Updated on 2026/03/22

写真a

 
MASUDA Atsushi
 
Organization
Academic Assembly Institute of Science and Technology JOUHOU DENSHI KOUGAKU KEIRETU Professor
Faculty of Engineering Department of Engineering Professor
Graduate School of Science and Technology Electrical and Information Engineering Professor
Title
Professor
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Degree

  • 博士(工学) ( 1996.3   金沢大学 )

  • 修士(工学) ( 1992.3   金沢大学 )

  • 経済学士 ( 1990.3   京都大学 )

Research Interests

  • chemical vapor deposition

  • semiconductor

  • 化学気相成長

  • 半導体

Research Areas

  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Electric and electronic materials

  • Nanotechnology/Materials / Thin film/surface and interfacial physical properties

  • Nanotechnology/Materials / Crystal engineering

  • Nanotechnology/Materials / Applied physical properties

Research History (researchmap)

  • - Research Associate, School of Materials Science,

    1996

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  • - 北陸先端科学技術大学院大学材料科学研究科 助手

    1996

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  • 日本学術振興会 特別研究員

    1994 - 1996

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  • Research Fellow of the Japan Society for

    1994 - 1996

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  • the Promotion of Science

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  • Japan Advanced Institute of Science and Technology

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Research History

  • Niigata University   Institute of Science and Technology, Academic Assembly   Professor

    2025.7

  • Niigata University   Faculty of Engineering Department of Engineering   Professor

    2020.4

Education

  • Kanazawa University   自然科学研究科   物質科学

    - 1996

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    Country: Japan

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  • Kanazawa University   Graduate School, Division of National Science and Technology

    - 1996

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  • Kyoto University   Faculty of Economics   経営

    - 1990

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    Country: Japan

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  • Kyoto University   Faculty of Economics

    - 1990

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Papers

  • Influence of acceleration testing and anti-reflection coating on crystalline Si photovoltaic unencapsulated modules with polycarbonate base

    Yo Yamakawa, Yuta Mikami, Yasuhiro Okada, Yohei Ogashiwa, Hiroaki Takahashi, Naoshi Kimura, Taichi Uemura, Yasuaki Ishikawa, Mitsunori Nagahara, Keisuke Ohdaira, Kazuhiro Gotoh, Atsushi Masuda

    Japanese Journal of Applied Physics   64 ( 6 )   06SP02 - 06SP02   2025.6

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    Abstract

    A new concept of unencapsulated photovoltaic (PV) modules was developed to avoid several degradation phenomena caused by encapsulation materials, to facilitate recycling of PV modules. The reliability and durability of the new concept module were investigated through damp heat (DH) and thermal cycling (TC) tests. The maximum output power of the new concept module did not decrease significantly after 3000 h of DH testing and 1200 cycles of TC testing. Furthermore, no significant decrease was also observed in sequential testing of the total of 1800 h of DH testing and 600 cycles of TC testing. It was also found that UV absorbers prevent degradation of polycarbonate cover material used to enable to be lightweight and installed on curved surface and that MgF<sub>2</sub> coating on cover material suppresses reflection loss of incident light. These experimental results indicate that unencapsulated PV modules are reliable enough for replacing conventional modules.

    DOI: 10.35848/1347-4065/add7e4

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/add7e4/pdf

  • Influences of surface contaminating elements on potential-induced degradation of crystalline silicon solar cells

    Yiming Qin, Asahi Yonemoto, Marwan Dhamrin, Keisuke Ohdaira, Kazuhiro Gotoh, Atsushi Masuda

    Solar Energy Materials and Solar Cells   282   113413 - 113413   2025.4

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.solmat.2025.113413

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  • Annual trends of indoor output measurement results from photovoltaic modules exposed outdoors in Tosu city, Japan

    Yasuo Chiba, Tetsuyuki Ishii, Ritsuko Sato, Sungwoo Choi, Minoru Akitomi, Atsushi Masuda

    Japanese Journal of Applied Physics   62 ( SK )   SK1036 - SK1036   2023.5

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    Abstract

    Annual trends of indoor output measurement (P <sub>max(stc)</sub>) results from photovoltaic modules exposed outdoors in Tosu city from 2012 to 2022 were investigated. The P <sub>max(stc)</sub> of mono-Si (E-1A), as conventional Si modules, was almost unchanged from 2012 to 2022; however, that of mono-Si (E-1B), as conventional Si modules, decreased after 2019. In the case of Si heterojunction modules, a moderate degradation rate is expected with prolonged exposure. In the case of passivated emitter and rear cell modules, it was found that characteristics due to light and elevated-temperature induced degradation were observed with good reproducibility in 2021 and 2022.

    DOI: 10.35848/1347-4065/acc66c

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/acc66c/pdf

  • Encapsulation-free crystalline silicon photovoltaic modules and their hygrothermal and thermal-cycle tolerance

    Nobuhito Imajo, Yo Yamakawa, Hiroaki Takahashi, Keisuke Ohdaira, Atsushi Masuda

    Japanese Journal of Applied Physics   62 ( SK )   SK1025 - SK1025   2023.4

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    Abstract

    A novel concept of unencapsulated modules was developed to avoid many degradation phenomena originating from encapsulants, reduce material costs, and also allow for both easy cell repair and easy recycling of modules. The reliability and durability of the novel concept modules were investigated using damp-heat (DH) testing, thermal-cycle (TC) testing, and sequential testing including DH and TC testing. No large reduction in maximum power after DH testing for 2700 h or TC testing for 1000 cycles was found for unencapsulated modules, irrespective of cell-connection method, cell spacing, or the existence of intentional microcracks. However, because of thermomechanical stress, unstable contact between interconnector ribbons and busbar electrodes was found after TC testing. Superiority of shingling connections was found for this novel concept of unencapsulated modules.

    DOI: 10.35848/1347-4065/acc8dd

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/acc8dd/pdf

  • Second-stage potential-induced degradation of n-type front-emitter crystalline silicon photovoltaic modules and its recovery

    Keisuke OHDAIRA, Yutaka Komatsu, Seira Yamaguchi, Atsushi MASUDA

    Japanese Journal of Applied Physics   2023.4

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    Abstract

    We investigate the second-stage potential-induced degradation (PID) of n-type front-emitter (n-FE) crystalline silicon (c-Si) photovoltaic (PV) modules. The PID of n-FE c-Si PV modules is known to occur in three stages under negative bias stress. The second-stage PID is characterized by a reduction in fill factor (FF), due to the invasion of sodium (Na) into the depletion region of a p+–n junction and resulting increase in recombination current. The second-stage PID shows a curious independence on a negative bias voltage for the PID stress. This may indicate that the Na inducing the FF reduction comes not from the cover glass but originally exists on and/or near the cell surface. The FF reduction is recovered quite rapidly, within a few seconds, by applying a positive bias to the degraded cell. The recovered n-FE c-Si PV modules show more rapid degradation if they receive the negative bias stress again, which can be explained by Na remaining in the p+ emitter.

    DOI: 10.35848/1347-4065/accb60

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/accb60/pdf

  • Potential-induced degradation of n-type front-emitter crystalline silicon photovoltaic modules — Comparison between indoor and outdoor test results

    Keisuke Ohdaira, Minoru Akitomi, Yasuo Chiba, Atsushi Masuda

    Solar Energy Materials and Solar Cells   249   112038 - 112038   2023.1

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.solmat.2022.112038

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  • Mechanistic Understanding of Polarization‐Type Potential‐Induced Degradation in Crystalline‐Silicon Photovoltaic Cell Modules

    Seira Yamaguchi, Atsushi Masuda, Kazuhiro Marumoto, Keisuke Ohdaira

    Advanced Energy and Sustainability Research   2200167 - 2200167   2022.12

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    Publishing type:Research paper (scientific journal)   Publisher:Wiley  

    DOI: 10.1002/aesr.202200167

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    Other Link: https://onlinelibrary.wiley.com/doi/full-xml/10.1002/aesr.202200167

  • Polarization-Type Potential-Induced Degradation in Front-Emitter p-Type and n-Type Crystalline Silicon Solar Cells

    Seira Yamaguchi, Sachiko Jonai, Kyotaro Nakamura, Kazuhiro Marumoto, Yoshio Ohshita, Atsushi Masuda

    ACS Omega   2022.10

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    Publishing type:Research paper (scientific journal)   Publisher:American Chemical Society (ACS)  

    DOI: 10.1021/acsomega.2c03866

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  • Effects of SiN <sub> <i>x</i> </sub> refractive index and SiO <sub>2</sub> thickness on polarization‐type potential‐induced degradation in front‐emitter n‐type crystalline‐silicon photovoltaic cell modules

    Seira Yamaguchi, Kyotaro Nakamura, Taeko Semba, Keisuke Ohdaira, Kazuhiro Marumoto, Yoshio Ohshita, Atsushi Masuda

    Energy Science &amp; Engineering   10 ( 7 )   2268 - 2275   2022.3

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    Publishing type:Research paper (scientific journal)   Publisher:Wiley  

    DOI: 10.1002/ese3.1135

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    Other Link: https://onlinelibrary.wiley.com/doi/full-xml/10.1002/ese3.1135

  • Effect of temperature and pre-annealing on the potential-induced degradation of silicon heterojunction photovoltaic modules

    Jiaming Xu, Huynh Thi Cam Tu, Atsushi MASUDA, Keisuke OHDAIRA

    Japanese Journal of Applied Physics   61 ( SC )   SC1021 - SC1021   2021.12

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    <title>Abstract</title>
    We investigate the effect of temperature and pre-annealing on the potential-induced degradation (PID) of silicon heterojunction (SHJ) photovoltaic (PV) modules. SHJ PV modules show a faster decrease in short-circuit current density (Jsc) at higher temperatures during PID tests. We also observe a complex relationship between the degree of the Jsc decrease and temperature during the PID tests. Pre-annealing before the PID tests at sufficiently high temperatures leads to the complete suppression of the PID of SHJ PV modules. The decrease in Jsc is known to be due to the chemical reduction of indium (In) in transparent conductive oxide (TCO) films in SHJ cells, in which water (H2O) in SHJ modules is involved. These indicate that H2O may out-diffuse from the SHJ PV modules during a PID test or pre-annealing at sufficiently high temperatures, by which the chemical reduction of indium in TCO into metallic In is suppressed.

    DOI: 10.35848/1347-4065/ac3f6e

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/ac3f6e/pdf

  • Potential‐Induced Degradation in High‐Efficiency n‐Type Crystalline‐Silicon Photovoltaic Modules: A Literature Review

    Seira Yamaguchi, Bas B. Van Aken, Atsushi Masuda, Keisuke Ohdaira

    Solar RRL   5 ( 12 )   2100708 - 2100708   2021.11

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    Publishing type:Research paper (scientific journal)   Publisher:Wiley  

    DOI: 10.1002/solr.202100708

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    Other Link: https://onlinelibrary.wiley.com/doi/full-xml/10.1002/solr.202100708

  • Influence of light irradiation on the charge-accumulation-type potential-induced degradation of n-type front-emitter crystalline Si photovoltaic modules

    Rongrong Zhao, Huynh Thi Cam Tu, Atsushi MASUDA, Keisuke OHDAIRA

    Japanese Journal of Applied Physics   61 ( SB )   SB1023 - SB1023   2021.9

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    Abstract

    We investigated the influence of light irradiation on the charge-accumulation-type potential-induced degradation (PID) of n-type front-emitter (n-FE) crystalline silicon (c-Si) photovoltaic (PV) modules. A PID test under one-sun irradiation leads to faster reductions of short-circuit current–density (J<sub>sc</sub>) and open-circuit voltage (V<sub>oc</sub>) compared to the case of a PID test in the dark. This indicates that light irradiation accelerates the charge-accumulation-type PID of the n-FE PV modules. The J<sub>sc</sub> and V<sub>oc</sub> reductions become slower under irradiation without ultraviolet (UV) light, showing almost the same time dependence as the PID test in the dark. The acceleration of PID by the addition of UV light may be explained by the excitation of electrons at K<sup>0</sup> centers in silicon nitride (SiN<sub>x</sub>) and their faster drift to the surface by the electric field applied to SiN<sub>x</sub>.

    DOI: 10.35848/1347-4065/ac279f

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/ac279f/pdf

  • Effects of passivation configuration and emitter surface doping concentration on polarization-type potential-induced degradation in n-type crystalline-silicon photovoltaic modules

    Seira Yamaguchi, Bas B. Van Aken, Maciej K. Stodolny, Jochen Löffler, Atsushi Masuda, Keisuke Ohdaira

    Solar Energy Materials and Solar Cells   226   111074 - 111074   2021.7

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.solmat.2021.111074

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  • Influence of light illumination on the potential-induced degradation of n-type interdigitated back-contact crystalline Si photovoltaic modules

    Yuansong Xu, Atsushi MASUDA, Keisuke OHDAIRA

    Japanese Journal of Applied Physics   60 ( SB )   SBBF08 - SBBF08   2021.1

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    Abstract

    We investigate the potential-induced degradation (PID) of n-type interdigitated back-contact (IBC) crystalline Si (c-Si) photovoltaic (PV) modules under a negative bias stress and the influence of light illumination on the PID. IBC PV modules show PID characterized by a reduction in the short-circuit current density (J<sub>sc</sub>) and open-circuit voltage (V<sub>oc</sub>) under negative bias stress, while no fill factor (FF) reduction is observed. The degradation may originate from the introduction of sodium (Na) into c-Si and the resulting enhancement of carrier recombination on the surfaces of the IBC cells. Light illumination of 1 sun during the negative bias PID test results in less severe reductions of J<sub>sc</sub> and V<sub>oc</sub>. A reduction in the electric field on the surface Si nitride (SiN<sub>x</sub>) film, due to carrier generation in the SiN<sub>x</sub> and the resulting increase in its conductivity, is a possible explanation for the mitigation of the Na-related PID.

    DOI: 10.35848/1347-4065/abd9cf

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/abd9cf/pdf

  • Potential-induced degradation in photovoltaic modules composed of interdigitated back contact solar cells in photovoltaic systems under actual operating conditions

    Tetsuyuki Ishii, Sungwoo Choi, Ritsuko Sato, Yasuo Chiba, Atsushi Masuda

    PROGRESS IN PHOTOVOLTAICS   28 ( 12 )   1322 - 1332   2020.12

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1002/pip.3329

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  • Effect of a silicon nitride film on the potential-induced degradation of n-type front-emitter crystalline silicon photovoltaic modules

    Tomoyasu Suzuki, Atsushi Masuda, Keisuke Ohdaira

    Japanese Journal of Applied Physics   59 ( 10 )   104002 - 104002   2020.10

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    DOI: 10.35848/1347-4065/abb39e

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/abb39e/pdf

  • Influence of emitter position of silicon heterojunction photovoltaic solar cell modules on their potential-induced degradation behaviors Reviewed

    Seira Yamaguchi, Chizuko Yamamoto, Yoshio Ohshita, Keisuke Ohdaira, Atsushi Masuda

    Solar Energy Materials and Solar Cells   216   110716 - 110716   2020.10

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.solmat.2020.110716

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  • Influence of hygrothermal stress on potential-induced degradation for homojunction and heterojunction crystalline Si photovoltaic modules Reviewed

    Atsushi MASUDA, Chizuko Yamamoto, Yukiko Hara, Sachiko Jonai, Yasushi Tachibana, Takeshi Toyoda, Toshiharu Minamikawa, Seira Yamaguchi, Keisuke OHDAIRA

    Japanese Journal of Applied Physics   2020.6

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    DOI: 10.35848/1347-4065/ab9a8a

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/ab9a8a/pdf

  • Influence of backsheet materials on potential-induced degradation in n-type crystalline-silicon photovoltaic cell modules Reviewed

    Seira Yamaguchi, Chizuko Yamamoto, Atsushi Masuda, Keisuke Ohdaira

    Japanese Journal of Applied Physics   58   120901   2019.12

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    Publishing type:Research paper (scientific journal)   Publisher:Japan Society of Applied Physics  

    DOI: 10.7567/1347-4065/ab4fd2

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  • Effect of additives in electrode paste of p-type crystalline Si solar cells on potential-induced degradation Reviewed

    Sachiko Jonai, Aki Tanaka, Kazuo Muramatsu, Genki Saito, Kyotaro Nakamura, Atsushi Ogura, Yoshio Ohshita, Atsushi Masuda

    Solar Energy   188   1292 - 1297   2019.8

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1016/j.solener.2019.07.012

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  • Correction: Corrosion-induced AC impedance elevation in front electrodes of crystalline silicon photovoltaic cells within field-aged photovoltaic modules (IEEE Journal of Photovoltaics (2019) 9:3 (741-751) DOI: 10.1109/JPHOTOV.2019.2893442)

    Tadanori Tanahashi, Norihiko Sakamoto, Hajime Shibata, Atsushi Masuda

    IEEE Journal of Photovoltaics   9 ( 4 )   1154   2019.7

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:IEEE Electron Devices Society  

    DOI: 10.1109/JPHOTOV.2019.2914944

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  • Corrosion under Front Electrodes of Crystalline Silicon Photovoltaic Cells Predominantly Contributes to Their Performance Degradation

    Tadanori Tanahashi, Norihiko Sakamoto, Hajime Shibata, Atsushi Masuda

    Conference Record of the IEEE Photovoltaic Specialists Conference   2013 - 2016   2019.6

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    Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:Institute of Electrical and Electronics Engineers Inc.  

