Updated on 2024/10/07

写真a

 
NAGAI Naoto
 
Organization
Academic Assembly Institute of Science and Technology SEISAN DESIGN KOUGAKU KEIRETU Professor
Graduate School of Science and Technology Advanced Education and Research Center Practical Education and Research Division Professor
Title
Professor
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Degree

  • 博士(工学) ( 2002.3   東北大学 )

  • 理学修士 ( 1985.3 )

Research Areas

  • Nanotechnology/Materials / Thin film/surface and interfacial physical properties  / 赤外分光、キャリア教育

Research History (researchmap)

  • Industrial Research Institute of Niigata Prefecture   Director in General

    2019.4 - 2021.3

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  • Industrial Research Institute of Niigata Prefecture

    2018.4 - 2019.3

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  • Industrial Research Institute of Niigata Prefecture

    2016.4 - 2018.3

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  • Industrial Research Institute of Niigata Prefecture

    2014.4 - 2016.3

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  • Industrial Research Institute of Niigata Prefecture

    2005.6 - 2014.3

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  • ㈱東レリサーチセンター   構造化学研究部第1研究室   室長

    1998.4 - 2005.5

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  • ㈱東レリサーチセンター   構造化学研究部第1研究室   研究員

    1985.6 - 1998.3

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Research History

  • Niigata University   Institute of Science and Technology, Academic Assembly   Professor

    2021.4

  • Niigata University   Center for advancement in Education and Research, Graduate School of Science and Technology   Professor

    2021.4

Education

  • Tohoku University   博士(工学)

    - 2002.3

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  • Niigata University   理学研究科

    1983.4 - 1985.3

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  • Niigata University   Faculty of Science   Department of Physics

    1979.4 - 1983.3

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Papers

  • Azimuth Angle Dependence of Polarized Infrared Spectra of Injection-Molded Polyoxymethylene Reviewed

    Naoto Nagai

    Applied Spectroscopy   78 ( 2 )   197 - 208   2024.2

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    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:SAGE Publications  

    Injection-molded polyoxymethylene (POM) has molecular chains mainly oriented in the injection direction. We investigated the directional dependence of the polarized infrared reflection and attenuated total reflection spectra by rotating the anisotropic POM sample. Because of the strong absorption and large frequency dispersion of the C–O vibration in the main-chain direction, we found phenomena such as shoulder wing generation that resulted from the mixing of optical responses attributed to the vibration in the main chain and that in the direction perpendicular to the main chain. The spectra of the directional dependence can be explained qualitatively because of the anisotropy of the mode with large frequency dispersion.

    DOI: 10.1177/00037028231217005

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    Other Link: http://journals.sagepub.com/doi/full-xml/10.1177/00037028231217005

  • Structural Analysis of Injection-Molded Polyoxymethylene Treated Below a Melting Point Using Field-Emission Scanning Electron Microscopy and Infrared Spectroscopy Reviewed

    Yuko Amaki, Hideki Okada, Naoto Nagai

    Applied Spectroscopy   76 ( 6 )   699 - 711   2022.6

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    Authorship:Last author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:SAGE Publications  

    The heat treatment of an injection-molded polyoxymethylene slightly below the melting point and subsequent isothermal treatment at 130 °C were performed. The polyoxymethylene structure was examined using field-emission scanning electron microscopy and polarization infrared reflection measurements. After the heat treatment, a significant change in the surface morphology was observed, and the reflection spectrum derived from the polariton in the injection direction also changed dramatically. Since the reflection spectrum in the injection direction contains the reflection component of the perpendicular direction and vice versa, the polarization spectra of both directions can be calculated consistently. The mixing ratio of each crossed component and the pure relative permittivity both parallel and perpendicular to the main-chain direction were determined using the oscillator model. The heat treatment reduced the ratio of the perpendicular component and increased the order structure until just before melting. The structural changes characterized by the two techniques, along with Raman spectroscopy and differential scanning calorimetry, are discussed.

