Updated on 2025/07/26
博士(工学) ( 2002.3 東北大学 )
理学修士 ( 1985.3 )
Nanotechnology/Materials / Thin film/surface and interfacial physical properties / 赤外分光、キャリア教育
Industrial Research Institute of Niigata Prefecture Director in General
2019.4 - 2021.3
Industrial Research Institute of Niigata Prefecture
2018.4 - 2019.3
Industrial Research Institute of Niigata Prefecture
2016.4 - 2018.3
Industrial Research Institute of Niigata Prefecture
2014.4 - 2016.3
Industrial Research Institute of Niigata Prefecture
2005.6 - 2014.3
㈱東レリサーチセンター 構造化学研究部第1研究室 室長
1998.4 - 2005.5
㈱東レリサーチセンター 構造化学研究部第1研究室 研究員
1985.6 - 1998.3
Niigata University Institute of Science and Technology, Academic Assembly Professor
2021.4
Niigata University Center for advancement in Education and Research, Graduate School of Science and Technology Professor
2021.4
Tohoku University 博士（工学）
- 2002.3
Niigata University 理学研究科
1983.4 - 1985.3
Niigata University Faculty of Science Department of Physics
1979.4 - 1983.3
Dip or Step-Like Features in the Infrared Reflection Spectra of Heat-Treated Polyoxymethylene
Naoto Nagai, Yuko Amaki
Applied Spectroscopy 79 ( 8 ) 1279 - 1289 2025.3
Azimuth Angle Dependence of Polarized Infrared Spectra of Injection-Molded Polyoxymethylene Reviewed
Naoto Nagai
Applied Spectroscopy 78 ( 2 ) 197 - 208 2024.2
Yuko Amaki, Hideki Okada, Naoto Nagai
Applied Spectroscopy 76 ( 6 ) 699 - 711 2022.6
Anomalous high-infrared reflectance of extruded polyoxymethylene Reviewed
Naoto Nagai, Hideki Okada, Yuko Amaki, Miyuki Okamura, Takuma Fujii, Takaki Suzuki, Akihiro Takayanagi, Sumito Nakagawa
AIP Advances 10 ( 9 ) 095201 - 095201 2020.9
Aki Fukumi, Takafumi Shimoaka, Nobutaka Shioya, Naoto Nagai, Takeshi Hasegawa
The Journal of Chemical Physics 153 ( 4 ) 044703 - 044703 2020.7
Morphology-sensitive infrared absorption bands of polymers derived from surface polaritons Reviewed
Naoto Nagai, Hideki Okada, Takeshi Hasegawa
AIP Advances 9 ( 10 ) 105203 - 105203 2019.10
Infrared Response of Sub-Micron-Scale Structures of Polyoxymethylene: Surface Polaritons in Polymers Reviewed
Naoto Nagai, Makoto Okawara, Yuta Kijima
Applied Spectroscopy 70 ( 8 ) 1278 - 1291 2016.8
Structural Analysis of Mold Temperature Dependence of Polycarbonate by Mid-Infrared Spectroscopy Reviewed
Naoto Nagai, Itsuo Nishiyama, Hidemi Ito
Applied Spectroscopy 67 ( 10 ) 1132 - 1141 2013.10
A New Approach to Investigate Thin Surface Layers of Polymers: Fatigue Analysis of Polycarbonate Reviewed
Naoto Nagai, Itsuo Nishiyama, Hideo Shimada, Hidemi Ito, Kazunaka Endo
Applied Spectroscopy 67 ( 4 ) 420 - 432 2013.4
Naoto Nagai, Hideki Okada, Satoshi Watanabe, Sayaka Shimojo
Applied Spectroscopy 66 ( 9 ) 1087 - 1090 2012.9
Naoto Nagai