    DOI: 10.1109/PVSC40753.2019.8980636

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  • Influence of sodium on the potential-induced degradation for n-type crystalline silicon photovoltaic modules Reviewed

    Keisuke Ohdaira, Yutaka Komatsu, Tomoyasu Suzuki, Seira Yamaguchi, Atsushi Masuda

    Applied Physics Express   12   064004   2019.5

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    Publishing type:Research paper (scientific journal)   Publisher:Japan Society of Applied Physics  

    DOI: 10.7567/1882-0786/ab1b1a

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  • Rapid progression and subsequent saturation of polarization-type potential-induced degradation of n-type front-emitter crystalline-silicon photovoltaic modules Reviewed

    Seira Yamaguchi, Kyotaro Nakamura, Atsushi Masuda, Keisuke Ohdaira

    JAPANESE JOURNAL OF APPLIED PHYSICS   57 ( 12 )   122301 - 122301   2018.11

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    DOI: 10.7567/JJAP.57.122301

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    Other Link: http://stacks.iop.org/1347-4065/57/i=12/a=122301?key=crossref.5485a894772dfb5c9216eef15e093937

  • Performance degradation due to outdoor exposure and seasonal variation in amorphous silicon photovoltaic modules Reviewed

    Sungwoo CHOI, Tetsuyuki ISHII, Ritsuko SATO, Yasuo CHIBA, Atsushi MASUDA

    Thin Solid Films   661   116 - 121   2018.9

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1016/j.tsf.2018.07.017

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  • Sodium distribution at the surface of silicon nitride film after potential-induced degradation test and recovery test of photovoltaic modules

    Fumitaka Ohashi, Yoshiki Mizuno, Hiroki Yoshida, Hiroya Kosuga, Taishi Furuya, Ryo Fuseya, Ruben Jerónimo Freitas, Yukiko Hara, Atsushi Masuda, Shuichi Nonomura

    Japanese Journal of Applied Physics   57 ( 8 )   2018.8

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    Publishing type:Research paper (international conference proceedings)  

    DOI: 10.7567/JJAP.57.08RG05

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  • Localization and characterization of a degraded site in crystalline silicon photovoltaic cells exposed to acetic acid vapor Reviewed

    Tadanori Tanahashi, Norihiko Sakamoto, Hajime Shibata, Atsushi Masuda

    IEEE Journal of Photovoltaics   8 ( 4 )   997 - 1004   2018.7

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:IEEE Electron Devices Society  

    DOI: 10.1109/JPHOTOV.2018.2839259

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  • Multistage performance deterioration in n-type crystalline silicon photovoltaic modules undergoing potential-induced degradation Reviewed

    Yutaka Komatsu, Seira Yamaguchi, Atsushi Masuda, Keisuke Ohdaira

    Microelectronics Reliability   84   127 - 133   2018.5

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:Elsevier Ltd  

    DOI: 10.1016/j.microrel.2018.03.018

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  • Comprehensive study of potential-induced degradation in silicon heterojunction photovoltaic cell modules Reviewed

    Seira Yamaguchi, Chizuko Yamamoto, Keisuke Ohdaira, Atsushi Masuda

    Progress in Photovoltaics: Research and Applications   26   697 - 708   2018.4

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  • Guiding principle for crystalline Si photovoltaic modules with high tolerance to acetic acid Reviewed

    Atsushi Masuda, Yukiko Hara

    Japanese Journal of Applied Physics   57 ( 4 )   2018.4

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    Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:Japan Society of Applied Physics  

    DOI: 10.7567/JJAP.57.04FS06

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  • Durable crystalline Si photovoltaic modules based on silicone-sheet encapsulants Reviewed

    Kohjiro Hara, Hiroto Ohwada, Tomoyoshi Furihata, Atsushi Masuda

    Japanese Journal of Applied Physics   57 ( 2 )   2018.2

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:Japan Society of Applied Physics  

    DOI: 10.7567/JJAP.57.027101

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  • Bending cyclic load test for crystalline silicon photovoltaic modules Reviewed

    Soh Suzuki, Takuya Doi, Atsushi Masuda, Tadanori Tanahashi

    Japanese Journal of Applied Physics   57 ( 2 )   2018.2

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    Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:Japan Society of Applied Physics  

    DOI: 10.7567/JJAP.57.02CE05

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  • Annual degradation rates of recent crystalline silicon photovoltaic modules Reviewed

    Tetsuyuki Ishii, Atsushi Masuda

    Progress in Photovoltaics: Research and Applications   25 ( 12 )   953 - 967   2017.12

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:John Wiley and Sons Ltd  

    DOI: 10.1002/pip.2903

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  • Causes of Degradation Identified by the Extended Thermal Cycling Test on Commercially Available Crystalline Silicon Photovoltaic Modules Reviewed

    Shinji Kawai, Tadanori Tanahashi, Yutaka Fukumoto, Fujio Tamai, Atsushi Masuda, Michio Kondo

    IEEE Journal of Photovoltaics   7 ( 6 )   1511 - 1518   2017.11

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:IEEE Electron Devices Society  

    DOI: 10.1109/JPHOTOV.2017.2741102

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  • Time-dependent changes in copper indium gallium (di)selenide and cadmium telluride photovoltaic modules due to outdoor exposure

    Choi Sungwoo, Sato Ritsuko, Ishii Tetsuyuki, Chiba Yasuo, Masuda Atsushi

    Jpn. J. Appl. Phys.   56 ( 8 )   08MD06   2017.7

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    Language:English   Publisher:Institute of Physics  

    The performance of photovoltaic (PV) modules deteriorates with time due to outdoor exposure. We investigated the time-dependent changes in PV modules and evaluated the amount of power generated during their lifetime. Once a year, the exposed modules were removed and measured under standard test conditions using a solar simulator. Their outputs were measured indoors and normalized to nominal values. In addition, the relationship between the indoor measurement and the energy yield for thin-film PV modules will be reported. In CIGS PV modules, the normalized maximum power (P<inf>MAX</inf>) and performance ratio (PR) differ with the type of module. The P<inf>MAX</inf>and PR of CdTe PV modules significantly decrease after outdoor exposure for three years. These results help to determine the characteristics of the time-dependent changes in the P<inf>MAX</inf>of PV modules due to outdoor exposure.

    DOI: 10.7567/JJAP.56.08MD06

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  • Influence of surface structure of n-type single-crystalline Si solar cells on potential-induced degradation Reviewed

    Kohjiro Hara, Kinichi Ogawa, Yusuke Okabayashi, Hiroyuki Matsuzaki, Atsushi Masuda

    SOLAR ENERGY MATERIALS AND SOLAR CELLS   166   132 - 139   2017.7

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1016/j.solmat.2017.03.018

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  • Potential-induced degradation of thin-film Si photovoltaic modules Reviewed

    Atsushi Masuda, Yukiko Hara

    JAPANESE JOURNAL OF APPLIED PHYSICS   56 ( 4 )   2017.4

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.7567/JJAP.56.04CS04

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  • Reduction in the short-circuit current density of silicon heterojunction photovoltaic modules subjected to potential-induced degradation tests Reviewed

    Seira Yamaguchi, Chizuko Yamamoto, Keisuke Ohdaira, Atsushi Masuda

    Solar Energy Materials and Solar Cells   161   439 - 443   2017.3

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:Elsevier B.V.  

    DOI: 10.1016/j.solmat.2016.12.027

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  • Effect of light irradiation and forward bias during PID tests of CIGS PV modules Reviewed

    Hiroshi Tomita, Kinichi Ogawa, Darshan Schmitz, Hajime Shibata, Shuuji Tokuda, Atsushi Masuda

    Proceedings of SPIE - The International Society for Optical Engineering   10370   2017

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    Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:SPIE  

    DOI: 10.1117/12.2275348

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  • Microscopic aspects of potential-induced degradation phenomena and their recovery processes for p-type crystalline Si photovoltaic modules Reviewed

    Atsushi Masuda, Minoru Akitomi, Masanao Inoue, Keizo Okuwaki, Atsuo Okugawa, Kiyoshi Ueno, Toshiharu Yamazaki, Kohjiro Hara

    Current Applied Physics   16 ( 12 )   1659 - 1665   2016.12

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    DOI: 10.1016/j.cap.2016.10.001

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  • Potential-induced degradation behavior of n-type single-crystalline silicon photovoltaic modules with a rear-side emitter Reviewed

    Seira Yamaguchi, Atsushi Masuda, Keisuke Ohdaira

    Conference Record of the IEEE Photovoltaic Specialists Conference   2016-   938 - 942   2016.11

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    DOI: 10.1109/PVSC.2016.7749748

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  • Progression of rapid potential-induced degradation of n-type single-crystalline silicon photovoltaic modules Reviewed

    Seira Yamaguchi, Atsushi Masuda, Keisuke Ohdaira

    Applied Physics Express   9 ( 11 )   2016.11

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    DOI: 10.7567/APEX.9.112301

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  • Changes in the current density-voltage and external quantum efficiency characteristics of n-type single-crystalline silicon photovoltaic modules with a rear-side emitter undergoing potential-induced degradation Reviewed

    Seira Yamaguchi, Atsushi Masuda, Keisuke Ohdaira

    Solar Energy Materials and Solar Cells   151   113 - 119   2016.7

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    DOI: 10.1016/j.solmat.2016.03.003

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  • Effects of UV on power degradation of photovoltaic modulesin combined acceleration tests Reviewed

    Trang Ngo, Yushi Heta, Takuya Doi, Atsushi Masuda

    Japanese Journal of Applied Physics   55 ( 5 )   2016.5

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    DOI: 10.7567/JJAP.55.052301

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  • Sequential and combined acceleration tests for crystalline Si photovoltaic modules Reviewed

    Atsushi Masuda, Chizuko Yamamoto, Naomi Uchiyama, Kiyoshi Ueno, Toshiharu Yamazaki, Kazunari Mitsuhashi, Akihiro Tsutsumida, Jyunichi Watanabe, Jyunko Shirataki, Keiko Matsuda

    Japanese Journal of Applied Physics   55 ( 4 )   2016.4

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    DOI: 10.7567/JJAP.55.04ES10

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  • Behavior of the potential-induced degradation of photovoltaic modules fabricated using flat mono-crystalline silicon cells with different surface orientations Reviewed

    Seira Yamaguchi, Atsushi Masuda, Keisuke Ohdaira

    JAPANESE JOURNAL OF APPLIED PHYSICS   55 ( 4 )   2016.4

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    DOI: 10.7567/JJAP.55.04ES14

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  • Consortium style study on the development of highly reliable photovoltaic modules and acceleration test methods: Management of the “consortium study on fabrication and characterization of solar cell modules with long life and high reliability” Reviewed

    Atsushi Masuda, Nanako Igawa

    Synthesiology   9 ( 1 )   42 - 54   2016.3

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    DOI: 10.5571/SYNTHENG.9.1_42

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  • Consortium style study on the development of highly reliable photovoltaic modules and acceleration test methods: Management of the “consortium study on fabrication and characterization of solar cell modules with long life and high reliability” Reviewed

    Atsushi Masuda, Nanako Igawa

    Synthesiology   9 ( 1 )   39 - 50   2016.3

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    DOI: 10.5571/synth.9.1_39

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  • Consideration on Na diffusion and recovery phenomena in potential-induced degradation for crystalline Si photovoltaic modules Reviewed

    Atsushi Masuda, Yukiko Hara, Sachiko Jonai

    Japanese Journal of Applied Physics   55 ( 2 )   2016.2

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    DOI: 10.7567/JJAP.55.02BF10

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  • Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules Reviewed

    Soh Suzuki, Tadanori Tanahashi, Takuya Doi, Atsushi Masuda

    Japanese Journal of Applied Physics   55 ( 2 )   2016.2

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    DOI: 10.7567/JJAP.55.022302

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  • Multi angle laser light scattering evaluation of field exposed thermoplastic photovoltaic encapsulant materials Reviewed

    Michael D. Kempe, David C. Miller, John H. Wohlgemuth, Sarah R. Kurtz, John M. Moseley, Dylan l. Nobles, Katherine M. Stika, Yefim Brun, Sam L. Samuels, Qurat Annie Shah, Govindasamy Tamizhmani, Keiichiro Sakurai, Masanao Inoue, Takuya Doi, Atsushi Masuda, Crystal E. Vanderpan

    Energy Science and Engineering   4 ( 1 )   40 - 51   2016.1

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    DOI: 10.1002/ese3.106

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  • Proposed new damp heat test standards for commercial CIGS modules with bias application or light irradiation Reviewed

    Keiichiro Sakurai, Hiroshi Tomita, Kinichi Ogawa, Darshan Schmitz, Hajime Shibata, Shuuji Tokuda, Atsushi Masuda

    Proceedings of SPIE - The International Society for Optical Engineering   9938   2016

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    DOI: 10.1117/12.2237431

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  • Direct Evidence for pn Junction without Degradation in Crystalline Si Photovoltaic Modules under Hygrothermal Stresses Reviewed

    Atsushi Masuda, Chizuko Yamamoto, Tadanori Tanahashi, Hitoshi Sai, Takuya Matsui

    2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)   904 - 906   2016

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  • Electrical Detection of Gap Formation underneath Finger Electrodes on c-Si PV Cells Exposed to Acetic Acid Vapor under Hygrothermal Conditions Reviewed

    Tadanori Tanahashi, Norihiko Sakamoto, Hajime Shibata, Atsushi Masuda

    2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)   1075 - 1079   2016

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  • Field testing of thermoplastic encapsulants in high-temperature installations Reviewed

    Michael D. Kempe, David C. Miller, John H. Wohlgemuth, Sarah R. Kurtz, John M. Moseley, Qurat A. Shah, Govindasamy Tamizhmani, Keiichiro Sakurai, Masanao Inoue, Takuya Doi, Atsushi Masuda, Sam L. Samuels, Crystal E. Vanderpan

    Energy Science and Engineering   3 ( 6 )   565 - 580   2015.11

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    DOI: 10.1002/ese3.104

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  • Potential-induced degradation in photovoltaic modules based on n-type single crystalline Si solar cells Reviewed

    Kohjiro Hara, Sachiko Jonai, Atsushi Masuda

    SOLAR ENERGY MATERIALS AND SOLAR CELLS   140   361 - 365   2015.9

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    DOI: 10.1016/j.solmat.2015.04.037

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  • Acceleration of potential-induced degradation by salt-mist preconditioning in crystalline silicon photovoltaic modules Reviewed

    Soh Suzuki, Naoki Nishiyama, Seiji Yoshino, Takumi Ujiro, Shin Watanabe, Takuya Doi, Atsushi Masuda, Tadanori Tanahashi

    Japanese Journal of Applied Physics   54 ( 8 )   2015.8

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    DOI: 10.7567/JJAP.54.08KG08

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  • Plasma-enhanced chemical-vapor deposition of silicon nitride film for high resistance to potential-induced degradation

    Ken Mishina, Atsufumi Ogishi, Kiyoshi Ueno, Sachiko Jonai, Norihiro Ikeno, Tetsuya Saruwatari, Kohjiro Hara, Atsushi Ogura, Toshiharu Yamazaki, Takuya Doi, Makoto Shinohara, Atsushi Masuda

    Japanese Journal of Applied Physics   54 ( 8 )   2015.8

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    DOI: 10.7567/JJAP.54.08KD12

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  • Development of a pH sensor based on a nanostructured filter adding pH-sensitive fluorescent dye for detecting acetic acid in photovoltaic modules Reviewed

    Takashi Asaka, Tomohiro Itayama, Hideaki Nagasaki, Kentaro Iwami, Chizuko Yamamoto, Yukiko Hara, Atsushi Masuda, Norihiro Umeda

    Japanese Journal of Applied Physics   54 ( 8 )   2015.8

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    DOI: 10.7567/JJAP.54.08KG07

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  • Module composition for reliability test of organic photovoltaics Reviewed

    Hideyuki Morita, Masanori Miyashita, Atsushi Masuda

    Japanese Journal of Applied Physics   54 ( 8 )   2015.8

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    DOI: 10.7567/JJAP.54.08KF07

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  • Relationship between cross-linking conditions of ethylene vinyl acetate and potential induced degradation for crystalline silicon photovoltaic modules Reviewed

    Sachiko Jonai, Kohjiro Hara, Yuji Tsutsui, Hidenari Nakahama, Atsushi Masuda

    JAPANESE JOURNAL OF APPLIED PHYSICS   54 ( 8 )   2015.8

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    DOI: 10.7567/JJAP.54.08KG01

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  • An examination of the acceleration method of damp heat test for c-Si PV modules Reviewed

    Soh Suzuki, Tadanori Tanahashi, Takuya Doi, Atsushi Masuda

    Journal of Japan Institute of Electronics Packaging   18 ( 4 )   226 - 234   2015.7

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    DOI: 10.5104/jiep.18.226

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  • Potential-induced degradation of Cu(In,Ga)Se2 photovoltaic modules Reviewed