    DOI: 10.1177/00037028221078050

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    Other Link: http://journals.sagepub.com/doi/full-xml/10.1177/00037028221078050

  • Anomalous high-infrared reflectance of extruded polyoxymethylene Reviewed

    Naoto Nagai, Hideki Okada, Yuko Amaki, Miyuki Okamura, Takuma Fujii, Takaki Suzuki, Akihiro Takayanagi, Sumito Nakagawa

    AIP Advances   10 ( 9 )   095201 - 095201   2020.9

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    DOI: 10.1063/5.0020445

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  • Infrared active surface modes found in thin films of perfluoroalkanes reveal the dipole–dipole interaction and surface morphology Reviewed

    Aki Fukumi, Takafumi Shimoaka, Nobutaka Shioya, Naoto Nagai, Takeshi Hasegawa

    The Journal of Chemical Physics   153 ( 4 )   044703 - 044703   2020.7

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:AIP Publishing  

    Infrared (IR) spectra of an organic thin film are mostly understood by considering the normal modes of a single molecule, if the dipole-dipole (D-D) interaction is ignorable in the film. When the molecules have a chemical group having a large permanent dipole moment such as the C=O and C-F groups, the D-D interaction induces vibrational couplings across the molecules, which produces an extra band as a surface phonon or polariton band because of the small thickness. Since the dipole moment of an organic compound is much less than that of an inorganic ionic crystal, we have a problem that the extra band looks like a normal-mode band, which are difficult to be discriminated from each other. In fact, this visual similarity sometimes leads us to a wrong direction in chemical discussion because the direction of the transition moment of the extra band is totally different from those of the normal modes. Here, we show useful selection rules for discussing IR spectra of a thin film without performing the permittivity analysis. The apparent change in the spectral shape on decrease in the thickness of the sample can be correlated with the morphological change in the film surface, which can also be discussed with changes in the molecular packing. This analytical technique has effectively been applied for studying the chemical properties of perfluoroalkanes as a chemical demonstration, which readily supports the stratified dipole-array theory for perfluoroalkyl compounds. Published under license by AIP Publishing.

    DOI: 10.1063/5.0012910

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  • Morphology-sensitive infrared absorption bands of polymers derived from surface polaritons Reviewed

    Naoto Nagai, Hideki Okada, Takeshi Hasegawa

    AIP Advances   9 ( 10 )   105203 - 105203   2019.10

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    Authorship:Lead author, Corresponding author   Language:English   Publishing type:Research paper (scientific journal)   Publisher:AIP Publishing  

    DOI: 10.1063/1.5116280

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  • Infrared Response of Sub-Micron-Scale Structures of Polyoxymethylene: Surface Polaritons in Polymers Reviewed

    Naoto Nagai, Makoto Okawara, Yuta Kijima

    Applied Spectroscopy   70 ( 8 )   1278 - 1291   2016.8

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    An investigation of the infrared (IR) spectra of polyoxymethylene (POM) mold plates was undertaken to determine the sub-micron-scale morphology and molecular orientation. The nest-structured cells concerned with the orientation were observed from scanning electron microscope (SEM) measurements with the aid of Raman spectroscopy. The intensity of the anomalous IR reflectance peak of the C–O stretching A<sub>2</sub> mode depends on the widths of the POM layers in the SEM image along the orientation direction. The results suggest that the spectral features originate from the Berreman effect of the bulk polaritons and the radiative surface polaritons. Moreover, the IR spectra of certain treated samples suggest that enhancement of the electromagnetic fields from the gap modes and transition dipole–dipole coupling influence the spectral shapes.

    DOI: 10.1177/0003702816653577

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    Other Link: http://journals.sagepub.com/doi/full-xml/10.1177/0003702816653577

  • Structural Analysis of Mold Temperature Dependence of Polycarbonate by Mid-Infrared Spectroscopy Reviewed

    Naoto Nagai, Itsuo Nishiyama, Hidemi Ito

    Applied Spectroscopy   67 ( 10 )   1132 - 1141   2013.10

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (scientific journal)   Publisher:SAGE Publications  

    DOI: 10.1366/13-07043

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    Other Link: http://journals.sagepub.com/doi/full-xml/10.1366/13-07043

  • A New Approach to Investigate Thin Surface Layers of Polymers: Fatigue Analysis of Polycarbonate Reviewed