Analytical Methods 4 ( 11 ) 3679 - 3679 2012
Infrared Surface Analysis Using a Newly Developed Thin-Sample Preparation System Reviewed
Naoto Nagai, Itsuo Nishiyama, Yoshio Kishima, Katsuhiko Iida, Koichi Mori
Applied Spectroscopy 63 ( 1 ) 66 - 72 2009.1
Analysis of the inter-molecular interactions between amino acids and acetone by THz spectroscopy Reviewed
Naoto Nagai, Yutaka Katsurazawa
Biopolymers 85 ( 3 ) 207 - 213 2007.2
Vibrational Spectroscopy of Carbon and Silicon Materials
M. Yoshikawa, N. Nagai
Handbook of Vibrational Spectroscopy 2006.8
Characterization of electron- or proton-irradiated Si space solar cells by THz spectroscopy Reviewed
Naoto Nagai, Masakiyo Sumitomo, Mitsuru Imaizumi, Ryoichi Fukasawa
Semiconductor Science and Technology 21 ( 2 ) 201 - 209 2006.2
Direct evidence of inter-molecular vibrations by THz spectroscopy Reviewed
Naoto Nagai, Ryoichi Kumazawa, Ryoichi Fukasawa
Chemical Physics Letters 413 ( 4-6 ) 495 - 500 2005.9
Infrared analysis of depth profiles in UV-photochemical degradation of polymers Reviewed
N. Nagai, T. Matsunobe, T. Imai
Polymer Degradation and Stability 88 ( 2 ) 224 - 233 2005.5
Characterization of Crystalline Defects and Stress in Shallow Trench Isolation by Cathodoluminescence and Raman Spectroscopies
Ryuichi Sugie, Keiko Matsuda, Naoto Nagai, Tsuneo Ajioka, Masanobu Yoshikawa, Toshikazu Mizukoshi, Katsuhiko Shibusawa, Shoji Yo
Extended Abstracts of the 2005 International Conference on Solid State Devices and Materials 2005 538 - 539 2005
Analysis of the Industrial Materials by THz Spectroscopy Invited
Naoto NAGAI
The Review of Laser Engineering 33 ( 12 ) 848 - 854 2005
Analysis of the intermolecular interaction of nanocomposites by THz spectroscopy Reviewed
Naoto Nagai, Tomoko Imai, Ryoichi Fukasawa, Koya Kato, Koji Yamauchi
Applied Physics Letters 85 ( 18 ) 4010 - 4012 2004.11
Infrared microspectroscopy station at BL43IR of SPring-8 Reviewed
Y Ikemoto, T Moriwaki, T Hirono, S Kimura, K Shinoda, M Matsunami, N Nagai, T Nanba, K Kobayashi, H Kimura
Infrared Physics & Technology 45 ( 5-6 ) 369 - 373 2004.10
Depth profile analysis of chemically amplified resist by using TOF-SIMS with gradient shaving preparations Reviewed
N. Man, H. Okumura, H. Oizumi, N. Nagai, H. Seki, I. Nishiyama
Applied Surface Science 231-232 353 - 356 2004.6
Abnormal dispersion of polymer films in the THz frequency region Reviewed
Naoto Nagai, Ryoichi Fukasawa
Chemical Physics Letters 388 ( 4-6 ) 479 - 482 2004.4
Haruki Okumura, Kazuhiro Takeda, Naoto Nagai
Journal of Photopolymer Science and Technology 17 ( 4 ) 535 - 540 2004
Depth profile analysis of polyimide film treated by potassium hydroxide Reviewed
H. Okumura, T. Takahagi, N. Nagai, S. Shingubara