    Seira Yamaguchi, Sachiko Jonai, Kohjiro Hara, Hironori Komaki, Yukiko Shimizu-Kamikawa, Hajime Shibata, Shigeru Niki, Yuji Kawakami, Atsushi Masuda

    Jpn. J. Appl. Phys   54   2015.7

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  • Degradation by acetic acid for crystalline Si photovoltaic modules Reviewed

    Atsushi Masuda, Naomi Uchiyama, Yukiko Hara

    Japanese Journal of Applied Physics   54 ( 4 )   2015.4

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    DOI: 10.7567/JJAP.54.04DR04

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  • Crystalline Si photovoltaic modules functionalized by a thin polyethylene film against potential and damp-heat-induced degradation Reviewed

    Kohjiro Hara, Sachiko Jonai, Atsushi Masuda

    RSC Advances   5 ( 20 )   15017 - 15023   2015

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    DOI: 10.1039/c4ra13360a

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  • Effects of light illumination during damp/dry heat tests on a flexible thin film photovoltaic module Reviewed

    Keiichiro Sakurai, Akihiro Takano, Masayoshi Takani, Atsushi Masuda

    Proceedings of SPIE - The International Society for Optical Engineering   9563   2015

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    DOI: 10.1117/12.2187891

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  • Novel lighter weight crystalline silicon photovoltaic module using acrylic-film as a cover sheet Reviewed

    Taira Kajisa, Haruko Miyauchi, Kazumi Mizuhara, Kentaro Hayashi, Tooru Tokimitsu, Masanao Inoue, Kohjiro Hara, Atsushi Masuda

    JAPANESE JOURNAL OF APPLIED PHYSICS   53 ( 9 )   2014.9

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    DOI: 10.7567/JJAP.53.092302

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  • Investigation on antireflection coating for high resistance to potential-induced degradation Reviewed

    Ken Mishina, Atsufumi Ogishi, Kiyoshi Ueno, Takuya Doi, Kohjiro Hara, Norihiro Ikeno, Daisuke Imai, Tetsuya Saruwatari, Makoto Shinohara, Toshiharu Yamazaki, Atsushi Ogura, Yoshio Ohshita, Atsushi Masuda

    JAPANESE JOURNAL OF APPLIED PHYSICS   53 ( 3 )   2014.3

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    DOI: 10.7567/JJAP.53.03CE01

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  • Detection of acid moisture in photovoltaic modules using a dual wavelength pH-sensitive fluorescent dye Reviewed

    Takashi Asaka, Kentaro Iwami, Atsushi Taguchi, Norihiro Umeda, Atsushi Masuda

    Japanese Journal of Applied Physics   53 ( 4 )   2014

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    DOI: 10.7567/JJAP.53.04ER18

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  • Crystalline Si photovoltaic modules based on TiO2-coated cover glass against potential-induced degradation Reviewed

    Kohjiro Hara, Hiromichi Ichinose, Takurou N. Murakami, Atsushi Masuda

    RSC ADVANCES   4 ( 83 )   44291 - 44295   2014

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    DOI: 10.1039/c4ra06791f

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  • Estimating the manufacturing cost to large-scale power generate polymer based organic photovoltaics Reviewed

    Hiroyuki Ogo, Masaru Nagai, Jiro Tsukahara, Masaki Konishi, Atsushi Masuda, Yuji Yoshida

    Nihon Enerugi Gakkaishi/Journal of the Japan Institute of Energy   93 ( 3 )   271 - 277   2014

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    DOI: 10.3775/jie.93.271

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  • Microscopic degradation mechanisms in silicon photovoltaic module under long-term environmental exposure Reviewed

    Keiko Matsuda, Takeshi Watanabe, Koichi Sakaguchi, Masanobu Yoshikawa, Takuya Doi, Atsushi Masuda

    Japanese Journal of Applied Physics   51 ( 10 )   2012.10

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    DOI: 10.1143/JJAP.51.10NF07

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  • Early failure detection of interconnection with rapid thermal cycling in photovoltaic modules Reviewed

    Yuichi Aoki, Manabu Okamoto, Atsushi Masuda, Takuya Doi, Tadanori Tanahashi

    Japanese Journal of Applied Physics   51 ( 10 )   2012.10

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    DOI: 10.1143/JJAP.51.10NF13

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  • Failure assessments for outside-exposed photovoltaic modules Reviewed

    Shigenori Shimizu, Takashi Arai, Tomohiko Sagawa, Yuichi Aoki, Takumi Hirakawa, Hiroshi Hiraike, Shiro Hamamoto, Sadao Sakamoto, Takuya Doi, Atsushi Masuda, Masaaki Yamamichi

    Japanese Journal of Applied Physics   51 ( 10 )   2012.10

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    DOI: 10.1143/JJAP.51.10NF04

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  • Measuring method of moisture ingress into photovoltaic modules Reviewed

    Masanori Miyashita, Shinji Kawai, Atsushi Masuda

    Japanese Journal of Applied Physics   51 ( 10 )   2012.10

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    DOI: 10.1143/JJAP.51.10NF12

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  • Recent situation and future prospects of photovoltaic industries and technologies Reviewed

    Atsushi Masuda

    Journal of the Vacuum Society of Japan   55 ( 12 )   520 - 528   2012

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    DOI: 10.3131/jvsj2.55.520

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  • A field evaluation of the potential for creep in thermoplastic encapsulant materials Reviewed

    Michael D. Kempe, David C. Miller, John H. Wohlgemuth, Sarah R. Kurtz, John M. Moseley, Qurat Shah, Govindasamy Tamizhmani, Keiichiro Sakurai, Masanao Inoue, Takuya Doi, Atsushi Masuda, Sam L. Samuels, Crystal E. Vanderpan

    Conference Record of the IEEE Photovoltaic Specialists Conference   1871 - 1876   2012

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    DOI: 10.1109/PVSC.2012.6317958

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  • Recent Situation and Future Prospects of Photovoltaics

    MASUDA Atsushi

    GOMU   84 ( 5 )   153 - 160   2011.5

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    Although photovoltaic industry rapidly grows, cost reduction is the most important issue for spread of photovoltaics. Various technical issues for crystalline or thin-film Si solar cells and modules will be discussed in detail. Those for compound thin-film such as Cu-In-Ga-Se (CIGS), dye-sensitized and organic thin-film solar cells will be also introduced. Reduction for Si use is key technology for cost reduction of crystalline Si solar cells. Various methods are developed for improved properties of thinner wafer crystalline Si solar cells. Large-area and high rate deposition of microcrystalline Si films are key technology for multi-junction thin-film Si solar cells. Various polymer materials are used in module-formation processes and those polymer materials determine the reliability of modules. New type solar cells such as CIGS, dye-sensitized and organic thin-film ones are of course necessary for dramatic cost reduction of photovoltaics.

    DOI: 10.2324/gomu.84.153

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  • Development of high efficiency flexible solar cells - Management of "Flexible Solar Cell Substrates Consortium" and its achievements -:- Management of "Flexible Solar Cell Substrates Consortium" and its achievements -

    MASUDA Atsushi

    Synthesiology   4 ( 4 )   193 - 199   2011

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    Elemental technological challenges required for the development of flexible solar cells have been clarified and a consortium system to solve the problems has been established based on industry-academia-government collaboration. The technology to form texture on polymer substrates indispensable for high efficiency has been developed, and we have succeeded in preparation of thin-film silicon solar cells on polymer substrates whose efficiency is comparable with that of cells prepared on glass substrates. The stage has already moved from research within the consortium to practical realization research in individual enterprises. Establishment process, management policy, patent strategy and training of young researchers of the consortium are described in this paper.

    DOI: 10.5571/synth.4.193

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  • Investigation on the crystal growth process of spherical Si single crystals by melting Reviewed

    Zhengxin Liu, Atsushi Masuda, Michio Kondo

    JOURNAL OF CRYSTAL GROWTH   311 ( 16 )   4116 - 4122   2009.8

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    DOI: 10.1016/j.jcrysgro.2009.06.042

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  • Study on silicon-slicing technique using plasma-etching processing Reviewed

    Mitsutaka Yamaguchi, Yoshinori Abe, Atsushi Masuda, Michio Kondo

    SOLAR ENERGY MATERIALS AND SOLAR CELLS   93 ( 6-7 )   789 - 791   2009.6

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    DOI: 10.1016/j.solmat.2008.09.052

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  • Selective machining of organic thin film photovoltaic cell by a ultra-short pulse laser Reviewed

    Yoshiro Ito, Daisuke Miyata, Rie Tanabe, Masahiro Ichihara, Yoshiko Abe, Eiichi Matsumoto, Tetsuya Taima, Yuji Yoshida, Atsushi Masuda

    CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference   2009

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    DOI: 10.1109/CLEOE-EQEC.2009.5191748

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  • Formation of Low-Defect-Concentration Polycrystalline Silicon Films by Thermal Plasma Jet Crystallization Technique Reviewed

    Takuya Yorimoto, Seiichiro Higashi, Hirotaka Kaku, Tatsuya Okada, Hideki Murakami, Seiichi Miyazaki, Takuya Matsui, Atsushi Masuda, Michio Kondo

    JAPANESE JOURNAL OF APPLIED PHYSICS   47 ( 8 )   6949 - 6952   2008.8

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    DOI: 10.1143/JJAP.47.6949

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  • Investigating minority-carrier lifetime in small spherical Si using microwave photoconductance decay Reviewed

    Zhengxin Liu, Atsushi Masuda, Michio Kondo

    JOURNAL OF APPLIED PHYSICS   103 ( 10 )   2008.5

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    DOI: 10.1063/1.2936979

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  • Coverage properties of SiNx films prepared by catalytic chemical vapor deposition on trenched substrates below 80 °C Reviewed

    Akira Heya, Toshiharu Minamikawa, Toshikazu Niki, Shigehira Minami, Atsushi Masuda, Hironobu Umemoto, Naoto Matsuo, Hideki Matsumura

    Thin Solid Films   516 ( 10 )   3000 - 3004   2008.3

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    DOI: 10.1016/j.tsf.2007.11.001

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  • Improvement of the uniformity in electronic properties of AZO films using an rf magnetron sputtering with a mesh grid electrode Reviewed

    Kanji Yasui, Akira Asano, Miku Otsuji, Hironori Katagiri, Atsushi Masuda, Hiroshi Nishiyama, Yasunobu Inoue, Masasuke Takata, Tadashi Akahane

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology   148 ( 1-3 )   26 - 29   2008.2

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    DOI: 10.1016/j.mseb.2007.09.016

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  • Epitaxial growth of SiC on silicon on insulator substrates with ultrathin top Si layer by hot-mesh chemical vapor deposition Reviewed

    Hitoshi Miura, Kanji Yasui, Kazuki Abe, Atsushi Masuda, Yuichiro Kuroki, Hiroshi Nishiyama, Masasuke Takata, Yasunobu Indue, Tadashi Akahane

    Japanese Journal of Applied Physics   47 ( 1 )   569 - 572   2008.1

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    DOI: 10.1143/JJAP.47.569

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  • Cat-CVD SiN passivation films for OLEDs and packaging Reviewed

    Akira Heya, Toshiharu Minamikawa, Toshikazu Niki, Shigehira Minami, Atsushi Masuda, Hironobu Umemoto, Naoto Matsuo, Hideki Matsumura

    Thin Solid Films   516 ( 5 )   553 - 557   2008.1

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    DOI: 10.1016/j.tsf.2007.06.220

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  • Estimation of moisture barrier ability of thin SiNx single layer on polymer substrates prepared by Cat-CVD method Reviewed

    K. Saitoh, R. S. Kumar, S. Chua, A. Masuda, H. Matsumura

    THIN SOLID FILMS   516 ( 5 )   607 - 610   2008.1

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    DOI: 10.1016/j.tsf.2007.06.215

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  • Properties of Surface-Modification Layer Generated by Atomic Hydrogen Annealing on Poly(ethylene naphthalate) Substrate Reviewed

    A. Heya, T. Minamikawa, T. Niki, S. Minami, A. Masuda, H. Umemoto, N. Matsuo, H. Matsumura

    Jpn. J. Appl. Phys.   47   266 - 268   2008

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    DOI: 10.1143/JJAP.47.266

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  • A concentrator module of spherical Si solar cell Reviewed

    Zhengxin Liu, Atsushi Masuda, Takehiko Nagai, Takashi Miyazaki, Miwako Takano, Masahiro Takano, Haruyuki Yoshigahara, Kazutoshi Sakai, Koichi Asai, Michio Kondo

    SOLAR ENERGY MATERIALS AND SOLAR CELLS   91 ( 19 )   1805 - 1810   2007.11

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    DOI: 10.1016/j.solmat.2007.06.008

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  • Improvement of the production yield of spherical si by optimization of the seeding technique in the dropping method Reviewed

    Zhengxin Liu, Koichi Asai, Atsushi Masuda, Takehiko Nagai, Yoshihiro Akashi, Mikio Murozono, Michio Kondo

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   46 ( 9A )   5695 - 5700   2007.9

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    DOI: 10.1143/JJAP.46.5695

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  • Characterization of spherical Si by photoluminescence measurement Reviewed

    Takehiko Nagai, Zhengxin Liu, Atsushi Masuda, Michio Kondo

    JOURNAL OF APPLIED PHYSICS   101 ( 10 )   5   2007.5

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    DOI: 10.1063/1.2736944

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  • Seeding method with silicon powder for the formation of silicon spheres in the drop method Reviewed

    Zhengxin Liu, Takehiko Nagai, Atsushi Masuda, Michio Kondo, Kazutoshi Sakai, Koichi Asai

    JOURNAL OF APPLIED PHYSICS   101 ( 9 )   2007.5

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    DOI: 10.1063/1.2718872

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  • Defect reduction in polycrystalline silicon thin films by heat treatment with high-pressure H2O vapor Reviewed

    Toshiyuki Sameshima, Hiromi Hayasaka, Masato Maki, Atsushi Masuda, Takuya Matsui, Michio Kondo

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   46 ( 3B )   1286 - 1289   2007.3

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    DOI: 10.1143/JJAP.46.1286

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  • Systematic study on photoresist removal using hydrogen atoms generated on heated catalyzer Reviewed

    Kouhei Hashimoto, Atsushi Masuda, Hideki Matsumura, Tomoatsu Ishibashi, Kazuhisa Takao

    Thin Solid Films   501 ( 1-2 )   326 - 328   2006.4

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    DOI: 10.1016/j.tsf.2005.07.287

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  • Formation of highly moisture-resistive SiNx films on Si substrate by Cat-CVD at room temperature Reviewed

    Toshiharu Minamikawa, Akira Heya, Toshikazu Niki, Masahiro Takano, Yasuto Yonezawa, Susumu Muroi, Shigehira Minami, Atsushi Masuda, Hironobu Umemoto, Hideki Matsumura

    Thin Solid Films   501 ( 1-2 )   154 - 156   2006.4

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    DOI: 10.1016/j.tsf.2005.07.173

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  • High-rate deposition of SiNx films over 100 nm/min by Cat-CVD method at low temperatures below 80 °C Reviewed

    Tetsuo Osono, Akira Heya, Toshikazu Niki, Masahiro Takano, Toshiharu Minamikawa, Susumu Muroi, Atsushi Masuda, Hironobu Umemoto, Hideki Matsumura

    Thin Solid Films   501 ( 1-2 )   55 - 57   2006.4

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    DOI: 10.1016/j.tsf.2005.11.056

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  • Grain enlargement of polycrystalline silicon by multipulse excimer laser annealing: Role of hydrogen Reviewed

    Naoya Kawamoto, Atsushi Masuda, Naoto Matsuo, Yasuhiro Seri, Toshimasa Nishimori, Yoshitaka Kitamon, Hideki Matsumura, Hiroki Hamada, Tadaki Miyoshi

    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers   45 ( 4 A )   2726 - 2730   2006.4

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    DOI: 10.1143/JJAP.45.2726

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  • Preparation of SiNx gate-insulating films for bottom-gate type TFTs by Cat-CVD method Reviewed

    Y Seri, A Masuda, H Matsumura

    THIN SOLID FILMS   501 ( 1-2 )   307 - 309   2006.4

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    DOI: 10.1016/j.tsf.2005.07.302

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  • Present status and future feasibility for industrial implementation of Cat-CVD (Hot-Wire CVD) technology Reviewed

    H Matsumura, A Masuda, H Untemoto

    THIN SOLID FILMS   501 ( 1-2 )   58 - 60   2006.4

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    DOI: 10.1016/j.tsf.2005.07.288

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  • Various applications of silicon nitride by catalytic chemical vapor deposition for coating, passivation and insulating films Reviewed

    A Masuda, H Umemoto, H Matsumura

    THIN SOLID FILMS   501 ( 1-2 )   149 - 153   2006.4

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    DOI: 10.1016/j.tsf.2005.07.172

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  • H-2 dilution effect in the Cat-CVD processes of the SiH4/NH3 system Reviewed

    SG Ansari, H Umemoto, T Morimoto, K Yoneyama, A Izumi, A Masuda, H Matsumura

    THIN SOLID FILMS   501 ( 1-2 )   31 - 34   2006.4

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    DOI: 10.1016/j.tsf.2005.07.098