    Naoto Nagai, Itsuo Nishiyama, Hideo Shimada, Hidemi Ito, Kazunaka Endo

    Applied Spectroscopy   67 ( 4 )   420 - 432   2013.4

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    DOI: 10.1366/12-06840

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    Other Link: http://journals.sagepub.com/doi/full-xml/10.1366/12-06840

  • Study of Sugar Transformations in Carrots during Storage Using Snow by Mid-Infrared Spectroscopy and Chemometrics Reviewed

    Naoto Nagai, Hideki Okada, Satoshi Watanabe, Sayaka Shimojo

    Applied Spectroscopy   66 ( 9 )   1087 - 1090   2012.9

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    DOI: 10.1366/12-06647

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    Other Link: http://journals.sagepub.com/doi/full-xml/10.1366/12-06647

  • Spectroscopic investigation of mixed materials using the adsorbed dissipative structures induced by Marangoni convection Reviewed

    Naoto Nagai

    Analytical Methods   4 ( 11 )   3679 - 3679   2012

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (scientific journal)   Publisher:Royal Society of Chemistry (RSC)  

    DOI: 10.1039/c2ay25199j

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  • Infrared Surface Analysis Using a Newly Developed Thin-Sample Preparation System Reviewed

    Naoto Nagai, Itsuo Nishiyama, Yoshio Kishima, Katsuhiko Iida, Koichi Mori

    Applied Spectroscopy   63 ( 1 )   66 - 72   2009.1

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    DOI: 10.1366/000370209787169885

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  • Analysis of the inter-molecular interactions between amino acids and acetone by THz spectroscopy Reviewed

    Naoto Nagai, Yutaka Katsurazawa

    Biopolymers   85 ( 3 )   207 - 213   2007.2

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (scientific journal)   Publisher:Wiley  

    DOI: 10.1002/bip.20623

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  • Vibrational Spectroscopy of Carbon and Silicon Materials

    M. Yoshikawa, N. Nagai

    Handbook of Vibrational Spectroscopy   2006.8

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    Publisher:John Wiley & Sons, Ltd  

    DOI: 10.1002/0470027320.s6301

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  • Characterization of electron- or proton-irradiated Si space solar cells by THz spectroscopy Reviewed

    Naoto Nagai, Masakiyo Sumitomo, Mitsuru Imaizumi, Ryoichi Fukasawa

    Semiconductor Science and Technology   21 ( 2 )   201 - 209   2006.2

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    Authorship:Lead author   Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    DOI: 10.1088/0268-1242/21/2/019

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  • Direct evidence of inter-molecular vibrations by THz spectroscopy Reviewed

    Naoto Nagai, Ryoichi Kumazawa, Ryoichi Fukasawa

    Chemical Physics Letters   413 ( 4-6 )   495 - 500   2005.9

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    Authorship:Lead author   Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.cplett.2005.08.023

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  • Infrared analysis of depth profiles in UV-photochemical degradation of polymers Reviewed

    N. Nagai, T. Matsunobe, T. Imai

    Polymer Degradation and Stability   88 ( 2 )   224 - 233   2005.5

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.polymdegradstab.2004.11.001

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  • Characterization of Crystalline Defects and Stress in Shallow Trench Isolation by Cathodoluminescence and Raman Spectroscopies

    Ryuichi Sugie, Keiko Matsuda, Naoto Nagai, Tsuneo Ajioka, Masanobu Yoshikawa, Toshikazu Mizukoshi, Katsuhiko Shibusawa, Shoji Yo

    Extended Abstracts of the 2005 International Conference on Solid State Devices and Materials   2005   538 - 539   2005

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    Language:English   Publishing type:Research paper (international conference proceedings)   Publisher:The Japan Society of Applied Physics  

    DOI: 10.7567/ssdm.2005.p1-26

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  • Analysis of the Industrial Materials by THz Spectroscopy Invited

    Naoto NAGAI

    The Review of Laser Engineering   33 ( 12 )   848 - 854   2005

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    Authorship:Lead author, Corresponding author   Language:Japanese   Publishing type:Research paper (scientific journal)   Publisher:Laser Society of Japan  

    This paper shows some results on the characterization of the industrial materials by THz spectroscopy. The applications for bio-materials, dielectric thin films, polymers, nanocomposites, and semiconductors were discussed.