Journal of Polymer Science Part B: Polymer Physics 41 ( 17 ) 2071 - 2078 2003.9
Depth profile analysis of the photochemical degradation of polycarbonate by infrared spectroscopy Reviewed
N Nagai, H Okumura, T Imai, I Nishiyama
Polymer Degradation and Stability 81 ( 3 ) 491 - 496 2003.1
Depth profile analysis of ion-implanted photoresist by infrared spectroscopy Reviewed
N. Nagai, T. Imai, K. Terada, H. Seki, H. Okumura, H. Fujino, T. Yamamoto, I. Nishiyama, A. Hatta
Surface and Interface Analysis 33 ( 7 ) 545 - 551 2002.7
Naoto Nagai, K. Terada, Y. Muraji, H. Hashimoto, T. Maeda, Y. Maeda, E. Tahara, N. Tokai, A. Hatta
Journal of Applied Physics 91 ( 7 ) 4747 - 4750 2002.4
Measurement of thermal conductivity of silicon dioxide thin films using a 3ω method Reviewed
Tsuneyuki Yamane, Naoto Nagai, Shin-ichiro Katayama, Minoru Todoki
Journal of Applied Physics 91 ( 12 ) 9772 - 9772 2002
Satoshi Uemura, Masanori Fujii, Hideki Hashimoto, Naoto Nagai
Japanese Journal of Applied Physics 40 ( Part 1, No. 9A ) 5312 - 5313 2001.9
IR and EPR Study of the Na Ion-Implanted SiO2/Si System Reviewed
N. Nagai, Y. Yamaguchi, R. Saito, S. Hayashi, M. Kudo
Applied Spectroscopy 55 ( 9 ) 1207 - 1213 2001.9
High resolution measurement of the carbon localized vibrational mode in gallium arsenide Reviewed
Naoto Nagai
Journal of Applied Physics 89 ( 12 ) 8345 - 8347 2001.6
FT-IR-ATR study of depth profile of SiO2 ultra-thin films Reviewed
N. Nagai, H. Hashimoto
Applied Surface Science 172 ( 3-4 ) 307 - 311 2001.3
Study of interaction between polyimide and Cu under a high humidity condition Reviewed
N. Nagai, T. Hironaka, T. Imai, T. Harada, M. Nishimura, R. Mimori, H. Ishida
Applied Surface Science 171 ( 1-2 ) 101 - 105 2001.2
Depth Profile Analysis by Infrared Spectroscopy Invited Reviewed
Naoto Nagai
ANALYTICAL SCIENCE Supplement 17 i671 - i674 2001
Hideharu Matsuura, Yoshitsugu Uchida, Naoto Nagai, Tadashi Hisamatsu, Takashi Aburaya, Sumio Matsuda
Applied Physics Letters 76 ( 15 ) 2092 - 2094 2000.4
FT-IR study of electron- or proton-irradiated Si crystals for solar cells Reviewed
N Nagai, H Ishida, T Hisamatsu, T Aburaya, S Matsuda
Journal of Crystal Growth 210 ( 1-3 ) 74 - 79 2000.3
Infrared surface analysis of semiconductors by a noncontact air gap ATR method Reviewed
N. Nagai, Y. Izumi, H. Ishida, Y. Suzuki, A. Hatta
1998
FT-IR Study of the Molecular Orientation of Rubbed Polyimide Alignment Films. Reviewed
T. Matsunobe, N. Nagai, R. Kamoto, Y. Nakagawa, H. Ishida
Journal of Photopolymer Science and Technology 8 ( 2 ) 263 - 268 1995
Organic superlattice film by alternate deposition of single molecular layers Reviewed
T. Nonaka, Y. Mori, N. Nagai, Y. Nakagawa, M. Saeda, T. Takahagi, A. Ishitani