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  • Relation between pin a-Si : H solar-cell perfon-nances and intrinsic-layer properties prepared by Cat-CVD Reviewed

    T Kitamura, K Honda, M Nishimura, K Sugita, K Takemoto, Y Yamaguchi, Y Toyama, T Yamamoto, S Miyazaki, M Eguchi, T Harano, T Sugano, N Yoshida, A Masuda, T Itoh, T Toyama, S Nonomura, H Okamoto, H Matsumura

    THIN SOLID FILMS   501 ( 1-2 )   264 - 267   2006.4

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    DOI: 10.1016/j.tsf.2005.07.251

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  • Improvement of crystallinity and solar cell efficiency of spherical silicon by seeding crystallization techniques Reviewed

    Zhengxin Liu, Atsushi Masuda, Kazutoshi Sakai, Koichi Asai, Michio Kondo

    CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2   1238 - 1241   2006

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  • Air-stable n-type carbon nanotube field-effect transistors with Si 3N4 passivation films fabricated by catalytic chemical vapor deposition Reviewed

    Daisuke Kaminishi, Hirokazu Ozaki, Yasuhide Ohno, Kenzo Maehashi, Koichi Inoue, Kazuhiko Matsumoto, Yasuhiro Seri, Atsushi Masuda, Hideki Matsumura

    Applied Physics Letters   86 ( 11 )   1 - 3   2005.3

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    DOI: 10.1063/1.1886898

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  • Low-temperature Formation of Gas-barrier Films by Catalytic Chemical Vapor Deposition

    MASUDA Atsushi, NIKI Toshikazu, HEYA Akira, MINAMIKAWA Toshiharu, UMEMOTO Hironobu, MATSUMURA Hideki

    Ceramics Japan   40 ( 2 )   82 - 87   2005.2

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  • Quantification of gas-phase H-atom number density by tungsten phosphate glass Reviewed

    T Morimoto, H Umemoto, K Yoneyama, A Masuda, H Matsumura, K Ishibashi, H Tawarayama, H Kawazoe

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   44 ( 1B )   732 - 735   2005.1

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    DOI: 10.1143/JJAP.44.732

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  • Contamination removal from EUV multilayer using atomic hydrogen generated by heated catalyzer Reviewed

    H. Oizumi, H. Yamanashi, I. Nishiyama, K. Hashimoto, S. Ohsono, A. Masuda, A. Izumi, H. Matsumura

    Progress in Biomedical Optics and Imaging - Proceedings of SPIE   5751 ( II )   1147 - 1154   2005

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    DOI: 10.1117/12.601136

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  • Effect of atomic hydrogen on preparation of highly moisture-resistive SiNx films at low substrate temperatures Reviewed

    Akira Heya, Toshikazu Niki, Masahiro Takano, Yasuto Yonezawa, Toshiharu Minamikawa, Susumu Muroi, Shigehira Minami, Akira Izumi, Atsushi Masuda, Hironobu Umemoto, Hideki Matsumura

    Japanese Journal of Applied Physics, Part 2: Letters   43 ( 12 A )   L1546 - L1548   2004.12

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    DOI: 10.1143/JJAP.43.L1546

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  • Highly moisture-resistive SiNx films prepared by catalytic chemical vapor deposition Reviewed

    Akira Heya, Toshikazu Niki, Yasuto Yonezawa, Toshiharu Minamikawa, Susumu Muroi, Akira Izumi, Atsushi Masuda, Hironobu Umemoto, Hideki Matsumura

    Japanese Journal of Applied Physics, Part 2: Letters   43 ( 10 B )   L1362 - L1364   2004.10

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    DOI: 10.1143/JJAP.43.L1362

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  • Correlation between O/Er content ratio and photoluminescence intensity of (Er, O)-doped hydrogenated amorphous Si thin films prepared by a catalytic chemical vapor deposition/laser ablation hybrid process Reviewed

    Joe Sakai, Atsushi Masuda, Haruo Akiyama, Osamu Eryu, Kenshiro Nakashima, Hideki Matsumura

    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers   43 ( 7 A )   4198 - 4201   2004.7

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    DOI: 10.1143/JJAP.43.4198

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  • Study on change in SIMS intensities near the interface between silicon-nitride film and silicon substrate Reviewed

    Takahiro Hasegawa, Tomotsugu Date, Akiya Karen, Atsushi Masuda

    Applied Surface Science   231-232   725 - 728   2004.6

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    DOI: 10.1016/j.apsusc.2004.03.032

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  • Catalytic decomposition of HCN on heated W surfaces to produce CN radicals Reviewed

    H Umemoto, T Morimoto, M Yamawaki, Y Masuda, A Masuda, H Matsumura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   338   65 - 69   2004.6

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    DOI: 10.1016/j.jnoncrysol.2004.02.023

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  • Highly moisture-resistive silicon nitride films prepared by catalytic chemical vapor deposition and application to gallium arsenide field-effect transistors Reviewed

    A Masuda, M Totsuka, T Oku, R Hattori, H Matsumura

    VACUUM   74 ( 3-4 )   525 - 529   2004.6

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    DOI: 10.1016/j.vacuum.2004.01.023

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  • Cat-CVD (hot-wire CVD): how different from PECVD in preparing amorphous silicon Reviewed

    H Matsumura, H Umemoto, A Masuda

    JOURNAL OF NON-CRYSTALLINE SOLIDS   338   19 - 26   2004.6

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    DOI: 10.1016/j.jnoncrysol.2004.02.014

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  • Preparation of wide gap and low resistive hetero-structured SiCx films as wide gap window of solar cells Reviewed

    T Itoh, Y Hasegawa, T Fujiwara, A Masuda, S Nonomura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   338   123 - 126   2004.6

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    DOI: 10.1016/j.jnoncrysol.2004.02.035

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  • Nitridation of ultrathin SiO2 layers in metal-ferroelectric- insulator-semiconductor structures Reviewed

    Masakazu Hirakawa, Gen Hirooka, Minoru Noda, Masanori Okuyama, Kazuhiro Honda, Atsushi Masuda, Hideki Matsumura

    Integrated Ferroelectrics   68   29 - 36   2004

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    DOI: 10.1080/10584580490895572

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  • Effect of H2 dilution in the catalytic CVD processes of SiH4/NH3 system Reviewed

    Takashi Morimoto, Shafeeque A.A.G. Ansari, Koji Yoneyama, Hironobu Umemoto, Atsushi Masuda, Hideki Matsumura

    IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai   97 - 98   2004

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    Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:Institute of Electrical and Electronics Engineers Inc.  

    DOI: 10.1109/IMFEDK.2004.1566426

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  • Control of stress in SiN_x films on Si substrate prepared by Cat-CVD method

    TAKANO Masahiro, HEYA Akira, NIKI Toshikazu, YONEZAWA Yasuto, MINAMIKAWA Toshiharu, MUROI Atsushi, MASUDA Atsushi, UMEMOTO Hironobu, MATSUMURA Hideki

    The proceedings of the JSME annual meeting   2004   387 - 388   2004

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    Silicon nitride (SiN_x) films were deposited on Si substrates at 80℃ by using a catalytic chemical vapor deposition (Cat-CVD) technique to investigate the optimal deposition condition. SiH_4 flow rate was varied from 6 to 18 sccm. It is shown that the stress, Young's modulus, fracture toughness and film composition strongly depend on SiH_4 flow rate. These changes of film properties are related to the gases desorption from growing surface. The amount of the gases desorption reaction depends on deposition rate, that is, the rate of the Si-H insertion reaction. The desorption of hydrogen and ammonia gases from growing surface causes the shrinkage of the film surface, which generates tensile stress. Also, SiN_x films with high hydrogen contents show low stress, low Young's modulus and high fracture toughness.

    DOI: 10.1299/jsmemecjo.2004.1.0_387

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  • Radical species formed by the catalytic decomposition of NH3 on heated W surfaces Reviewed

    H Umemoto, K Ohara, D Morita, T Morimoto, M Yamawaki, A Masuda, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   42 ( 8 )   5315 - 5321   2003.8

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    DOI: 10.1143/JJAP.42.5315

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  • Catalytic Chemical Vapor Deposition: Recent Development and Future Prospects Reviewed

    Atsushi Masuda, Akira Izumi, Hironobu Umemoto, Hideki Matsumura

    Shinku/Journal of the Vacuum Society of Japan   46 ( 2 )   92 - 97   2003

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    DOI: 10.3131/jvsj.46.92

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  • Preferential In-N bond formation in InGaAsN layers Reviewed

    M Uchida, A Masuda, A Yamamoto, A Hashimoto

    5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS   0 ( 7 )   2745 - 2748   2003

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    DOI: 10.1002/pssc.200303314

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  • Preferential In-N bond formation in InGaAsN layers Reviewed

    M. Uchida, A. Masuda, A. Yamamoto, A. Hashimoto

    Physica Status Solidi C: Conferences   ( 7 )   2745 - 2748   2003

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    DOI: 10.1002/pssc.200303314

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  • Optical properties of RF-MBE grown AlGaAsN Reviewed

    K. Yamamoto, M. Uchida, A. Yamamoto, A. Masuda, A. Hashimoto

    Physica Status Solidi (B) Basic Research   234 ( 3 )   915 - 918   2002.12

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    DOI: 10.1002/1521-3951(200212)234:3<915::AID-PSSB915>3.0.CO;2-8

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  • Oxidation process in pulsed laser ablation of Si with various ambients Reviewed

    A Masuda, S Usui, Y Yamanaka, Y Yonezawa, T Minamikawa, M Suzuki, A Morimoto, M Kumeda, T Shimizu

    THIN SOLID FILMS   416 ( 1-2 )   106 - 113   2002.9

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  • Preparation of Amorphous Silicon Films and Device Application by Catalytic Chemical Vapor Deposition Method Reviewed

    Atsushi Masuda, Hideki Matsumura

    Shinku/Journal of the Vacuum Society of Japan   45 ( 10 )   727 - 732   2002

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    DOI: 10.3131/jvsj.45.727

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  • Recent progress in industrial applications of Cat-CVD (hot-wire CVD) Reviewed

    A Masuda, A Izumi, H Umemoto, H Matsumura

    AMORPHOUS AND HETEROGENEOUS SILICON-BASED FILMS-2002   715   111 - 122   2002

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  • Cat-CVD as a new fabrication technology of semiconductor devices Reviewed

    H Matsumura, A Izumi, A Masuda

    COMMAD 2002 PROCEEDINGS   323 - 328   2002

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  • RF-MBE growth and Raman scattering characterization of lattice-matched GaInNAs on GaAs(001) substrates Reviewed

    A Hashimoto, T Furuhata, T Kitano, AK Nguyen, A Masuda, A Yamamoto

    JOURNAL OF CRYSTAL GROWTH   227   532 - 535   2001.7

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  • An indium surfactant effect in cubic GaN Rf-MBE growth Reviewed

    Y Nishio, H Mori, A Masuda, A Yamamoto, A Hashimoto

    PROCEEDINGS OF THE INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS   1   178 - 181   2000

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  • Effects of active ammonia gas cracked in catalytic-CVD on PZT ferroelectric capacitors Reviewed

    T Minamikawa, Y Yonezawa, Y Fujimori, T Nakamura, A Masuda, H Matsumura

    FERROELECTRIC THIN FILMS VIII   596   271 - 275   2000

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  • Cat-CVD process and its application to preparation of Si-based thin films Reviewed

    H Matsumura, A Masuda, A Izumi

    AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999   557   67 - 78   1999

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  • Structural studies on hydrogenated amorphous germanium-carbon films prepared by RF sputtering Reviewed

    M Kumeda, A Masuda, T Shimizu

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   37 ( 4A )   1754 - 1759   1998.4

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  • Low-temperature nitridation of Si surface using gas-decomposition reaction in cat-CVD method Reviewed

    A Izumi, A Masuda, H Matsumura

    PROCEEDINGS OF THE INTERNATIONAL SYMPOSIUM ON THIN FILM MATERIALS, PROCESSES, RELIABILITY, AND APPLICATIONS: THIN FILM PROCESSES   97 ( 30 )   277 - 282   1998

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  • Novel surface cleaning of GaAs and formation of high quality SiNx films by cat-CVD method Reviewed

    A Izumi, A Masuda, S Okada, H Matsumura

    COMPOUND SEMICONDUCTORS 1996   ( 155 )   343 - 346   1997

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  • X-ray photoelectron spectroscopy of GaN layer formed on GaAs by NH3-plasma nitridation and successive excimer-laser irradiation Reviewed

    A Masuda, Y Yonezawa, A Morimoto, T Shimizu

    SILICON CARBIDE AND RELATED MATERIALS 1995   142   1039 - 1042   1996

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  • Recent progress in industrial applications of Cat-CVD (hot-wire CVD)

    Amorphous and Heterogeneous Silicon-Based Films -2001, Materials Research Society Symposium Proceedings  2002 

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  • Properties of large grain-size poly-Si films by catalytic chemical sputtering

    Amorphous and Heterogeneous Silicon-Based Films -2001, Materials Research Society Symposium Proceedings  2001 

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  • Low temperature formation of passivation layers for compound semiconductors by catalytic CVD technique

    Proceedings of 8th International Symposium on the Passivity of Metals and Semiconductors  2001 

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  • 200 ℃ preparation of SiNx passivation films for PZT ferroelectric capacitors by catalytic CVD

    Ferroelectric Thin Films (]G0009[), Materials Research Society Symposium Proceedings  2001 

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  • An indium surfactant effect in cubic GaN vf-MBE growth

    Proceedings of International Workshop on Nitride Semiconductors, IPAP Conference Series  2000 

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  • Raman scattering characterization of annealed GaN<sub>x</sub> As<sub>1-x</sub> layers

    Proceedings of International Workshop on Nitride Semiconductors, IPAP Conference Series  2000 

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  • Effects of active ammonia gas cracked in catalytic-CVD on PZT ferroelectivic capacitors

    Ferroelectric Thin Films (]G0008[), Matevials Research Society Symposium Proceedings  2000 

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  • Gas-phase and surface reactions of decomposed species in catalytic CVD

    Amorphous and Heterogeneous Silicon Thin Films-2000, Materials Research Society Symposium Proceedings  2000 

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  • Drastic revolution in catalytic CVD using"catalytic plate"instead of "hot wire"

    Amorphous and Heterogeneous Silicon Thin Films-2000, Materials Research Society Symposium Proceedings  2000 

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  • Cat-CVD process and its application to preparation of Si-based thin films

    Amorphous and Heterogeneous Silicon Thin Films : Fundamentals to Devices-1999, Materials Research Society Symposium Proceedings  1999 

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  • Low temperature nitridation of Si surface using gas-decomposition reaction in cat-CVD method

    Proceedings of the International Symposium on Thin Film Materials, Precesses, Reliability, and Applications(The Electrochemical Society, Inc. , Pennington)  1998 

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  • Novel surface cleaning of GaAs and formation of high quality SiNx films by cat-CVD method

    Institute of Physics Conference Series(Institute of Physics Publishing, Bristol)  1997 

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  • X-ray photoelectron spectroscopy of GaN layer formed on GaAs by NH<sub>3</sub>-plasma nitridation and successive excimer-laser irradiation

    Institute of Physics Conference Series(Institute of Physics Publishing, Bristol)  1996 

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MISC

  • Lamination-interface-dependent deacetylation of ethylene vinyl acetate encapsulant in crystalline Si photovoltaic modules evaluated by positron annihilation lifetime spectroscopy

    Hideaki Hagihara, Hiroaki Sato, Yukiko Hara, Sachiko Jonai, Atsushi Masuda

    Japanese Journal of Applied Physics   57   2018.8

  • Potential-induced degradation of photovoltaic modules composed of interdigitated back contact solar cells observed in an actual photovoltaic system

    Tetsuyuki Ishii, Ritsuko Sato, Sungwoo Choi, Yasuo Chiba, Atsushi Masuda

    Proceedings of the 33rd European Photovoltaic Solar Energy Conference and Exhibition   1414 - 1417   2017.11

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    Language:English   Publishing type:Research paper, summary (international conference)  

    DOI: 10.4229/EUPVSEC20172017-5CO.6.3

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  • Degradation of encapsulants for photovoltaic modules made of ethylene vinyl acetate studied by positron annihilation lifetime spectroscopy

    Hideaki Hagihara, Masao Kunioka, Hiroyuki Suda, Yukiko Hara, Atsushi Masuda

    JAPANESE JOURNAL OF APPLIED PHYSICS   55 ( 10 )   2016.10

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  • Annual degradation rates of bulk crystalline silicon PV modules estimated from indoor and outdoor measurements

    Tetsuyuki Ishii, Atsushi Masuda, Yoshihiro Hishikawa

    Proceedings of the 31st European Photovoltaic Solar Energy Conference and Exhibition   2571 - 2574   2015.11

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    DOI: 10.4229/EUPVSEC20152015-5CV.2.38

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  • CuIn<sub>1-x</sub>Ga<sub>x</sub>Se<sub>2</sub>太陽電池モジュールにおけるPID現象

    山口世力, 山口世力, 原浩二郎, 小牧弘典, 上川由紀子, 柴田肇, 仁木栄, 川上雄士, 増田淳

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   61st   2014

  • CS-3-2 Recent Situation and Future Prospects of Photovoltaic Markets and Technologies

