 32 1997.10
回転体内部における温度情報の非接触式転送システムの開発
星名 浩樹, 横山 和宏, 鈴木 孝昌
精密工学会大会学術講演会講演論文集 1996 ( 1 ) 575 - 576 1996.3
転がり軸受における軸受部摩擦トルクの評価に関する研究(続報 実験の結果)
横山 和宏, 鈴木 孝昌, 遠山 晃
精密工学会大会学術講演会講演論文集 1995 ( 2 ) 683 - 684 1995.9
佐藤拓宋, 佐々木修己, 鈴木孝昌, 亀山啓輔
計測と制御 32 ( 11 ) 895 - 901 1993.11
データ伝送システム
鈴木孝昌, 横山和宏, 小林滋
周期可変回折格子を用いた高速広帯域波長走査光源の構築とOCTへの展開
Grant number:21K04922
2021.4 - 2024.3
System name:科学研究費助成事業
Research category:基盤研究(C)
Awarding organization:日本学術振興会
鈴木 孝昌, 崔 森悦
Grant amount:\4160000 ( Direct Cost: \3200000 、 Indirect Cost:\960000 )
本研究の目的は、音響光学偏向器(AOD)を単なる光偏向器としてではなく、周期可変な回折格子として捉え、新たな原理の波長走査光源(SS)を構築するとともに、光コヒーレンストモグラフィ(OCT)への展開を図ることにある。
令和3年度は、研究実施計画に従い、以下の通り研究を進めた。
外乱の影響を排除しつつ機械的安定度を高めるため、専用の筐体を設計し、これまで使用実績のある840nm帯の無反射コート半導体レーザ(AR-LD)を用いて新提案の波長走査光源(SS)を構築した。ここで音響光学偏向器(AOD)の印過電圧を制御し、波長走査幅を測定したところ、約60nmの波長走査幅が得られた。また、測定された波長は、理論曲線に沿って変化することを確認した。ただし、ゲイン特性から期待される波長走査幅目標値(約80nm)の達成は困難であった。LDの損傷や劣化を考慮し、注入電流を低めに抑えたことが一因と考えられるが、他の要因に関して検証を行っていく必要がある。一方、波長走査周波数(速度)の上限値は、約50kHzであった。圧電素子(PZT)等を用いた機械的な波長走査に比較すると走査周波数は飛躍的に向上することが示された。ここまでの内容が、令和3年度実施計画に示された内容であり、研究は当初の計画通り遂行することができた。特に、AODを周期可変な回折格子とし用い、新たな原理に基づいてSSを構築できた意義は大きく、今後の光計測技術進展への寄与は大きいものと考えられる。
加えて、令和3年度は、以下に詳述の通りOCTシステムでの動作検証、特許出願、論文発表を行った。
Real-time full-field OCT using static swept source and wavelet transform
Grant number:16K04973
2016.4 - 2019.3
System name:Grants-in-Aid for Scientific Research
Research category:Grant-in-Aid for Scientific Research (C)
Awarding organization:Japan Society for the Promotion of Science
Suzuki Takamasa
Grant amount:\4680000 ( Direct Cost: \3600000 、 Indirect Cost:\1080000 )
Recently, optical coherence tomography has high demand for medical diagnosis. In this study, we developed low-cost and high-performance swept source (SS) by using acousto-optic deflector. Characteristics, such as wavelength scanning range, response time, optical power, have been improved in this SS. Moreover, OCT was configured with this SS. We confirmed that accurate image restoration was realized by using continuous wavelet transform instead of Fourier transform.
Theranostic study for neck micro-metastasis
Grant number:15K11303
2015.4 - 2018.3
System name:Grants-in-Aid for Scientific Research
Research category:Grant-in-Aid for Scientific Research (C)
Awarding organization:Japan Society for the Promotion of Science
TSUCHIMOCHI Makoto, HAYAMA Kazuhide, KAWASE Tomoyuki, KAMETA Ayako, FUJII Hirofumi, OKADA Yasuo, YAMAGUCHI Haruka, TSUBOKAWA Norio, SUZUKI Takamasa
Grant amount:\4940000 ( Direct Cost: \3800000 、 Indirect Cost:\1140000 )
We investigated the efficacy of the affibody near-infrared fluorescence imaging to detect EGFR-overexpressing metastatic oral cancer cells and treat the cells within cervical sentinel lymph nodes with photosensitizer binding affibody in a mouse model. The anti-EGFR affibodies conjugated with ICG and IR700 dye were used in this study. Our data suggest that ICG binding anti-EGFR affibody imaging shows direct visualization of metastatic lymph nodes and NIR irradiation can cause selective damage to EGFR-overexpressing metastatic cancer cells. Additional animal studies are required to determine the value of this approach for the treatment of sentinel lymph node metastasis.