Thin Solid Films 239 ( 2 ) 214 - 219 1994.3
Phthalocyanines ultrathin alternating layer film on silicon, prepared by molecular beam deposition Reviewed
T. Nonaka, T. Date, S. Tomita, N. Nagai, M. Nishimura, Y. Murata, A. Ishitani
Thin Solid Films 237 ( 1-2 ) 87 - 90 1994.1
Fabrication of an organic superlattice film by molecular beam deposition Reviewed
T. Nonaka, Y. Mori, N. Nagai, T. Matsunobe, Y. Nakagawa, M. Saeda, T. Takahagi, A. Ishitani
Journal of Applied Physics 73 ( 6 ) 2826 - 2830 1993.3
Raman scattering fromsp2carbon clusters Reviewed
M. Yoshikawa, N. Nagai, M. Matsuki, H. Fukuda, G. Katagiri, H. Ishida, A. Ishitani, I. Nagai
Physical Review B 46 ( 11 ) 7169 - 7174 1992.9
Infrared properties of Bi2Sr2Can−1CunOy Reviewed
Kazuharu Shimizu, Hitoshi Nobumasa, Naoto Nagai, Tomoji Kawai
Physica C: Superconductivity 185-189 949 - 950 1991.12
Characterization of High Temperature Superconducting Thin Film Grown by Laser Ablation Method Reviewed
K. Shimizu, H. Nobumasa, N. Nagai, T. Matsunobe, T. Kawai
MRS Proceedings 236 1991
Preparation of diamondlike carbon films by electron cyclotron resonance chemical vapor deposition Reviewed
I. Nagai, A. Ishitani, H. Kuroda, M. Yoshikawa, N. Nagai
Journal of Applied Physics 67 ( 6 ) 2890 - 2893 1990.3
Characterization of evaporated thin films of merocyanine dyes Reviewed
S. Hattori, A. Ishitani, H. Kuroda, Y. Nagasawa, Y. Mori, N. Nagai
Journal of Applied Physics 67 ( 1 ) 237 - 240 1990.1
FT-IR Study On Microstructure Of Diamondlike Amorphous Carbon Films
N. Nagai, M. Yoshikawa, H. Ishida, I. Nagai, A. Ishitani, H. Kuroda
7th Intl Conf on Fourier Transform Spectroscopy 1989.12
Study On The 1720cm-1 Absorption Band Of Cz-Si By Low-Temperature FT-IR Measurement
N. Nagai, Y. Nagasawa, H. Ishida, A. Ishitani
7th Intl Conf on Fourier Transform Spectroscopy 1989.12
ポリイミドの高機能化と応用技術
（ Role： Joint author）
サイエンス＆テクノロジー 2008
テラヘルツ技術
（ Role： Joint author）
オーム社 2006
新訂版 表面科学の基礎と応用
（ Role： Joint author）
エヌ・ティー・エス 2004
Handbook of Vibarational Spectroscopy Vol.4
（ Role： Joint author）
Wiley 2001
半導体計測評価事典
（ Role： Joint author）
サイエンスフォーラム社 1994
赤外線工学―基礎と応用―
（ Role： Joint author）
オーム社 1991
テラヘルツ分光法の工業材料分析への応用 Invited
永井 直人
光学 9 ( 9 ) 465 - 471 2005
カソードルミネッセンス法によるSTIプロセスの評価 (I)-Si系半導体への適用-
杉江隆一, 松田景子, 永井直人, 味岡恒夫, 吉川正信, 水越俊和, 葉章二, 渋沢勝彦
応用物理学会学術講演会講演予稿集 65th ( 2 ) 2004
劣化ポリカーボネート樹脂の強度および深さ方向分析
西山逸雄, 永井直人
15 ( 2 ) 66 2003
半導体材料の分析技術の動向について
吉川正信, 永井直人
光技術コンタクト 35 12 1997
分析入門シリーズ 分析技術の実際知識（１）分析入門コース Invited
添田房美, 永井直人
クリーンテクノロジー 8 69 1995
FT-IRによる半導体材料の評価 Invited
永井直人, 石田英之
島津科学器械ニュース 29 1988
William F. Meggers Award
2017.10 Society for Applied Spectroscopy
先端分析技術・機器開発賞
2005.7 日本分析化学会
大型機器分析技術
産業技術政策特論
修士のためのインターンシップ
博士のためのインターンシップ