    DOI: 10.2184/lsj.33.848

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    Other Link: https://jlc.jst.go.jp/DN/JALC/00272353767?from=CiNii

  • Analysis of the intermolecular interaction of nanocomposites by THz spectroscopy Reviewed

    Naoto Nagai, Tomoko Imai, Ryoichi Fukasawa, Koya Kato, Koji Yamauchi

    Applied Physics Letters   85 ( 18 )   4010 - 4012   2004.11

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    DOI: 10.1063/1.1811795

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  • Infrared microspectroscopy station at BL43IR of SPring-8 Reviewed

    Y Ikemoto, T Moriwaki, T Hirono, S Kimura, K Shinoda, M Matsunami, N Nagai, T Nanba, K Kobayashi, H Kimura

    Infrared Physics & Technology   45 ( 5-6 )   369 - 373   2004.10

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    DOI: 10.1016/j.infrared.2004.01.004

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  • Depth profile analysis of chemically amplified resist by using TOF-SIMS with gradient shaving preparations Reviewed

    N. Man, H. Okumura, H. Oizumi, N. Nagai, H. Seki, I. Nishiyama

    Applied Surface Science   231-232   353 - 356   2004.6

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    DOI: 10.1016/j.apsusc.2004.03.093

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  • Abnormal dispersion of polymer films in the THz frequency region Reviewed

    Naoto Nagai, Ryoichi Fukasawa

    Chemical Physics Letters   388 ( 4-6 )   479 - 482   2004.4

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    DOI: 10.1016/j.cplett.2004.03.044

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  • Depth Profile Analysis of Structures in ArF Resists by 172nm VUV Curing and Dry Etching Process Using .MU.-FTIR with Gradient Shaving Preparation Reviewed

    Haruki Okumura, Kazuhiro Takeda, Naoto Nagai

    Journal of Photopolymer Science and Technology   17 ( 4 )   535 - 540   2004

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    Publishing type:Research paper (scientific journal)   Publisher:Technical Association of Photopolymers, Japan  

    DOI: 10.2494/photopolymer.17.535

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  • Depth profile analysis of polyimide film treated by potassium hydroxide Reviewed

    H. Okumura, T. Takahagi, N. Nagai, S. Shingubara

    Journal of Polymer Science Part B: Polymer Physics   41 ( 17 )   2071 - 2078   2003.9

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    Publishing type:Research paper (scientific journal)   Publisher:Wiley  

    DOI: 10.1002/polb.10572

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  • Depth profile analysis of the photochemical degradation of polycarbonate by infrared spectroscopy Reviewed

    N Nagai, H Okumura, T Imai, I Nishiyama

    Polymer Degradation and Stability   81 ( 3 )   491 - 496   2003.1

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    DOI: 10.1016/s0141-3910(03)00135-6

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  • Depth profile analysis of ion-implanted photoresist by infrared spectroscopy Reviewed

    N. Nagai, T. Imai, K. Terada, H. Seki, H. Okumura, H. Fujino, T. Yamamoto, I. Nishiyama, A. Hatta

    Surface and Interface Analysis   33 ( 7 )   545 - 551   2002.7

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    DOI: 10.1002/sia.1415

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  • Infrared absorption study of rapid thermal oxidation andin situsteam generation of thin SiO2 films by gradient etching preparation Reviewed

    Naoto Nagai, K. Terada, Y. Muraji, H. Hashimoto, T. Maeda, Y. Maeda, E. Tahara, N. Tokai, A. Hatta

    Journal of Applied Physics   91 ( 7 )   4747 - 4750   2002.4

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (scientific journal)   Publisher:AIP Publishing  

    DOI: 10.1063/1.1459097

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  • Measurement of thermal conductivity of silicon dioxide thin films using a 3ω method Reviewed

    Tsuneyuki Yamane, Naoto Nagai, Shin-ichiro Katayama, Minoru Todoki

    Journal of Applied Physics   91 ( 12 )   9772 - 9772   2002

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    Publishing type:Research paper (scientific journal)   Publisher:AIP Publishing  