クロスネットワークを機軸とした地域間データ共有機能を有する金属加工形状検証システムの研究開発
2010.4
System name:戦略的情報通信研究開発推進制度
Awarding organization:総務省
Grant type:Competitive
Grant amount:\5208000 ( Direct Cost: \3645600 、 Indirect Cost:\1562400 )
デジタル画像処理を用いて金属加工製品の穴位置および形状を高精度検出し,加工データとの自動照合を行う検査装置を新規に開発する。また,「認証」,「WEBコンテンツの配信」,「検査データの保存・配信」,「課金」など複数の機能を有するホストサーバーを立ち上げ,地域内あるいは地域間の金属加工工場で当該検査装置および検査データを認証セキュリテイレベルで共有化できるクロスネットワークを構築する。
Inner surface profile measurement of a cylindrical object by an oblique incidence and multiple-wavelength interferometer
Grant number:21560443
2009 - 2011
System name:Grants-in-Aid for Scientific Research
Research category:Grant-in-Aid for Scientific Research (C)
Awarding organization:Japan Society for the Promotion of Science
SASAKI Osami, SUZUKI Takamasa
Grant amount:\4680000 ( Direct Cost: \3600000 、 Indirect Cost:\1080000 )
A collimated line beam is incident at an oblique incident angle into an inner surface of a hydrodynamic bearing whose inner diameter and length are 3 mm and 3. 5 mm, respectively. Lights reflected in specified directions from the inner surface are selected to obtain an optical field whose phase distribution is proportional to the inner surface profile. This optical field interferes with a reference optical field in a multiple-wavelength interferometer using a tunable external cavity laser diode. Shapes of grooves with depth of about 5μm on the inner surface can be measured with an error less than 0. 3μm.
フルカラー映像表示を可能とする高輝度白色レーザ光源の開発
2008.4 - 2010.3
System name:エヌ・エス知覚科学振興会
Awarding organization:民間財団等
Grant type:Competitive
Grant amount:\950000 ( Direct Cost: \950000 )
映像表示の際にチラつきの原因となるスペックル雑音が半導体レーザをマルチモード発振させることによって改善できることを実験的に確認する。また,波長の異なる半導体レーザを組み合わせて得られた画像をCCDカメラで撮像し,輝度制御を行う方法を確立する。
小型・高エネルギー効率を特徴とする光ピンセットシステムの構築
2008.4 - 2010.3
System name:内田エネルギー科学振興財団
Awarding organization:民間財団等
Grant type:Competitive
Grant amount:\500000 ( Direct Cost: \500000 )
光源として小型の半導体レーザ,改造を施した顕微鏡システムを用い,小型・軽量・安価でエネルギー使用効率が良く使い易い光ピンセットシステムを実現する。
Sinusoidal wavelength-scanning interferometry for measurement of thickness and surface profiles of thin films
Grant number:19560419
2007 - 2008
System name:Grants-in-Aid for Scientific Research
Research category:Grant-in-Aid for Scientific Research (C)
Awarding organization:Japan Society for the Promotion of Science
SASAKI Osami, SUZUKI Takamasa
Grant amount:\4550000 ( Direct Cost: \3500000 、 Indirect Cost:\1050000 )
レーザー光とマイコンを利用した計測器の開発
2006.7 - 2007.3
System name:共同研究
Awarding organization:シンワ測定株式会社
波長多重走査型半導体レーザ光源によるインプロセス形状計測システムの実現
2006.4 - 2009.3
System name:科学研究費助成事業
Research category:基盤研究(C)
Awarding organization:日本学術振興会
Grant type:Competitive
Grant amount:\3300000 ( Direct Cost: \2730000 、 Indirect Cost:\570000 )
半導体レーザと回折格子を組み合わせた光外部共振器型半導体レーザに超音波光偏向器を挿入し,機械的な駆動を伴うことなく静的に発振波長を走査できることを示すとともに,その特性を明らかにした。通常の半導体レーザを用いたシステムにおける波長走査幅は1ナノメートル程度,AR半導体レーザを用いて,2ナノメートル程度の波長走査を実現した。
レーザー光を利用した計測器の開発
2005.6 - 2006.3
System name:共同研究
Awarding organization:シンワ測定株式会社
Generation of a ruler marking every wavelength and its application to nano measurement by a wavelength-scanning interferometer with double feedback control
Grant number:16560033
2004 - 2005
System name:Grants-in-Aid for Scientific Research
Research category:Grant-in-Aid for Scientific Research (C)
Awarding organization:Japan Society for the Promotion of Science
SASAKI Osami, SUZUKI Takamasa
Grant amount:\3600000 ( Direct Cost: \3600000 )