    Masuda Atsushi

    Proceedings of the Society Conference of IEICE   2009 ( 2 )   "S - 3"-"S-4"   2009.9

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  • Flexible thin-film solar cells

    MASUDA Atsushi

    77 ( 10 )   1213 - 1219   2008.10

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  • Novel type Solar Cells

    MASUDA Atsushi

    Ceramics Japan   43 ( 1 )   62 - 67   2008.1

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  • Mass-spectrometric studies of catalytic chemical vapor deposition processes of organic silicon compounds containing nitrogen

    T Morimoto, SG Ansari, K Yoneyama, T Nakajima, A Masuda, H Matsumura, M Nakamura, H Umemoto

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   45 ( 2A )   961 - 966   2006.2

  • Low-temperature deposition of silicon nitride films by a cat-CVD technique - Gas-phase diagnoses and evaluation of film properties -

    Hironobu Umemoto, Atsushi Masuda, Hideki Matsumura, Toshiharu Minamikawa, Akira Hhya, Masahiro Takano, Yasuto Yonezawa, Toshikazu Niki, Susumu Muroi, Shigehira Minami

    Zairyo/Journal of the Society of Materials Science, Japan   55 ( 2 )   142 - 147   2006.2

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  • Development of Catalytic Chemical Vapor Deposition Systems for Flexible Organic Light-Emitting Diode Displays

    部家彰, 高野昌宏, 米沢保人, 南川俊治, 仁木敏一, 室井進, 南茂平, 大薗哲郎, 増田淳, 梅本宏信, 松村英樹

    石川県工業試験場研究報告   ( 54 )   17 - 22   2005.12

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    J-GLOBAL

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  • Technique for the production, preservation, and transportation of H atoms in metal chambers for processings

    SG Ansari, H Umemoto, T Morimoto, K Yoneyama, A Masuda, H Matsumura, M Ikemoto, K Ishibashi

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A   23 ( 6 )   1728 - 1731   2005.11

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  • CS-5-7 Properties and device applications of SiNx films prepared by Cat-CVD

    Masuda Atsushi, Umemoto Hironobu, Matsumura Hideki

    Proceedings of the Society Conference of IEICE   2005 ( 2 )   "S - 13"-"S-14"   2005.9

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  • ELと光学技術 Cat‐CVD法による水蒸気バリア薄膜の低温形成

    南川俊治, 部家彰, 高野昌宏, 米沢保人, 仁木敏一, 南茂平, 増田淳, 梅本宏信, 松村英樹

    光技術コンタクト   43 ( 6 )   328 - 333   2005.6

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  • Preparation of low-stress SiNx films by catalytic chemical vapor deposition at low temperatures

    M Takano, T Niki, A Heya, T Osono, Y Yonezawa, T Minamikawa, S Muroi, S Minami, A Masuda, H Umemoto, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   44 ( 6A )   4098 - 4102   2005.6

  • Improvement of deposition rate by sandblasting of tungsten wire in catalytic chemical vapor deposition

    A Heya, T Niki, M Takano, Y Doguchi, Y Yonezawa, T Minamikawa, S Muroi, S Minami, A Izumi, A Masuda, H Umemoto, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   44 ( 4A )   1943 - 1944   2005.4

  • Moisture-resistive properties of SiNx films prepared by catalytic chemical vapor deposition below 100 degrees C for flexible organic light-emitting diode displays

    A Heya, T Niki, M Takano, Y Yonezawa, T Minamikawa, S Muroi, S Minami, T Ikari, A Izumi, A Masuda, H Umemoto, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   44 ( 4A )   1923 - 1927   2005.4

  • Cat-CVD法の包装用ガスバリアフィルム製造工程への適用 (特集 マーケット創出の成否を決する次世代パッケージング) -- (未来のマーケットを支える技術と商品開発)

    増田 淳, 梅本 宏信, 松村 英樹

    パックピア   49 ( 1 )   34 - 39   2005.1

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  • 有機ELディスプレイ用水蒸気バリア膜の形成 -低温触媒CVD装置の開発-

    電子情報通信学会技術研究報告   105 ( 434 )   7 - 12   2005

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  • Enlargement of ELA poly-Si film : Relationship between Crystal Growth and Hydrogen

    KAWAMOTO N., MASUDA A., MATSUO N., SERI Y., MATSUMURA H., HAMADA H., MIYOSHI T.

    Technical report of IEICE. SDM   104 ( 510 )   47 - 51   2004.12

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    The role of the hydrogen which is introduced in the melt-Si during the excimer laser annealing (ELA) is examined from a viewpoint of grain enlargement. We successfully prepared the a-Si/SiN/glass structure by utilizing the catalytic chemical vapor deposition (Cat-CVD) method for SiN film, where hydrogen concentration of SiN film is controlled. The grain size increases as decreasing thehydrogen concentration, and it partially exceeds 2 μm by fixing the hydrogen concentration in the SiN film to 2 3 at % The relationshipbetween the defects of the grain boundary and hydrogen is also referred.

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  • Resist-removal technique without plasma using hydrogen atoms generated on heated catalyzer

    MASUDA Atsushi, HASHIMOTO Kouhei, TAKAO Kazuhisa, IHSIBASHI Tomoatsu, MATSUMURA Hideki

    IEICE technical report. Component parts and materials   104 ( 425 )   39 - 43   2004.11

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    Resist-removal technique without plasma using high-density hydrogen atoms generated on heated catalyzer is introduced. Both no plasma damage and no oxidation for the substrate under the resist are advantages of this process in comparison with the conventional oxygen plasma ashing. However, slow removal rate had been a problem to be solved. In this study, hydrogen flow rate, hydrogen pressure, catalyzer temperature, wafer-stage temperature and distance between catalyzer and wafer were widely changed and resist-removal rate faster than 1 μm/min was realized in the optimized condition. This removal rate should be applicable level in industry. Concentration of tungsten on wafer, possibly evaporated from the catalyzer, was estimated to be the first half of 10^<10> cm^<-2>, which brings about no problem for industrial application.

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  • Application of SiN_x films prepared by Cat-CVD method to GaAs-based transistors

    MASUDA Atsushi, TOTSUKA Masahiro, OKU Tomoki, HATTORI Ryo, MATSUMURA Hideki

    IEICE technical report. Electron devices   104 ( 111 )   11 - 16   2004.6

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    SiN_x films prepared by catalytic chemical vapor deposition (Cat-CVD) are dense with low hydrogen content in films even at substrate temperatures around 300℃, and also have low stress. Therefore SiN_x films prepared by Cat-CVD are suitable to passivation films for semiconductor devices and various ceramic and metallic parts. SiN_x films by Cat-CVD method using no plasma excitation are especially suitable to passivation films for compound semiconductor devices since compound semiconductors are easily damaged by charged particles in plasma. In this paper various properties for SiN_x films by Cat-CVD are presented. Performances of both self-aligned gate field-effect transistors (SAGFETs) and high electron mobility transistors (HEMTs) with SiN_x passivation films by Cat-CVD or plasma-enhanced CVD are comparatively studied.

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  • 研究室へようこそ 北陸先端科学技術大学院大学(JAIST)・材料科学研究科 松村研究室 Cat-CVD法のフラットパネルディスプレイ製造技術への新展開

    増田 淳, 松村 英樹

    ディスプレイ   10 ( 4 )   71 - 74   2004.4

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  • Present Status and Future Prospects of Cat-CVD Technique : Gas-Phase Diagnostics and Device Applications

    MASUDA Atsushi, UMEMOTO Hironobu, MATSUMURA Hideki

    The Transactions of the Institute of Electronics, Information and Communication Engineers C   87 ( 2 )   203 - 215   2004.2

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  • Fabrication of Amorphous Silicon Solar Cells by Catalytic Chemical Vapor Deposition

    MASUDA Atsushi, NISHIMURA Masaya, KATOUNO Kouichi, SUGITA Ken, IMAMORI Kensaku, ITOH Masaya, MATSUMURA Hideki

    IEICE technical report. Component parts and materials   103 ( 412 )   1 - 6   2003.11

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    Performances for solar cells using hydrogenated amorphous silicon (a-Si:H) films prepared by catalytic chemical vapor deposition (Cat-CVD) are introduced together with fundamental techniques for improving solar-cell efficiencies. Low hydrogen (H) content in a-Si:H films, which is possible origin of stability for light soaking, is one of the characteristic features of a-Si:H films by Cat-CVD. A large amount of H atoms in gas phase are also remarkable properties for Cat-CVD. Although it is worried that transparent conducting oxide electrode is reduced by a large amount of H atoms, it was found that zinc oxide (ZnO) coating is effective for suppressing the reduction of tin oxide (SnO_2). Feasibility of microcrystalline silicon (μc-Si:H) and hydrogenated amorphous silicon-carbon(a-Si_<1-x>C_x:H) films prepared by Cat-CVD for p-type window-layer materials was studied. Effects of the buffer layer at p/i interface on improving the solar-cell performances are also demonstrated.

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  • 低温触媒CVD装置の開発 (特集/新規事業創出と大学発ベンチャー)

    増田 淳, 松村 英樹, 南川 俊治

    化学工業   54 ( 8 )   631 - 635   2003.8

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  • Behavior of Hydrogens in the poly-Si Film Prepaired by ELA Method : Relationship Between the Concentration of the Hydrogen Molecule in the SiN Film and Crystal growth

    KAWAMOTO N, MASUDA A, HASEGAWA I, ANWAR BIN ABD, AZIZ Fakhrul, YOGORO Y, MATSUO N, YAMANO K, MATSUMURA H, HAMADA H, SHIBATA K

    Technical report of IEICE. OME   103 ( 8 )   31 - 34   2003.4

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    In this study, we clarify the role of hydrogen in the poly-Si film on the Cat-CVD SiN film for its crystal growth by ELA. H_2 concentrations in the SiN film are 2.3, 4.2, 8.2 at%, respectively. For 500mJ/cm^2 and 8shots, Raman peak FWHM drastically increases and some of the poly-Si films disappear by H_2 burst during the ELA for 8.2at%. Spin density of 8.2at% is larger than that of 2.3at%. These results indicate that the hydrogens incorporated in the Si from SiN film during the ELA leave behind the crystal defects in the poly-Si film when they burst into vacuum. For 500mJ/cm^2, although the Δω decreases drastically with increasing the shot number for 2.3 and 4.2at%, it becomes small slowly with the shot number for 8.2at%. The grain size of 2.3at% is larger than that of 4.2at%. We discuss these results by using SPC (solid phase crystallization) model considering the incorporation of the hydrogens and the substrate thermal conductivity. The usefulness of Cat-CVD method in the ELA poly-Si field is also referred.

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  • Characteristics of Laser Annealing for Amorphous Si Films Prepared by Catalytic Chemical Vapor Deposition and Application to Fabrication of Polycrystalline Si Thin-Film Transistors

    MASUDA Atsushi, YOGORO Yusuke, MATSUMURA Hideki, MIYASHITA Kazuyuki, SHIMODA Tatsuya

    Technical report of IEICE. OME   103 ( 8 )   25 - 30   2003.4

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    Crystallinity of excimer-laser annealed polycrystalline Si (poly-Si) films using amorphous Si (a-Si:H) precursor films prepared by catalytic chemical vapor deposition (Cat-CVD) is presented. No dehydrogenation process is required for Cat-CVD a-Si:H films because of low H content about 1 at. % even at low-temperature deposition below 300 ℃. It was confirmed that the crystallinity is improved using a-Si:H precursor films prepared by Cat-CVD in comparison with that using a-Si:H precursor films prepared by plasma-enhanced CVD. Cat-CVD also has the advantages of high-rate and large-area deposition of a-Si:H precursor films. Top-gate type thin-film transistors fabricated using Cat-CVD a-Si:H precursor films show the mobility reaching 230 cm^2/Vs being comparable to those using low-pressure CVD ones.

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  • Recent Development of Fabrication Techniques for Thin-Film Transistors by Catalytic Chemical Vapor Deposition

    MASUDA Atsushi, MATSUMURA Hideki

    IEICE technical report. Component parts and materials   102 ( 434 )   71 - 76   2002.11

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    Recent development of fabrication techniques for thin-film transistors (TFTs) used in flat-panel displays by catalytic chemical vapor deposition (Cat-CVD) is introduced. TFTs using amorphous Si films prepared by Cat-CVD show stable characteristics under bias stress. TFTs using polycrystalline Si films prepared directly by Cat-CVD at low temperatures show the mobility of approximately 50 cm^2/Vs. Amorphous Si films are also useful as precursor films for excimer-laser annealing. The Cat-CVD method appears feasible for mass-production because of high efficiency of gas use, high deposition rate and large-area deposition beyond 1-m size. Development of Cat-CVD apparatus for mass-production is also in progress. It is expected that the Cat-CVD method will be employed in the mass production of amorphous Si TFTs, directly deposited polycrystalline Si TFTs and polycrystalline Si TFTs fabricated by excimer-laser annealing.

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  • In situ chamber cleaning using atomic H in catalytic-CVD apparatus for mass production of a-Si : H solar cells

    A Masuda, Y Ishibashi, K Uchida, K Kamesaki, A Izumi, H Matsumura

    SOLAR ENERGY MATERIALS AND SOLAR CELLS   74 ( 1-4 )   373 - 377   2002.10

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  • What is the difference between catalytic CVD and plasma-enhanced CVD? - Gas-phase kinetics and film properties

    A Masuda, A Izumi, H Umemoto, H Matsumura

    VACUUM   66 ( 3-4 )   293 - 297   2002.8

  • Preparation of boron-carbon-nitrogen thin films by magnetron sputtering

    H Yokomichi, T Funakawa, A Masuda

    VACUUM   66 ( 3-4 )   245 - 249   2002.8

  • Influence of atomic hydrogen on transparent conducting oxides during hydrogenated amorphous and microcrystalline Si preparation by catalytic chemical vapor deposition

    A Masuda, K Imamori, H Matsumura

    THIN SOLID FILMS   411 ( 1 )   166 - 170   2002.5

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  • Photoinduced volume expansion and contraction in a-Si : H films

    N Yoshida, Y Sobajima, H Kamiguchi, T Iida, T Hatano, H Mori, Y Nakae, M Itoh, A Masuda, H Matsumura, S Nonomura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   299   516 - 520   2002.4

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  • Effects of atomic hydrogen in gas phase on a-Si : H and poly-Si growth by catalytic CVD

    H Umemoto, Y Nozaki, M Kitazoe, K Horii, K Ohara, D Morita, K Uchida, Y Ishibashi, M Komoda, K Kamesaki, A Izumi, A Masuda, H Matsumura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   299   9 - 13   2002.4

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  • Low-Temperature Fabrication and Characteristics of Poly-Si TFTs by Cat-CVD

    Matsumura Hideki, Masuda Atsushi, Izumi Akira

    Proceedings of the IEICE General Conference   2002 ( 2 )   171 - 172   2002.3

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  • Low-resistivity phosphorus-doped polycrystalline silicon thin films formed by catalytic chemical vapor deposition and successive rapid thermal annealing

    R Morimoto, A Izumi, A Masuda, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   41 ( 2A )   501 - 506   2002.2

  • Direct detection of H atoms in the catalytic chemical vapor deposition of the SiH4/H-2 system

    H Umemoto, K Ohara, D Morita, Y Nozaki, A Masuda, H Matsumura

    JOURNAL OF APPLIED PHYSICS   91 ( 3 )   1650 - 1656   2002.2

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  • Cat-CVD法による低温poly-Si TFT製造技術

    月刊ディスプレイ   8 ( 7 )   10 - 15   2002

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  • Application of catalytic chemical vapor deposition to fabrication of next-generation large-area displays

    MASUDA Atsushi, MATSUMURA Hideki

    OYOBUTURI   71 ( 7 )   833 - 838   2002

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    DOI: 10.11470/oubutsu1932.71.833

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  • Development of large-area uniform deposition technique on 1-m-size substrate by catalytic chemical vapor deposition

    Minoru Karasawa, Masahiro Sakai, Keiji Ishibashi, Masahiko Tanaka, Atsushi Masuda, Hideki Matsumura

    Shinku/Journal of the Vacuum Society of Japan   45 ( 3 )   123 - 126   2002

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    DOI: 10.3131/jvsj.45.123

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  • Cat-CVD technology as a new tool for fabrication of large area display

    Proceedings of 2nd International Display Manufacturing Conference   143-146   2002

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  • Recent progress of Cat-CVD research in Japan -Bridging between the first and second Cat-CVD conferences-

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   17-22   2002

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  • Cat-CVD法による微結晶シリコン膜の作製とデバイス応用

    固体物理   37 ( 12 )   1003 - 1009   2002

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  • Deposition chemistry in the Cat-CVD processes of the SiH<sub>4</sub>/NH<sub>3</sub> system

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   35-38   2002

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  • Development of Cat-CVD apparatus for 1-m-size large-area deposition

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   75-80   2002

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  • Key factors to improve efficiency of Cat-CVD a-Si solar cells

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   223-226   2002

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  • Coverage properties of silicon nitride film prepared by Cat-CVD method

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   235-238   2002

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  • Fabrication of a-Si<sub>1-x</sub>C<sub>x</sub>:H thin films for solar cells by Cat-CVD method using carbon catalyzer

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   239-242   2002

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  • Crystallization by excimer laser annealing for a-Si:H films with low hydrogen content prepared by Cat-CVD

    Extended Abstract of 2nd International Conference on Cat-CVD (Hot-Wire CVD) Process   355-358   2002

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  • Development of chamber cleaning reducing both cost and environmental pollution by using catalytic cracking reaction of NF_3

    NISHIMURA Satoru, MASUDA Atsushi, IZUMI Akira, MATSUMURA Hideki

    IEICE technical report. Component parts and materials   101 ( 395 )   61 - 65   2001.10

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    Etch rates of 3500 nm/min for single-crystalline silicon wafer, 740 nm/min for silicon nitride films on silicon wafer and 50 nm/min for fused quartz are obtained by using NF_3-decomposed species generated by catalytic cracking reaction on a heated tungsten wire at 2400℃. No fluorine contamination on the amorphous silicon layer with a thickness of 120 nm, deposited after the chamber cleanig by using the above NF_3-decomposed species, is detected by X-ray photoelectron spectroscopy. These results indicate that both deposition and in situ chamber cleaning are carried out in the catalytic chemical vapor deposition(Cat-CVD) apparatus, whitch is an important factor for the industrial application.