    DOI: 10.1063/1.1481958

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  • In SituObservation of Native Oxide Growth on a Si(100) Surface Using Grazing Incidence X-Ray Reflectivity and Fourier Transform Infrared Spectrometer Reviewed

    Satoshi Uemura, Masanori Fujii, Hideki Hashimoto, Naoto Nagai

    Japanese Journal of Applied Physics   40 ( Part 1, No. 9A )   5312 - 5313   2001.9

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    It is well known that native oxide on hydrogen-terminated Si hardly grows in a drying atmosphere. We have developed an in situ observation system using grazing incidence X-ray reflectivity (GIXR) and Fourier transform infrared spectrometer (FTIR). In this study, we investigated the native oxide growth on hydrogen-terminated p-Si (100) in an actual drying atmosphere, which was prepared to 70 ppm H2O under atmospheric pressure at room temperature.

    DOI: 10.1143/jjap.40.5312

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  • IR and EPR Study of the Na Ion-Implanted SiO2/Si System Reviewed

    N. Nagai, Y. Yamaguchi, R. Saito, S. Hayashi, M. Kudo

    Applied Spectroscopy   55 ( 9 )   1207 - 1213   2001.9

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    DOI: 10.1366/0003702011953216

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  • High resolution measurement of the carbon localized vibrational mode in gallium arsenide Reviewed

    Naoto Nagai

    Journal of Applied Physics   89 ( 12 )   8345 - 8347   2001.6

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    DOI: 10.1063/1.1371937

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  • FT-IR-ATR study of depth profile of SiO2 ultra-thin films Reviewed

    N. Nagai, H. Hashimoto

    Applied Surface Science   172 ( 3-4 )   307 - 311   2001.3

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/s0169-4332(00)00867-9

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  • Study of interaction between polyimide and Cu under a high humidity condition Reviewed

    N. Nagai, T. Hironaka, T. Imai, T. Harada, M. Nishimura, R. Mimori, H. Ishida

    Applied Surface Science   171 ( 1-2 )   101 - 105   2001.2

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    DOI: 10.1016/s0169-4332(00)00539-0

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  • Depth Profile Analysis by Infrared Spectroscopy Invited Reviewed

    Naoto Nagai

    ANALYTICAL SCIENCE Supplement   17   i671 - i674   2001

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  • Temperature dependence of electron concentration in type-converted silicon by 1×1017 cm−2 fluence irradiation of 1 MeV electrons Reviewed

    Hideharu Matsuura, Yoshitsugu Uchida, Naoto Nagai, Tadashi Hisamatsu, Takashi Aburaya, Sumio Matsuda

    Applied Physics Letters   76 ( 15 )   2092 - 2094   2000.4

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    DOI: 10.1063/1.126265

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  • FT-IR study of electron- or proton-irradiated Si crystals for solar cells Reviewed

    N Nagai, H Ishida, T Hisamatsu, T Aburaya, S Matsuda

    Journal of Crystal Growth   210 ( 1-3 )   74 - 79   2000.3

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    DOI: 10.1016/s0022-0248(99)00650-8

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  • Infrared surface analysis of semiconductors by a noncontact air gap ATR method Reviewed

    N. Nagai, Y. Izumi, H. Ishida, Y. Suzuki, A. Hatta

    1998

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (international conference proceedings)   Publisher:AIP  

    DOI: 10.1063/1.55730

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  • FT-IR Study of the Molecular Orientation of Rubbed Polyimide Alignment Films. Reviewed

    T. Matsunobe, N. Nagai, R. Kamoto, Y. Nakagawa, H. Ishida

    Journal of Photopolymer Science and Technology   8 ( 2 )   263 - 268   1995

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    Language:English   Publishing type:Research paper (scientific journal)   Publisher:Technical Association of Photopolymers, Japan  

    Molecular orientations and surface morphology of mechanically rubbed polyimide films have been extensively studied by FT-IR, ellipsometry and atomic force microscope. In-plane and out-of-plane molecular orientations of rubbed polyimide films have been examined by angular dependences of polarized infrared transmission spectra. It has been confirmed that the polyimide chain inclination against the surface plane is induced by the rubbing. It has been shown that mapping of molecular orientation can be obtained by a grazing angle FT-IR microspectroscopy.