This research deals analyses and experiments about real-time measurement of a distance longer than a wavelength using sinusoidal wavelength-scanning (SWS) interferometer and double feedback control system. In addition to a conventional phase α an interference signal of SWS interferometer has phase-modulation amplitude Z_b that is proportional to the optical path difference (OPD) and amplitude b of the wavelength-scanning. Voltage applied to the PZT which gives a displacement to a reference mirror and makes the phase α equal to a constant value (2π or 3π/2) becomes a ruler with scales smaller than a wavelength. Voltage applied to a wavelength-scanning device that determines the amplitude b of the wavelength-scanning and makes the amplitude Z_b equal to π or 2π becomes a ruler marking every a wavelength. The calibration of the ruler marking every a wavelength could be made automatically with the double feedback control by changing the OPD at intervals of about a wavelength. These two rulers enabled us to measure an absolute distance longer than a wavelength in real-time.
A liquid-crystal Fabry-Perot interferometer (LC-FPI) was adopted as a wavelength-scanning device in the SWS interferometer with double feedback control. By incorporating double sinusoidal phase-modulation we obtained a better interference signal from which we could generate the feedback signal whose frequency bandwidth was equal to twice the frequency of the SWS. Because of the high resolution of the LC-FPI in the SWS we could obtained the upper limit of the measurement range to 200 μm. Moreover we used the phase lock of Z_b=2π instead of Z_b=π, so that the upper limit of the measurement range became 300 μm. We obtained all of stable points from 100 μm to 300 μm, and we measured the relative distance around the OPD of 270 μm with a high accuracy of the order of nanometer. Moreover, an acousto-optical tunable wavelength filter (AOTF) was also adopted as a wavelength-scanning device. In this case the repeatability of the stable points was higher that in the case of the LC-FPI.
A linear CCD image sensor was used to electrically scan a measuring point and measure one-dimensional step-profiles in real-time with this interferometer. Two different step profiles with a step height of 1 μm and 20 μm, respectively, were measured with the measurement error less than 8 nm. Measuring time for one measuring point was 0.04 s.
Three-dimensional tomographic imaging using wavelength-scanning laser and two-wave mixing and its applications to measurements
Grant number:13650458
2001 - 2002
System name:Grants-in-Aid for Scientific Research
Research category:Grant-in-Aid for Scientific Research (C)
Awarding organization:Japan Society for the Promotion of Science
SASAKI Osami, SUZUKI Takamasa
Grant amount:\2800000 ( Direct Cost: \2800000 )
This research deals analyses and experiments about gains of two-wave mixing using linear phase-modulated light whose phase changes repeatedly with a period in time. First, when a pump beam is linearly phase-modulated, time-varying intensity of the interference pattern in a photorefractive (PR) crystal contains zero frequency component which produces an index grating. The gain characteristics of the two-wave mixing depending on the amplitude of the zero frequency component are made clear. Next, the phase-modulation of a pump beam and a linear wavelength-scanning of a laser diode are used simultaneously to obtain tomographic images. Characteristics of the tomographic images are explained in detail through the gain characteristics. Finally, when the width of the wavelength-scanning is large, the amplitude of zero frequency component of the interference pattern differs within the PR crystal. It is shown that in this case the index grating is formed in a restricted region of the PR crystal. It is most suitable for the tomographic imaging to make an image of the object in PR crystal. We constructed an setup for the tomographic imaging to reconstruct images of patterns drawn on several sheets of polyvinyl chloride.