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  • Influence of a-Si:H deposition by catalytic CVD on transparent conducting oxides

    Kensaku Imamori, Atsushi Masuda, Hideki Matsumura

    Thin Solid Films   395 ( 1-2 )   147 - 151   2001.9

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  • Photo-induced volume changes in a-Si : H films prepared by Cat-CVD method

    T Hatano, Y Nakae, H Mori, K Ohkado, N Yoshida, S Nonomura, M Itoh, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   84 - 86   2001.9

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  • Guiding principles for device-grade hydrogenated amorphous silicon films and design of catalytic chemical vapor deposition apparatus

    A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   112 - 115   2001.9

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  • High-stability hydrogenated amorphous silicon films for light-soaking prepared by catalytic CVD at high deposition rates

    M Itoh, Y Ishibashi, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   138 - 141   2001.9

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  • Identification and gas phase kinetics of radical species in Cat-CVD processes of SiH4

    Y Nozaki, M Kitazoe, K Horii, H Umemoto, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   47 - 50   2001.9

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  • Development of Cat-CVD apparatus - a method to control wafer temperatures under thermal influence of heated catalyzer

    M Karasawa, A Masuda, K Ishibashi, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   71 - 74   2001.9

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  • High performance amorphous-silicon thin film transistors prepared by catalytic chemical vapor deposition with high deposition rate

    M Sakai, T Tsutsumi, T Yoshioka, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   330 - 334   2001.9

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  • Proposal of catalytic chemical sputtering method and its application to prepare large grain size poly-Si

    K Kamesaki, A Masuda, A Izumi, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   169 - 172   2001.9

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  • Formation of silicon films for solar cells by the Cat-CVD method

    M Komoda, K Kamesaki, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   198 - 201   2001.9

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  • Fabrication of amorphous carbon nitride films by hot-wire chemical vapor deposition

    H Yokomichi, A Masuda, N Kishimoto

    THIN SOLID FILMS   395 ( 1-2 )   249 - 252   2001.9

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  • A Cat-CVD Si3N4 film study and its application to the ULSI process

    Y Uchiyama, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   275 - 279   2001.9

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  • Low-k silicon nitride film for copper interconnects process prepared by catalytic chemical vapor deposition method at low temperature

    H Sato, A Izumi, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   280 - 283   2001.9

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  • Preparation of SiNx passivation films for PZT ferroelectric capacitors at low substrate temperatures by catalytic CVD

    T Minamikawa, Y Yonezawa, A Heya, Y Fujimori, T Nakamura, A Masuda, H Matsumura

    THIN SOLID FILMS   395 ( 1-2 )   284 - 287   2001.9

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  • Thin-Film Transistors Fabricated by Catalytic Chemical Vapor Deposition Method

    SAKAI Masahiro, TSUTSUMI Takayuki, MASUDA Atsushi, MATSUMURA Hideki

    IEICE technical report. Electron devices   101 ( 14 )   27 - 31   2001.4

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    We have developed amorphous silicon thin-film transistors (TFT's) by the catalytic chemical vapor deposition (Cat-CVD) method. The amorphous silicon films deposited at a high rate (1.9 nm s^<-1>) show low spin density (1.6×10^<16>cm^<-3>) measured by electron spin resonance. TFT's, with a field effect mobility about 0.85 cm^2V^<-1>s^<-1>, are obtained with the gate SiN_x and phosphorous-doped amorphous silicon layers also fabricated by Cat-CVD even when the TFT's are fabricated by back channel etching process. The bias stress test has been performed on the TFT samples with SiO_2 as gate dielectric. The stress tolerance is very high, showing that the TFT's are suitable for operating the organic electroluminescence displays.

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  • Catalytic chemical sputtering: A novel method for obtaining large-grain polycrystalline silicon

    H Matsumura, K Kamesaki, A Masuda, A Izumi

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS   40 ( 3B )   L289 - L291   2001.3

  • Dominant parameter determining dangling-bond density in hydrogenated amorphous silicon films prepared by catalytic chemical vapor deposition

    A Masuda, C Niikura, Y Ishibashi, H Matsumura

    SOLAR ENERGY MATERIALS AND SOLAR CELLS   66 ( 1-4 )   259 - 265   2001.2

  • Raman characterization of lattice-matched GaInAsN layers grown on GaAs (001) substrates

    Technical Digest of 12th International Photovoltaic Science and Engineering Conference   665-666   2001

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  • What is the difference between catalytic CVD and plasma-enhanced CVD? -Gas-phase kinetics and film properties

    Proceedings of 6th International Symposium on Sputtering & Plasma Processes   213-216   2001

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  • Preparation of boron-carbon-nitrogen thin films by magnetron sputtering

    Proceedings of 6th International Symposium on Sputtering & Plasma Processes   402-405   2001

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  • Properties of thin-film transistors using amorphous silicon films prepared by catalytic CVD with high deposition rate

    Digest of Technical Papers 8th International Workshop on Active-Matrix Liquid-Crystal Displays -TFT Technologies and Related Materials-   147-150   2001

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  • In-situ chamber cleaning using atomic H in catalytic-CVD apparatus for mass production of a-Si:H solar cells

    Technical Digest of 12th International Photovoltaic Science and Engineering Conference   241-242   2001

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  • Study on catalytic-CVD a-Si:H-based solar cells with high deposition rate

    Technical Digest of 12th International Photovoltaic Science and Engineering Conference   243-244   2001

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  • 1 m size large-area deposition of a-Si:H films by catalytic CVD using novel showerhead equipped with catalyzers

    Proceedings of 21st International Display Research Conference in conjunction with 8th International Display Workshops   1735-1736   2001

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  • Properties of phosphorus-doped polycrystalline silicon films formed by catalytic chemical vapor deposition and successive rapid thermal annealing

    Proceedings of 2001 International Conference on Rapid Thermal Processing for Future Semiconductor Devices   39-40   2001

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  • Precise substrate temperature control to prepare SiN<sub>x</sub> films for PZT ferroelectric devices by catalytic chemical vapor deposition

    Extended Abstracts of 1st International Meeting on Ferroelectric Random Access Memories   130-131   2001

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  • Effects of double bonding configurations on thermal stability of low-hydrogen concentration fluorinated amorphous carbon thin-films with low dielectric constant prepared by sputtering with hydrogen dilution

    H Yokomichi, A Masuda

    VACUUM   59 ( 2-3 )   771 - 776   2000.11

  • Identification of Si and SiH in catalytic chemical vapor deposition of SiH4 by laser induced fluorescence spectroscopy

    Y Nozaki, K Kongo, T Miyazaki, M Kitazoe, K Horii, H Umemoto, A Masuda, H Matsumura

    JOURNAL OF APPLIED PHYSICS   88 ( 9 )   5437 - 5443   2000.11

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  • Novel thin-film fabrication method combining pulsed laser ablation and catalytic chemical vapor deposition: application to preparation of Er-doped hydrogenated amorphous Si films

    A Masuda, J Sakai, H Matsumura

    VACUUM   59 ( 2-3 )   635 - 640   2000.11

  • Proposal of chemical sputtering method and its application to prepare large grain size poly-Si films

    KAMESAKI Koji, MASUDA Atsushi, IZUMI Akira, MATSUMURA Hideki

    IEICE technical report. Component parts and materials   100 ( 396 )   7 - 12   2000.10

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    Si films are usually prepared by chemical vapor deposition(CVD) method. In the present work, Si films are formed by utilizing chemical transport of SiH_n species which are generated by the reaction between a solid Si and H atoms. We named the method"chemical sputtering"from an analogy to the conventional physical sputtering. The deposited Si films on Si, SiO_2 and quartz substrates are polycrystalline ones, and there is no amorphous phase detected by Raman spectroscopy. The grain size becomes large, compared with polycrystalline Si films formed by any low-temperature deposition methods ever reported. The grain size exceeds 1μm for the films on SiO_2 substrate with the thickness about 1μm.

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  • Control of polycrystalline silicon structure by the two-step deposition method

    A Heya, A Izumi, A Masuda, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   39 ( 7A )   3888 - 3895   2000.7

  • Effects of nitrogen incorporation on structural properties of fluorinated amorphous carbon films

    H Yokomichi, A Masuda

    JOURNAL OF NON-CRYSTALLINE SOLIDS   271 ( 1-2 )   147 - 151   2000.6

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    DOI: 10.1016/S0022-3093(00)00104-6

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  • Mechanism of low-temperature crystallization of amorphous silicon by atomic hydrogen anneal

    A Heya, A Masuda, H Matsumura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   266 ( Pt.A )   619 - 623   2000.5

  • Transport mechanism of deposition precursors in catalytic chemical vapor deposition studied using a reactor tube

    N Honda, A Masuda, H Matsumura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   266 ( Pt.A )   100 - 104   2000.5

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  • Novel deposition technique of Er-doped a-Si : H combining catalytic chemical vapor deposition and pulsed laser-ablation

    A Masuda, J Sakai, H Akiyama, O Eryu, K Nakashima, H Matsumura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   266 ( Pt.A )   136 - 140   2000.5

  • Low-temperature preparation of poly-Si films by catalytic CVD and application to TFTs

    MASUDA Atsushi, IZUMI Akira, MATSUMURA Hideki

    IEICE technical report. Electron devices   100 ( 1 )   13 - 18   2000.4

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    Catalytic chemical vapor deposition (Cat-CVD), often called hot-wire CVD, is one of the promising candidates for large-area thin-film formation method at low temperatures. Recently, Cat-CVD is widely studied in order to apply to device-fabrication process in semiconductor industry. Polycrystalline silicon (poly-Si) films prepared by Cat-CVD are expected to be applied to thin-film transistors (TFTs). In 1991 the authors succeeded in preparing poly-Si Films by this method for the first time. Until 1998 they systematically studied preparation of poly-Si films by Cat-CVD and application to TFTs under the R&D Projects in Cooperation with Academic Institutions "Cat-CVD Fabrication Processes for Semiconductor Devices" from the New Energy and Industrial Technology Development Organization (NEDO). In this paper various structural and electrical properties of poly-Si films prepared by Cat-CVD at low temperatures are presented.

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  • Luminescence Properties of Er-Doped a-Si:H Films Prepared by Cat-CVD Combined with Pulsed Laser Ablation

    MASUDA Atsushi, SAKAI Joe, AKIYAMA Haruo, ERYU Osamu, NAKASHIMA Kenshiro, MATSUMURA Hideki

    2000 ( 10 )   31 - 35   2000.2

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  • High performance amorphous-silicon thin film transistors prepared by catalytic chemical vapor deposition with high deposition rate

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   311 - 314   2000

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  • Development of Cat-CVD apparatus-A method to control wafer temperatures under thermal influence of heated catalyzer

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   117 - 120   2000

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  • High stability amorphous silicon films for light soaking prepared by catalytic CVD with high deposition rate

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   143 - 146   2000

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  • Influence of a-Si : H deposition by catalytic CVD on transparent conducting oxides

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   147 - 150   2000

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  • Formation of silicon films for solar cells by Cat-CVD method

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   163 - 166   2000

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  • Fabrication of amorphous carbon nitride films by hot wire chemical vapor deposition

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   205 - 208   2000

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  • Identification and gas phase kinetics of radical species in Cat-CVD processes of SiH<sub>4</sub>

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   41 - 44   2000

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  • Photoinduced volume change in a-Si : H films prepared by Cat-CVD method

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   69 - 72   2000

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  • Proposal of catalytic chemical sputtering method and its application to prepare large grain size poly-Si

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   85 - 88   2000

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  • Guiding principles for obtaining device-grade hydrogenated amorphous silicon films by catalytic chemical vapor deposition

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   99 - 102   2000

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  • Effect of atomic H and chamber cleaning in catalytic CVD on reproducibility of a-Si : H film properties

    Digest of Technical Papers 2000 International Workshop on Active-Matrix Liquid-Crystal Displays-TFT Technologies and Related Materials-   219 - 222   2000

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  • Study on Cat-CVD Si<sub>3</sub>N<sub>4</sub> films and its application to ULSI process

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   241 - 244   2000

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  • Low-k silicon nitride film for copper interconnects process prepared by Cat-CVD method at low temperature

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   245 - 248   2000

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  • Preparation of SiN<sub>x</sub> passivation films for PZT ferroelectric capacitors at low substrate temperatures by catalytic CVD

    Extended Abstract of the 1st International Conference on Cat-CVD(Hot-Wire CVD)Process   253 - 256   2000

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  • Mixing mechanism of h-GaN in c-GaN growth on GaAs (001) substrates

    A Hashimoto, H Wada, T Ueda, Y Nishio, A Masuda, A Yamamoto

    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH   176 ( 1 )   519 - 524   1999.11

  • Annealing effect of Pb(Zr, Ti)O-3 ferroelectric capacitor in active ammonia gas cracked by catalytic chemical vapor deposition system

    T Minamikawa, Y Yonezawa, T Nakamura, Y Fujimori, A Masuda, H Matsumura

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   38 ( 9B )   5358 - 5360   1999.9

  • Effect of sputtering with hydrogen dilution on fluorine concentration of low hydrogen content fluorinated amorphous carbon thin films with low dielectric constant

    H Yokomichi, A Masuda

    JOURNAL OF APPLIED PHYSICS   86 ( 5 )   2468 - 2472   1999.9

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  • Anisotropic electrical conduction and reduction in dangling-bond density for polycrystalline Si films prepared by catalytic chemical vapor deposition

    C Niikura, A Masuda, H Matsumura

    JOURNAL OF APPLIED PHYSICS   86 ( 2 )   985 - 990   1999.7

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  • Study on improvement on uniformity of Cat-CVD SiNx thin films

    KUDO Akiyoshi, MASUDA Atsushi, IZUMI Akira, MATSUMURA Hideki

    IEICE technical report. Electron devices   99 ( 21 )   59 - 66   1999.4

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    SiNx thin-film deposition by catalytic CVD (Cat-CVD) method is expected to realize a 1ow-damage plasmaldss process in fabrication of passivation fi1ms for compound-semiconductor devices etc. A tungsten wire was used as a catalyzer to decompose SiH_4 and NH_3 gases, SiNx thin films were deposited on GaAs substrates, and the uniformity of well-stoichiometric (Si_3N_4) films, with about 2.0 in refractive index, was evaluated by ellipsometry. It was found that the film thickness decreases about 15% circumferentially from the center, but the uniformity of refractive index keeps within about ±2.5% in a 4-inch wafer even though Si and N are supplied seperately. It is confirmed that preparation of device-quality SiNx thin films on large substrates can be achieved by Cat-CVD method.