高速時分割変調を用いた2波長型半導体レーザ干渉計に関する研究
Grant number:08750508
1996
System name:科学研究費助成事業
Research category:奨励研究(A)
Awarding organization:日本学術振興会
鈴木 孝昌
Grant amount:\1100000 ( Direct Cost: \1100000 )
単一の半導体レーザを用いる時分割2波長型干渉計の測定精度を向上させるため、注入電流の切り替え周期を短くした高速時分割変調方式、フィードバック制御による外乱除去および実時間信号処理方式について検討し、以下の結果が得られた。
1.半導体レーザの発振波長をステップ的に高速に切り替えた場合、すなわち高速時分割変調した場合、半導体レーザの応答が遅く、正確な位相変調が得られないことがわかった。この点について、アリゾナ大学のJ.E.Greivenkamp博士と相談した結果、発振波長の切り替えをステップ的にではなく正弦波的に行う方式が有効ではないかとの結論に達した。今後この方式について、詳しく検討していく予定である。
2.時分割変調によって得られる干渉信号と、通常の干渉信号とを比較したところ、高速時分割変調では、波長変調効率が著しく低下することがわかった。この対策として、高速時分割変調下での波長変調効率の評価方法を提案し、その有効性を実験的に明らかにした。
3.時分割変調によって得られた不連続な干渉信号を連続化するための信号処理方式を検討し、連続化に伴う誤差解析を行った。その結果、実時間処理を行うためには、電子回路を用いたサンプル・ホールド処理が有効であることを示した。また、距離測定は、各波長に対応した干渉信号間の位相差に比例するため、連続化に伴う誤差はほとんど無視できることがわかった。
4.時分割変調により、同時に得られた2つの干渉信号から、被検面の位相を求めるための信号処理方式を理論、回路方式の両面から検討した。その結果、自己相関関数を用いる方法が簡単で、実時間処理にも向いていることがわかった。
5.測定に当たっては、フィードバックによる外乱の除去を行い、測定精度向上が図れることを確認した。
半導体レーザ位相共役光を用いる高精度干渉計測系に関する研究
Grant number:07750485
1995
System name:科学研究費助成事業
Research category:奨励研究(A)
Awarding organization:日本学術振興会
鈴木 孝昌
Grant amount:\900000 ( Direct Cost: \900000 )
半導体レーザを用いて発生させた位相共役光に対する直接変調特性の明確化と、位相共役干渉計のビジビリティ改善について研究を行い、以下の成果を得た。
1)半導体レーザ位相共役光の可干渉性低下の原因を調べるため、NDフィルターを用い、位相共役光の半導体レーザへの戻り光強度制御を行った。この結果、戻り光強度と干渉計のビジビリティの関係が明らかとなった。次に、アイソレーション比60dBの光アイソレータを用いて干渉計を構成したところ、ビジビリティが改善され、良好な干渉信号を観測できることを確認した。
2)半導体レーザを数Hzから数百kHzに亘って正弦波状に変調し、位相共役光の強度に対する影響を調べた。この結果、変調波形を正弦波とし、変調振幅を小さく抑えれば、位相共役光の強度変化は生じず、良好な干渉信号が得られることが確認できた。
以上の実験結果を踏まえ、光アイソレータを用いた干渉計を構成し、位相共役光の強度が変化しない条件のもとで、正弦波位相変調干渉信号の検出を行った。また、CCDイメージセンサを用いた位相検出回路により、この干渉信号を処理し、波面の位相分布を高精度にかつ高速に測定できることが示された。
半導体レーザ直接変調により、位相共役干渉計における位相変調が高速に行える見通しを得ることができた。今後、位相共役光を用いた応用計測に関する研究を進める上で、大きな前進があったと考えられる。
実時間3次相関およびバイスペクトル解析器に関する研究
Grant number:06750447
1994
System name:科学研究費助成事業
Research category:奨励研究(A)
Awarding organization:日本学術振興会
鈴木 孝昌
Grant amount:\900000 ( Direct Cost: \900000 )
まず、実時間3次相関解析器を構成するために、高周波発振器、振幅変調器、高周波電力増幅器よりなる超音波振動子駆動回路、および光学ガラスで作った水槽を用い、超音波回折格子が理論通り得られることを確認した。この超音波回折格子にヘリウム・ネオン・レーザ光を入射し、ラマン・ナ-ス回折光のうち3次回折光をピンホールで選択的に取り出すことにより、実時間で3次相関像を観測することができた。ここで得られた結果を以下に示す。