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  • Surface cleaning and nitridation of compound semiconductors using gas-decomposition reaction in Cat-CVD method

    A Izumi, A Masuda, H Matsumura

    THIN SOLID FILMS   343   528 - 531   1999.4

  • Low-temperature crystallization of amorphous silicon using atomic hydrogen generated by catalytic reaction on heated tungsten

    A Heya, A Masuda, H Matsumura

    APPLIED PHYSICS LETTERS   74 ( 15 )   2143 - 2145   1999.4

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  • Structural properties of polycrystalline silicon thin films prepared by catalytic CVD

    Extended Abstract of the Open Meeting of Cat-CVD Project   45 - 48   1999

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  • Electrical properties of polycrystalline silicon films prepared by catalytic CVD

    Extended Abstract of the Open Meeting of Cat-CVD Project   49 - 52   1999

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  • Structural control of Cat-CVD poly-Si films by gas phase reaction using pure SiH<sub>4</sub> gas

    Technical Digest of 11th International Photovoltaic Science and Engineering Conference   781 - 782   1999

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  • Transport and generation mechanism of deposition precursors in catalytic CVD

    Extended Abstract of the Open Meeting of Cat-CVD Project   9 - 13   1999

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  • Detection of free radicals in Cat-CVD processes by laser induced fluorescence spectroscopy

    Extended Abstract of the Open Meeting of Cat-CVD Project   15 - 18   1999

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  • Suppression of heat radiation in catalytic CVD using "catalytic plate"

    Extended Abstract of the Open Meeting of Cat-CVD Project   19 - 22   1999

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  • High-rate deposition of SiN<sub>x</sub> thin films prepared by Cat-CVD method

    Extended Abstract of the Open Meeting of Cat-CVD Project   27 - 29   1999

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  • Effect of exposure of Pb(Zr,Ti)O<sub>3</sub> ferroelectric capacitors to active ammonia gas cracked by catalytic chemical vapor deposition system

    Extended Abstract of the Open Meeting of Cat-CVD Project   31 - 34   1999

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  • Crystallization of a-Si film by atomic hydrogen anneal at low temperatures

    Extended Abstract of the Open Meeting of Cat-CVD Project   39 - 43   1999

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  • Dominant parameter determining dangling-bond density in a Si : H films prepared by catalytic CVD

    Technical Digest of 11th International Photovoltaic Science and Engineering Conference   399 - 400   1999

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  • Suppression of hexagonal GaN mixing by As4 molecular beam in cubic GaN growth on GaAs (0 0 1) substrates

    Akihiro Hashimoto, Takanori Motizuki, Hideki Wada, Atsushi Masuda, Akio Yamamoto

    Journal of Crystal Growth   201   392 - 395   1999

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    DOI: 10.1016/S0022-0248(98)01356-6

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  • Novel thin-film fabrication method combining pulsed laser ablation and catalytic chemical vapor deposition : Application to preparation of Er-doped hydrogenated amorphous Si films

    Proceedings of the 5th International Symposium on Sputtering & Plasma Processes   23 - 24   1999

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  • Thermal stability of low hydrogen concentration fluorinated amorphous carbon thin films with low dielectric constant prepared by sputtering with hydrogen dilution

    Proceedings of the 5th International Symposium on Sputtering & Plasma Processes   215 - 216   1999

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  • Improvement of polycrystalline silicon film by atomic hydrogen anneal at low temperature

    Digest of Technical Papers 1999 International Workshop on Active-Matrix Liquid-Crystal Displays-TFT Technologies and Related Materials-   119 - 122   1999

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  • Direct crystal growth of Poly-Si films on glass substrates by catalytic CVD with incubation time

    Digest of Technical Papers 1999 International Workshop on Active-Matrix Liquid-Crystal Displays-TFT Technologies and Related Materials-   123 - 126   1999

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  • Material properties of heteroepitaxial yttria-stabilized zirconia films with controlled yttria contents on Si prepared by reactive sputtering

    S Horita, M Watanabe, S Umemoto, A Masuda

    VACUUM   51 ( 4 )   609 - 613   1998.12

  • Effects of oxygen gas addition and substrate cooling on preparation of amorphous carbon nitride films by magnetron sputtering

    H Yokomichi, H Sakima, A Masuda

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   37 ( 9A )   4722 - 4725   1998.9

  • Surface cleaning of garium arsenide and formation of silicon nitride using by catalytic-CVD method

    IZUMI Akira, MASUDA Atsushi, MATSUMURA Hideki

    IEICE technical report. Electron devices   98 ( 184 )   41 - 46   1998.7

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    We proposed a novel method of low temperature surface cleaning technology of GaAs and formation of high quality silicon nitride(SiN_x) films by catalytic chemical vapor deposition(Cat-CVD) method. An NH_3 gas was used for the surface cleaning of(100)GaAs without any chemical treatment at the substrate temperature as low as 150℃. XPS measurements revealed obvious reduction of intensities of oxygen related peaks of GaAs and appearance of nitrogen related peaks from long time treated samples. Using a SiH_4 and NH_3 gas mixture, stoichiometric, conformal step coverage and low hydrogen content SiN_x films were obtained below 300℃ by this method.

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  • Fabrication of Pb(Zr,Ti)O<inf>3</inf>/MgO/GaN/GaAs structure for optoelectronic device applications

    Atsushi Masuda, Shinya Morita, Hideki Shigeno, Akiharu Morimoto, Tatsuo Shimizu, Jun Wu, Hiroyuki Yaguchi, Kentaro Onabe

    Journal of Crystal Growth   189-190   227 - 230   1998.6

  • Structural and electrical properties of yttria-stabilized zirconia films with controlled Y content heteroepitaxially grown on Si by reactive sputtering

    S Horita, M Watanabe, A Masuda

    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY   54 ( 1-2 )   79 - 83   1998.6

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  • Preparation of fluorinated amorphous carbon thin films

    H Yokomichi, T Hayashi, T Amano, A Masuda

    JOURNAL OF NON-CRYSTALLINE SOLIDS   227 ( Pt.A )   641 - 644   1998.5

  • Changes in structure and nature of defects by annealing of fluorinated amorphous carbon thin films with low dielectric constant

    H Yokomichi, T Hayashi, A Masuda

    APPLIED PHYSICS LETTERS   72 ( 21 )   2704 - 2706   1998.5

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  • Structural and conductivity change caused by N, O and C incorporation in a-Si : H

    T Shimizu, T Ishii, M Kumeda, A Masuda

    JOURNAL OF NON-CRYSTALLINE SOLIDS   227 ( Pt.A )   403 - 406   1998.5

  • 触媒CVD(Cat-CVD)法による低温薄膜形成

    増田 淳, 和泉 亮, 松村 英樹

    表面   36 ( 3 )   149 - 156   1998

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  • Structural and electrical anisotropy and high absorption in poly-Si films prepared by catalytic chemical vapor deposition

    A Masuda, R Iiduka, A Heya, C Niikura, H Matsumura

    JOURNAL OF NON-CRYSTALLINE SOLIDS   227 ( Pt.B )   987 - 991   1998

  • 5a-A-11 Structural defects and light-induced effects of fluorinated amorphous carbon

    Yokomichi H., Hayashi T., Amano T., Masuda A.

    Meeting abstracts of the Physical Society of Japan   52 ( 2 )   141 - 141   1997.9

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  • Influence of Pb incorporation on light-induced phenomena in amorphous Ge100-x-yPbxSy thin films

    A Masuda, Y Yonezawa, A Morimoto, M Kumeda, T Shimizu

    JOURNAL OF NON-CRYSTALLINE SOLIDS   217 ( 2-3 )   121 - 135   1997.9

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  • Preparation of fluorinated amorphous carbon thin films with low dielectric constant

    HAYASHI Tohru, AMANO Tomihiro, MASUDA Atsushi, YOKOMICHI Haruo

    Technical report of IEICE. LQE   97 ( 100 )   1 - 6   1997.6

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    Fluorinated amorphous carbon(a-C:F) thin films were prepared using CH_4 and CF_4 gases by the plasma chemical vapor deposition (CVD) method. Electron spin resonance(ESR), infrared(IR) absorption, optical absorption, X-ray photoelectron spectroscopy(XPS) and dielectric constant measurements were carried out in order to investigate the basic properties of these films. XPS measurements revealed that the fluorine concentration of the films increased with increasing R, where R is the ratio of CF_4 flow rate to the total gas flow rate. When R = 0.97, the fluorine concentration increased remarkably to approximately 67 at.%. In this film, CF_3 mode appeared in the IR spectrum and the hydrogen-related modes disappeared. The dielectric constant of the film was estimated to be 2.2 at 1MHz and the line width of the ESR spectrum of the film, 4.2 mT, was broader than that of the other films. We also discuss the effect of thermal annealing on dielectric constant and the fluorine bonding configuration.

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  • Interface control of Pb(ZrxTi1-x)O-3 thin film on silicon substrate with heteroepitaxial YSZ buffer layer

    S Horita, T Naruse, M Watanabe, A Masuda, T Kawada, Y Abe

    APPLIED SURFACE SCIENCE   117   429 - 433   1997.6

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  • Nitrogen-doping effects on electrical, optical, and structural properties in hydrogenated amorphous silicon

    A Masuda, K Itoh, K Matsuda, Y Yonezawa, M Kumeda, T Shimizu

    JOURNAL OF APPLIED PHYSICS   81 ( 10 )   6729 - 6737   1997.5

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  • Nitrogen- and ammonia-plasma nitridation of hydrogenated amorphous silicon

    A Masuda, S Yoshimoto, Y Yonezawa, A Morimoto, M Kumeda, T Shimizu

    APPLIED SURFACE SCIENCE   113   610 - 613   1997.4

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  • Fabrication of Pb(Zr,Ti)O<sub>3</sub>/MgO/GaN/GaAs structure for optoelectronic device applications"

    Proceedings of 2nd International Conference on Nitride Semiconductors   192   1997

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  • Noise reduction of pHEMTs with plasmaless SiN passivation by catalytic CVD

    R Hattori, G Nakamura, S Nomura, T Ichise, A Masuda, H Matsumura

    GAAS IC SYMPOSIUM - 19TH ANNUAL, TECHNICAL DIGEST 1997   78 - 80   1997

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  • Material properties of heteroepitaxial yttria-stabilized zirconia films with controlled Y content on Si prepared by reactive sputtering

    Proceedings of the 4th International Symposium on Sputtering & Plasma Processes   163 - 168   1997

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  • Heteroepitaxial growth of YSZ films with controlled Y content on Si by reactive sputtering

    WATANABE Mikio, NARUSE Tetsuya, MASUDA Atsushi, HORITA Susumu

    IEICE technical report. Component parts and materials   96 ( 349 )   19 - 25   1996.11

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    Yttria-stabilized zirconia (YSZ) films with controlled Y content were heteroepitaxially grown on n-Si (100) substrates by reactive sputtering and their material properties were investigated. It was found that the films deposited with 2.3 to 19.7at.% Y and with 1.2at.% Y had a cubic YSZ (100) structure and a monoclinic (ZrO_2)_<1-x>(Y_2O_3)_x(100)/cubic YSZ(100) structure, respectively, on Si (100) substrates. The leakage current of the film at the applied voltage of 5V was decreased to 10^<-7> A/cm^2 by reducing the Y content to 1.2 at.%. The capacitance (C)-voltage(V) characteristics of the samples showed the hysteresis curve derived from the ion drift and the hysteresis width of the sample with 1.2at.% Y was the narrowest in our study. The relative dielectric constant estimated from the C-V measurements at 1 MHz decreased from 24 to 16 with decreasing the Y content from 9.4 to 1.2 at%.

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  • Ambient-pressure influence on droplet formation and thickness distribution in pulsed laser ablation

    A Masuda, K Matsuda, S Usui, Y Yonezawa, T Minamikawa, A Morimoto, T Shimizu

    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY   41 ( 1 )   161 - 165   1996.10

  • Influence of buffer layers on lead magnesium niobate titanate thin films prepared by pulsed laser ablation

    T Nakamura, A Masuda, A Morimoto, T Shimizu

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   35 ( 9A )   4750 - 4754   1996.9

  • N-2-plasma-nitridation effects on porous silicon

    H Yokomichi, A Masuda, Y Yonezawa, T Shimizu

    THIN SOLID FILMS   281 ( 1/2 )   568 - 571   1996.8

  • X-ray photoelectron spectroscopy and electron spin resonance studies on O-2 and N2O plasma oxidation of silicon

    A Masuda, Y Yonezawa, A Morimoto, M Kumeda, T Shimizu

    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY   39 ( 3 )   173 - 178   1996.7

  • Origin of charged dangling bonds in nitrogen-doped hydrogenated amorphous silicon

    A Masuda, K Itoh, M Kumeda, T Shimizu

    JOURNAL OF NON-CRYSTALLINE SOLIDS   200 ( Pt 1 )   395 - 398   1996.5

  • Mechanism of stoichiometric deposition of volatile elements in multimetal-oxide films prepared by pulsed laser ablation

    A Masuda, K Matsuda, Y Yonezawa, A Morimoto, T Shimizu

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS   35 ( 2B )   L237 - L240   1996.2

  • Preparation and crystallographic characterizations of highly oriented Pb(Zr0.52Ti0.48)O-3 films and MgO buffer layers on (100)GaAs and (100)Si by pulsed laser ablation

    A Masuda, Y Yamanaka, M Tazoe, T Nakamura, A Morimoto, T Shimizu

    JOURNAL OF CRYSTAL GROWTH   158 ( 1-2 )   84 - 88   1996.1

  • HIGHLY ORIENTED PB(ZR,TI)O-3 THIN-FILMS PREPARED BY PULSED-LASER ABLATION ON GAAS AND SI SUBSTRATES WITH MGO BUFFER LAYER

    A MASUDA, Y YAMANAKA, M TAZOE, Y YONEZAWA, A MORIMOTO, T SHIMIZU

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   34 ( 9B )   5154 - 5157   1995.9

  • INTERFACIAL NEUTRAL-DANGLING-BOND AND CHARGED-DANGLING-BOND DENSITIES BETWEEN HYDROGENATED AMORPHOUS-SILICON AND HYDROGENATED AMORPHOUS-SILICON NITRIDE IN TOP NITRIDE AND BOTTOM NITRIDE STRUCTURES

    H MIN, FUKUSHI, I, A MASUDA, A MORIMOTO, M KUMEDA, T SHIMIZU

    APPLIED PHYSICS LETTERS   66 ( 20 )   2718 - 2720   1995.5

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  • NH3-PLASMA-NITRIDATION PROCESS OF (100)GAAS SURFACE OBSERVED BY ANGLE-DEPENDENT X-RAY PHOTOELECTRON-SPECTROSCOPY

    A MASUDA, Y YONEZAWA, A MORIMOTO, T SHIMIZU

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   34 ( 2B )   1075 - 1079   1995.2

  • CORRELATION BETWEEN AC TRANSPORT AND ELECTRON-SPIN-RESONANCE IN AMORPHOUS GE-S FILMS ALLOYED WITH LEAD

    K SHIMAKAWA, T KATO, K HAYASHI, A MASUDA, M KUMEDA, T SHIMIZU

    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES   70 ( 5 )   1035 - 1044   1994.11

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  • ULTRATHIN SIO2-FILMS ON SI FORMED BY N2O-PLASMA OXIDATION TECHNIQUE

    A MASUDA, Y YONEZAWA, A MORIMOTO, M KUMEDA, T SHIMIZU

    APPLIED SURFACE SCIENCE   81 ( 3 )   277 - 280   1994.11

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  • RELATIONSHIP BETWEEN ELECTRICAL-CONDUCTIVITY AND CHARGED-DANGLING-BOND DENSITY IN NITROGEN-DOPED AND PHOSPHORUS-DOPED HYDROGENATED AMORPHOUS-SILICON

    A MASUDA, K ITOH, JH ZHOU, M KUMEDA, T SHIMIZU

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS   33 ( 9B )   L1295 - L1297   1994.9

  • ORIENTATION OF MGO THIN-FILMS ON SI(100) AND GAAS(100) PREPARED BY ELECTRON-BEAM EVAPORATION

    A MASUDA, K NASHIMOTO

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS   33 ( 6A )   L793 - L796   1994.6

  • Surface nitridation process of(100)GaAs by NH<sub>3</sub>-plasma treatment with planar magnetic field

    Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials   193 - 195   1994

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  • SPECTROSCOPIC STUDY ON N2O-PLASMA OXIDATION OF HYDROGENATED AMORPHOUS-SILICON AND BEHAVIOR OF NITROGEN

    A MASUDA, FUKUSHI, I, Y YONEZAWA, T MINAMIKAWA, A MORIMOTO, M KUMEDA, T SHIMIZU

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS   32 ( 6A )   2794 - 2802   1993.6

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  • NOVEL OXIDATION PROCESS OF HYDROGENATED AMORPHOUS-SILICON UTILIZING NITROUS-OXIDE PLASMA

    A MASUDA, A MORIMOTO, M KUMEDA, T SHIMIZU, Y YONEZAWA, T MINAMIKAWA

    APPLIED PHYSICS LETTERS   61 ( 7 )   816 - 818   1992.8

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  • LIGHT-INDUCED ESR AND DISAPPEARANCE OF PHOTODARKENING IN AMORPHOUS GE-S FILMS ALLOYED WITH LEAD

    A MASUDA, M KUMEDA, A MORIMOTO, T SHIMIZU

    JOURNAL OF NON-CRYSTALLINE SOLIDS   137   985 - 988   1991.12

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  • RELATIONSHIP BETWEEN PHOTODARKENING AND LIGHT-INDUCED ESR IN AMORPHOUS GE-S FILMS ALLOYED WITH LEAD

    A MASUDA, M KUMEDA, T SHIMIZU

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS   30 ( 6B )   L1075 - L1078   1991.6

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Works

  • 大面積液晶ディスプレイ用薄膜トランジスタの新規製造技術

    2001

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  • Cat-CVD fabrication techniques for solar cells

    2001

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  • Novel fabrication processes of thin-film transistors for large-area liquid-crystal displays

    2001

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  • Cat-CVD法による太陽電池製造技術の研究開発

    2001

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  • Cat-CVD法による半導体デバイス製造プロセス

    1998
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    2001

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  • Cat-CVD fabrication processes for semiconductor devices

    1998
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    2001

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Awards

  • 1998 Corning Research Grant Award

    1998  

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    Country:Japan

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  • 平成8年度 コニカ画像科学奨励賞

    1997  

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    Country:Japan

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Research Projects

  • Development of a pH sensor based on a nanostructured filter adding pH-sensitive fluorescent dye for detecting acetic acid in photovoltaic modules

    Grant number:25630438

    2013.4 - 2015.3

    System name:Grants-in-Aid for Scientific Research

    Research category:Grant-in-Aid for Challenging Exploratory Research

    Awarding organization:Japan Society for the Promotion of Science

    UMEDA Norihiro, IWAMI Kentarou, MASUDA Atsushi

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    Grant amount:\4030000 ( Direct Cost: \3100000 、 Indirect Cost:\930000 )

    Acetic acid formed via hydrolysis of ethylene vinyl acetate (EVA) as an encapsulant in photovoltaic (PV) modules causes a decrease in conversion efficiency of modules by grid corrosion. To evaluate the condition of PV modules, a nondestructive and simple optical method is proposed. This method uses a dual wavelength pH-sensitive fluorescent dye to detect acetic acid in PV modules using the change in pH. The change in pH induced by the formation of acetic acid is detected by the change in the ratio of fluorescent intensities of two peaks of a dye. A pH-sensitive fluorescent dye showed sensitivity for small amounts of acetic acid such as that produced from EVA. Furthermore, a membrane filter dyed with pH-sensitive fluorescent dye was confirmed to detect acetic acid included in aged EVA after a damp heat test (85℃, 85%) for 5000 h in PV modules.