1)高周波発振器に可変容量ダイオートを用い、発振周波数を電圧で制御できる構成とした。これにより、超音波振動子をその共振周波数で駆動でき、回折効率を上げることが可能であることがわかった。
2)ラマン・ナ-ス回折で得られる3次回折光は、強度が非常に弱いため、ピンホールを通ったわずかな0次光およぴ他の回折光、すなわち背景光の影響で、コントラストが低下する。コンピュータに取り込んだ3次相関像から背景光による画像を減算処理することにより、コントラストを改善できることを確認した。
次に、液晶を用いた2次元フーリエ変換光学系を用い、バイスペクトル回折器構成のための予備実験を行った。この結果、以下のことが明らかとなった。
1)当初予想した通り、液晶面内に存在する電極構造を反映した空間スペクトルが観測される。しかし、液晶に入力される3次相関像が高次の空間スペクトルを有していないことを考慮すれば、電極構造による空間スペクトルの影響は無視し得る。
2)液晶に入力される3次相関像によって生成された空間スペクトルの分布はは0次光付近に出現するが、非常に強い0次光にマスクされ、実時間バイスペクトル像の観測を行うことはできなかった。今後、0次光の影響を除去する方法を検討する必要がある。
時分割2波長型半導体レーザ干渉計に関する研究
Grant number:05750405
1993 - 1994
System name:科学研究費助成事業
Research category:奨励研究(A)
Awarding organization:日本学術振興会
鈴木 孝昌
Grant amount:\900000 ( Direct Cost: \900000 )
まず、発振波長変化幅の正確な同定を行なうため、注入電流に対する発振波長の変化量すなわち変調効率を測定した。この結果、変調効率は、6.8×10^<-3>nm/mAであった。次に、当初の計画通り、2系統の離散時間制御系を構成し、干渉信号の位相を時分割でフィードバック制御した。これにより、piだけ離れた2つの位相安定点で干渉信号の位相を独立にフェーズロックできることが確認できた。しかしながら、単にフィードバック制御を施した場合の測定誤差は数mmであった。そのため、誤差原因を検討し、測定誤差の除去を行なった。以下に誤差原因とその対策を示す。
1.位相差がpiである場合、注入電流の差が非常に小さくなり、電流の差、すなわち等価波長を正確に測定することが困難であった。このため、注入電流の大きさを決定する積分器の出力を減衰器によって減衰し、積分器自体の出力を等価的に大きく測定できるよう改良を加えた。
2.1.では減衰器を2つの積分器に対して、それぞれ1つずつ設けていたため、減衰器でのゲインの差が注入電流の値の差となって現れた。そこで、2つあった減衰器を電流切り替え用スイッチの後方に移動し、1つにまとめた。これによって、減衰器でのゲインの差による誤差を除去できた。
3.干渉信号から生成するフィードバック信号は、sinalphaあるいはcosalphaであり、本来直流分を含まないはずであるが、レーザ光の強度変調の影響等により、若干オフセットがのる場合が観測された。オフセットがあると、2つの位相安定点の位相差が完全にpiとはならず、測定誤差を生ずる。そこで、レーザ光の強度変調を抑制するとともに、制御開始前のフィードバック信号のオフセット除去を行なった。
以上の誤差原因を除去した結果、標準偏差0.3mmで距離の絶対測定を行なえることが確認できた。
位相共役を用いた波面位相歪補正機能を有するオプティカル・リミターに関する研究
Grant number:04750033
1992
System name:科学研究費助成事業
Research category:奨励研究(A)
Awarding organization:日本学術振興会
鈴木 孝昌
Grant amount:\800000 ( Direct Cost: \800000 )
非線形光学結晶とシャッター系列を用いる運動物体の速度フィルタ光画像処理
Grant number:03750024
1991
System name:科学研究費助成事業
Research category:奨励研究(A)
Awarding organization:日本学術振興会
鈴木 孝昌
Grant amount:\900000 ( Direct Cost: \900000 )
外乱除去機能をもつフェ-ズロック半導体レ-ザ-干渉計による実時間表面形状計測
Grant number:02650027
1990
System name:科学研究費助成事業
Research category:一般研究(C)
Awarding organization:日本学術振興会
佐々木 修己, 鈴木 孝昌
Grant amount:\1500000 ( Direct Cost: \1500000 )
光源として半導体レ-ザを用い,半導体レ-ザの発振波長可能性を積極的に利用することにより,周囲の環境条件の悪い工場内においても,数ナノメ-タの精度で表面形状を実時間で容易に測定できる高精度なフェ-ズロック半導体レ-ザ干渉計を構成した。
半導体レ-ザ干渉計では,温度変化に伴う半導体レ-ザの発振波長の変動や光学部品の機械的振動などの外乱により,干渉信号の位相が変動する。この位相変動が表面形状として測定されるため正確な表面形状計測が困難となる。そこで,外乱による位相変動を固定された測定点において検出し,測定点を走査することにより得られる表面形状から,この位相変動を差し引くことにより,正しい表面形状を得る。この2つの測定点に対するフェ-ズロックのフィ-ドバック制御の操作を交互に行い、外乱を除去しながら高い測定精度で表面形状計測を行った。
まず,外乱除去の基本特性を調べるために走査する測定点を固定した。干渉計内のミラ-を正弦波振動させることで位相変動を与えた。走査する測定点と固定された測定点で検出されたそれぞれの位相変動の差の2乗和平均根を求め,外乱除去の程度を評価した。その結果,完全に除去されずに残る外乱の大きさは5ナノメ-タ位であることが示された。
次に,ダイヤモンドバイトで切削されたアルミニウム円板の表面形状を測定した。繰り返し測定精度は,外乱を除去しない時は約20ナノメ-タであるのに対し,外乱を除去した時は約5ナノメ-タであり,外乱による影響を約1/4以下に抑えることができた。
最後に,アルゴンレ-ザを光源とする正弦波位相変調干渉計を本フェ-ズロック干渉計と同時に用い,2波長干渉計を試みた。これにより,ミクロンオ-ダの大きな変化をもつ表面形状を,同様なフィ-ドバック制御によって実時間で測定できることを原理的に確かめた。
Study on laser diode interferometry
1987.10
System name:Ordinary Research
Grant type:Competitive
生命保険を考える
電子情報通信実験II
異文化と技術
マーケット・インターンシップ
創造プロジェクトII
創造プロジェクト基礎
テクノロジー・インターンシップ
創造研究プロジェクトII
論文輪講I
論文輪講II
電子情報通信設計製図
電子情報通信実験IIB
電子情報通信実験IIA
創造研究プロジェクトI
電子情報通信実験IIIA
システム制御工学
電子回路
ディジタル回路
総合工学概論
電子情報通信実験IB
電子情報通信実験IA
総合技術科学演習
工学リテラシー入門(情報電子分野)
創造プロジェクトII
創造プロジェクト基礎
テクノロジー・インターンシップ
創造プロジェクトI
創造研究プロジェクトⅠ
創造研究プロジェクトⅡ
制御工学
技術英語入門
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中間発表
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電気情報工学博士セミナーⅡ
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企業における生産・開発
電気情報工学特定研究Ⅰ
異文化と技術
電気電子工学特定研究Ⅱ
電気電子工学研究発表演習(中間発表)
電気電子工学セミナーⅠ
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電気電子工学文献詳読Ⅱ
電気電子工学セミナーⅡ
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自然科学総論Ⅲ
論理回路
放射伝達論
電気電子創造設計
卒業研修
工学リテラシー入門(電気電子工学科)
制御工学I
ナノ測定論
スタディスキルズ(電気電子工学)
電気電子工学基礎実験
光システム機器特論
卒業研究
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電気電子工学実験IV
電気電子設計製図
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制御工学II
電気電子演習
卒業基礎研究
光計測機器論
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