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  • 新規な強磁性体制御高移動度MOSトランジスタの開発

    Grant number:16656199

    2004 - 2005

    System name:科学研究費助成事業

    Research category:萌芽研究

    Awarding organization:日本学術振興会

    篠崎 和夫, 脇谷 尚樹, 増田 淳, 水谷 惟恭

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    Grant amount:\3600000 ( Direct Cost: \3600000 )

    電界効果型Siトランジスタのゲート直上に形成した酸化物強磁性体薄膜の残留磁化を利用して,Siトランジスタのキャリア移動度を向上する可能性を見出し,この原理を利用して,磁性体薄膜の効果により,電界効果トランジスタの特性を向上することを検証し,全く新規な高速動作型トランジスタの原理的な可能性を探った.本年度は,前年度に続いて,強磁性体をMOS FET上に再現性よく作成するプロセスの確立と,強磁性体薄膜の残留磁化がトランジスタ特性に与える影響の検討をおこない,前年度の結果を受けて,デバイス化の可能性の基礎的な検討を行った.
    Si-MOSFET基板のゲート部に,RFマグネトロンスパッタ法により、バリウムフェライトを室温で成膜した.リフトオフ法により、磁性薄膜をゲート上だけに残すべく微細加工し,800℃,10minのポストアニールにより磁気特性を引き出した.チャネル中を流れる電子が,ゲート界面に垂直な方向のSi側に力を受けるような向きに着磁し、その前後でトランジスタI_D-V_D測定を行った。ドレイン電流の増加から移動度の上昇を算出した。作製した薄膜の磁気特性はVSMを用いて評価し、pAメーターでMOSFETのI_D-V_D測定を行った。
    その結果,電磁石のon/offによる外部磁場中でのトランジスタI_D-V_D測定をもとに、一定ドレイン電圧4Vでのドレイン電流の変化量のゲート長依存性を検討した.その結果,磁束密度が大きくゲート長が短いほど、ドレイン電流の変化量が大きいことがわかった.得られたバリウムフェライト薄膜は,残留磁化が250mT、保磁力は4.4kOeであった.着磁前後のMOSFETのI_D-V_D測定の結果から,着磁後,ドレイン電流が増加した.この変化を移動度の上昇として算出すると、着磁前の450cm^2/Vsに対して,着磁後は540cm^2/Vsとなり,約20%上昇している.また,外部磁場10kOe中で10分間着磁した後リテンション測定を行ったところ,バリウムフェライトの残留磁化は10日持続することがわかった.

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  • Novel Low-Cost Technology for Fabrication of Liquid Crystal Display

    Grant number:12792007

    2000 - 2002

    System name:Grants-in-Aid for Scientific Research

    Research category:Grant-in-Aid for University and Society Collaboration

    Awarding organization:Japan Society for the Promotion of Science

    MATSUMURA Hideki, IZUMI Akira, NITTA Koh-hei, TERANO Minoru, KIDA Ken-ichiro, MASUDA Atsushi

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    Grant amount:\55300000 ( Direct Cost: \55300000 )

    The present research is concerned with a new technology for patterning process in fabricating thin film transistors (TFTs) used in liquid crystal display. Photolithography is conventionally used for this patterning process. However, a novel method are presented in this research projects, in which patterns are formed by press of a mold having 凹凸 patterns onto organic soft films laminated on substrates. By this method, low-cost pattern printing is attempted for TFT fabrication.
    Actually, by using soft organic films such as polyethylene and polysthylene, TFTs with characteristics equivalent to those fabricated by the conventional photolithography can be successfully fabricated. Additionally, during this research, a new method, in which micron-size silicon integrated circuits are attached onto substrate just like a printing ink instead of making TFT, is proposed, and its feasibility is also successfully confirmed.

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  • 触媒化学気相成長法によるシリコン系薄膜の成長プロセス

    Grant number:11895001

    1999

    System name:科学研究費助成事業

    Research category:基盤研究(C)

    Awarding organization:日本学術振興会

    松村 英樹, 増田 淳, 和泉 亮, 梅本 宏信, 野々村 修一, 小長井 誠

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    Grant amount:\3300000 ( Direct Cost: \3300000 )

    触媒化学気相成長(触媒CVD、Cat-CVD)法はホットワイアCVD法とも呼ばれ、研究代表者(松村)らによる10数年にわたる研究の結果、アモルファスシリコン膜、微(多)結晶シリコン膜、シリコン窒化膜などの形成法として有望であることが明らかになり、薄膜太陽電池、薄膜トランジスタなどの大面積デバイス用半導体膜や化合物半導体デバイス保護膜の形成手法として注目されている。このような状況下において、Cat-CVD法の研究者ならびに関連周辺分野の研究者を一同に会した国際会議を開催し、Cat-CVD法におけるシリコン系薄膜の成長機構の解明などの基礎的検討からデバイス応用にいたるまで、幅広い視点で議論するこをは極めて有益である。本研究では、国際会議開催の準備段階として、Cat-CVD法ならびに関連周辺分野の研究者で研究組織を結成し、Cat-CVD法と周辺技術の現状における問題点とその解決手段を広く調査し、平成12年度に開催予定の国際会議のプログラム編成に役立て、同会議を一層充実したものにすることを目的とした。調査の結果、ホットワイアセル法においてジシランを用いることにより堆積速度28Å/sで多結晶シリコン膜が得られること、Cat-CVD法により16.5Å/Sの高速でアモルファスシリコン膜を堆積しても初期効率9.8%の太陽電池が得られること、Cat-CVD法で作製したアモルファスシリコン膜がマイクロマシンに適用可能であることなどが明らかになった。今年度得られた調査結果は、研究代表者の主催で開催したInternational Pre-Workshop on Cat-CVD(Hot-WireCVD)Processにおいて公開し、Extended Abstractを発行した。当該Workshopには国内外から110名の参加者があり、Cat-CVD法の普及ならびに育成に貢献するとともに、Workshopでの議論は平成12年11月に開催予定の国際会議のプログラム編成に役立てることができた。

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  • Fabrication of novel monolithic optical devices composed of blue laser diodes and ferroelectric optical waveguides

    Grant number:10650005

    1998 - 1999

    System name:Grants-in-Aid for Scientific Research

    Research category:Grant-in-Aid for Scientific Research (C)

    Awarding organization:Japan Society for the Promotion of Science

    MASUDA Atsushi, SHIMIZU Tatsuo, YAGUCHI Hiroyuki, ONABE Kentaro, MORIMOTO Akiharu

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    Grant amount:\4000000 ( Direct Cost: \4000000 )

    In order to develop novel monolithic optical devices composed of blue laser diodes and ferroelectric optical waveguides, ferroelectric lead zirconate titanate (PZT) films were deposited on gallium nitride (GaN). PZT films were deposited by pulsed laser ablation on cubic GaN prepared on (001) GaAs by metalorganic vapor phase epitaxy for the first time. PZT films were preferentially [100] oriented on GaN with MgO buffer layers although PZT films were randomly oriented without MgO buffer layer. The origin for the difference is thought that MgO buffer layer acts as a diffusion barrier between PZT and GaN.Relationship between the crystallinity and the resistance against oxidation was also studied. It was found that GaN with lower crystallinity shows higher resistivity. It was also revealed that the crystallinity degrades and the surface roughness decreases both with an exposure to oxygen atmosphere around 500 ℃.

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  • Hoteroepitaxial growth of ferroelectric thin film on Si substrate by controlling the interface

    Grant number:09450125

    1997 - 1998

    System name:Grants-in-Aid for Scientific Research

    Research category:Grant-in-Aid for Scientific Research (B)

    Awarding organization:Japan Society for the Promotion of Science

    HORITA Susumu, MASUDA Astushi

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    Grant amount:\6800000 ( Direct Cost: \6800000 )

    (1) We hardly observed the difference on the C-V characteristics of the epitaxial YSZ films on Si substrates deposited by reactive sputtering with the cooling rates of 0.1 to 1000K/s at 800゚C.However, the break down characteristics were good for the films produced with the cooling rates of 1 to 10 K/s.
    (2) We observed that the stronger ion drift in the C-V characteristics of the epitaxial YSZ films on Si deposited with heavier plasma radiation.
    (3) It was found that the PZT films on epitaxial YSZ films deposited at 460 and 470゚C were heteroepitaxial monoclinic (110) PZT films. The leakage current of the monoclinic PZT film step-annealed at 300, 325 and 3500 C was less than 1X10^<-7> A/cm^2. Its C-V characteristics showed the hysteresis loop due to the ferroelectric property.
    (4) We obtained the heteroepitaxial Ir films on epitaxial (100) YSZ layers. When the deposition rates were later than 0.42 nm/min and faster than 1.2 nm/mm, the orientation of the deposited Ir films were (100) and (111), respectively, It was found that the surface crystalline quality of the epitaxial (100) Ir film was much better than that of the epitaxial YSZ film.
    (5) We obtained the epitaxial (100) and (Ill) PZT films on the epitaxial (100) Ir film at 600゚C and the epitaxial (111) Ir film at 650゚C, respectively.
    (6) When the degree of the (001) orientation of the epitaxial PZT film became stronger and the crystalline quality became better, the remanent polarization became larger and the leakage current became lower.
    (7) We found that the Si oxide layer between the YSZ layer and the Si substrate made the dielectric constant of the buffer layer decrease. This Si oxide layer formation can be suppressed by controlling the Zr+Y metal film deposition process.

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  • Fabrication of new type transistor using metal/metaloxide/metal tunneling junction

    Grant number:08455163

    1996

    System name:Grants-in-Aid for Scientific Research

    Research category:Grant-in-Aid for Scientific Research (B)

    Awarding organization:Japan Society for the Promotion of Science

    MATSUMURA Hideki, MASUDA Atsushi, IZUMI Akira

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    Grant amount:\6700000 ( Direct Cost: \6700000 )

    A new micro transistor (metal/insulator tunnel transisor ; MITT) in which tunnel currents are controlled by a gate electrode has been already proposed. This work is to present new micro-technology to realize such micro-transistor, MITT.In the technology, nano-meter-thick TiOx grown laterally at the edge of titanium thin film is utilized to draw patterns in a mask. Formation of metal/insulator/metal structure with only 10 nm-width insulator is succeeded by this new technology.

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  • Heteroepitaxial growth of oxide thin film on Si substrate by controlling the interface

    Grant number:07650362

    1995 - 1996

    System name:Grants-in-Aid for Scientific Research

    Research category:Grant-in-Aid for Scientific Research (C)

    Awarding organization:Japan Society for the Promotion of Science

    HORITA Susumu, MASUDA Astushi

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    Grant amount:\2100000 ( Direct Cost: \2100000 )

    After the Y content dependence of YSZ film material properties was investigated, we confirmed usefulness of the YSZ buffer layr for the PZT film on Si.
    (1) 100-nm-thick cubic YSZ films with Y content ratios R_Y=2.3-19.7 at.% were heteroepitaxially grown on Si (100) at 800゚C and the crystal phase was kept at room temperature. Also, YSZ films with R_Y=1.2 at.% were kept to be cubic phase even at room temperature until their thickness were 20 nm. However, they were monoclinic at room temperature and were cubic at 800゚C when their thickness was more than 30 nm.
    (2) In the case of ZrO_2 without Y content, the 10-nm-thick (100) film grew heteroepitaxially on Si (100) substrate and the 100-nm-thick film had monoclinic (100) oriented grains which is about 9゚ off from the surface of the substrate.
    (3) We obtain electric characteristics of the YSZ films as follows : When the Y content was decreased and cubic phase was kept, the leakage current and the hysteresis width of the C (capacitance) -V (voltage) curve were increased. The hysteresis was due to ion drift. However, further decreasing Y content so that the crystal phase of the film was changed to monoclinic, the leakage current and the hysteresis width were decreased. This is probably because the crystalline quality of the film was degraded by decreasing the Y content in the state of the cubic phase.
    (4) When PZT film was deposited on the 10-nm-thick YSZ film with R_Y=9.4At.%, no reaction was found between the Si substrate and the PZT film and the ferroelectric property was observed. But, since the thickness of the YSZ film is not thin enough to reduce the operation voltage to 3V,we need to decrease its thickness and to improve the material quality of the film.

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  • 触媒化学気相成長法による薄膜作製

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    Grant type:Competitive

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  • 薄膜シリコン太陽電池

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    Grant type:Competitive

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  • 薄膜トランジスタ

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    Grant type:Competitive

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  • 触媒化学気相成長により堆積したアモルファスならびに多結晶シリコン薄膜の評価

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    Grant type:Competitive

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  • Integration Technique of Oxide Ferroelectric Thin Films and Semiconductors

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    Grant type:Competitive

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  • Mechanism of Pulsed Laser Ablation

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    Grant type:Competitive

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  • Characterization of Amorphous and Polycrystalline Silicon Films Prepared by Catalytic Chemical Vapor Deposition

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    Grant type:Competitive

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  • Thin-film formation by catalytic chemical vapor deposition

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    Grant type:Competitive

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  • Thin film silicon solar cells

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    Grant type:Competitive

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  • Thin-film transistors

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    Grant type:Competitive

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  • 酸化物強誘電体薄膜と半導体の集積化技術

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    Grant type:Competitive

    researchmap

  • レーザアブレーションの機構解明

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    Grant type:Competitive

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Teaching Experience

  • アドバンストテクノロジー

    2025
    Institution name:新潟大学

  • 企業における生産・開発I

    2025
    Institution name:新潟大学

  • 課題解決プロジェクトI

    2025
    Institution name:新潟大学

  • 企業における生産・開発II

    2025
    Institution name:新潟大学

  • 課題解決プロジェクトII

    2025
    Institution name:新潟大学

  • 電子物性工学II

    2024
    Institution name:新潟大学

  • 課題発見プロジェクト

    2024
    Institution name:新潟大学

  • 論文輪講

    2024
    Institution name:新潟大学

  • 自然科学総論III

    2024
    Institution name:新潟大学

  • 科学技術表現法

    2023
    Institution name:新潟大学

  • 物理工学IV

    2023
    Institution name:新潟大学

  • ロジカルスピーキング

    2023
    Institution name:新潟大学

  • ソーラー水素エネルギー概論

    2023
    Institution name:新潟大学

  • 電子光デバイス特論

    2022
    Institution name:新潟大学

  • 卒業研修

    2022
    Institution name:新潟大学

  • 太陽光発電工学特論

    2022
    Institution name:新潟大学

  • 卒業研究

    2022
    Institution name:新潟大学

  • 総合工学概論

    2022
    Institution name:新潟大学

  • 論文輪講II

    2022
    -
    2023
    Institution name:新潟大学

  • 論文輪講I

    2022
    -
    2023
    Institution name:新潟大学

  • 産業技術政策特論

    2022
    Institution name:新潟大学

  • ディベートI

    2021
    Institution name:新潟大学

  • 技術者としてのキャリア形成入門演習

    2021
    Institution name:新潟大学

  • 課題解決インターンシップIII

    2020
    Institution name:新潟大学

  • リメディアル演習

    2020
    Institution name:新潟大学

  • 課題解決インターンシップII

    2020
    Institution name:新潟大学

  • 協創経営概論

    2020
    Institution name:新潟大学

  • 総合技術科学演習

    2020
    Institution name:新潟大学

  • キャリアデザイン・インターンシップII

    2020
    -
    2022
    Institution name:新潟大学

  • ロジカルライティング

    2020
    -
    2022
    Institution name:新潟大学

  • 工学リテラシー入門(融合領域分野)

    2020
    -
    2021
    Institution name:新潟大学

  • 課題解決インターンシップI

    2020
    -
    2021
    Institution name:新潟大学

  • キャリアデザイン・インターンシップI

    2020
    -
    2021
    Institution name:新潟大学

  • ディベートIII

    2020
    Institution name:新潟大学

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