    DOI: 10.2494/photopolymer.8.263

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  • Organic superlattice film by alternate deposition of single molecular layers Reviewed

    T. Nonaka, Y. Mori, N. Nagai, Y. Nakagawa, M. Saeda, T. Takahagi, A. Ishitani

    Thin Solid Films   239 ( 2 )   214 - 219   1994.3

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/0040-6090(94)90854-0

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  • Phthalocyanines ultrathin alternating layer film on silicon, prepared by molecular beam deposition Reviewed

    T. Nonaka, T. Date, S. Tomita, N. Nagai, M. Nishimura, Y. Murata, A. Ishitani

    Thin Solid Films   237 ( 1-2 )   87 - 90   1994.1

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    DOI: 10.1016/0040-6090(94)90242-9

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  • Fabrication of an organic superlattice film by molecular beam deposition Reviewed

    T. Nonaka, Y. Mori, N. Nagai, T. Matsunobe, Y. Nakagawa, M. Saeda, T. Takahagi, A. Ishitani

    Journal of Applied Physics   73 ( 6 )   2826 - 2830   1993.3

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    Publishing type:Research paper (scientific journal)   Publisher:AIP Publishing  

    DOI: 10.1063/1.353059

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  • Raman scattering fromsp2carbon clusters Reviewed

    M. Yoshikawa, N. Nagai, M. Matsuki, H. Fukuda, G. Katagiri, H. Ishida, A. Ishitani, I. Nagai

    Physical Review B   46 ( 11 )   7169 - 7174   1992.9

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    Publishing type:Research paper (scientific journal)   Publisher:American Physical Society (APS)  

    DOI: 10.1103/physrevb.46.7169

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    Other Link: http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.7169/fulltext

  • Infrared properties of Bi2Sr2Can−1CunOy Reviewed

    Kazuharu Shimizu, Hitoshi Nobumasa, Naoto Nagai, Tomoji Kawai

    Physica C: Superconductivity   185-189   949 - 950   1991.12

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/0921-4534(91)91698-4

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  • Characterization of High Temperature Superconducting Thin Film Grown by Laser Ablation Method Reviewed

    K. Shimizu, H. Nobumasa, N. Nagai, T. Matsunobe, T. Kawai

    MRS Proceedings   236   1991

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    Publishing type:Research paper (scientific journal)   Publisher:Springer Science and Business Media LLC  

    <title>Abstract</title>We have measured the complex dielectric function of Bi<sub>2</sub>Sr<sub>2</sub>CaCu<sub>2</sub>O<sub>y</sub>, samples in the near infrared region directly by spectroellipsometry. As for both single crystal and thin film. superconducting samples have a zero point in the real part (ε1) of the complex dielectric function (ε*) and a clear peak of the imaginary part of the inverse ε* at almost the same frequency. On the other hand, non-superconducting samples have no such ε<sub>1</sub>, zero point, and the peak height of (-Im(l/ε*)) becomes small. Then we can determine the superconductivity of samples by this spectroellipsometry measurement at room temperature.

    DOI: 10.1557/proc-236-449

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  • Preparation of diamondlike carbon films by electron cyclotron resonance chemical vapor deposition Reviewed

    I. Nagai, A. Ishitani, H. Kuroda, M. Yoshikawa, N. Nagai

    Journal of Applied Physics   67 ( 6 )   2890 - 2893   1990.3

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    Publishing type:Research paper (scientific journal)   Publisher:AIP Publishing  

    DOI: 10.1063/1.345428

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  • Characterization of evaporated thin films of merocyanine dyes Reviewed

    S. Hattori, A. Ishitani, H. Kuroda, Y. Nagasawa, Y. Mori, N. Nagai

    Journal of Applied Physics   67 ( 1 )   237 - 240   1990.1

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    DOI: 10.1063/1.345287

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  • FT-IR Study On Microstructure Of Diamondlike Amorphous Carbon Films

    N. Nagai, M. Yoshikawa, H. Ishida, I. Nagai, A. Ishitani, H. Kuroda

    7th Intl Conf on Fourier Transform Spectroscopy   1989.12

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (international conference proceedings)   Publisher:SPIE  

    DOI: 10.1117/12.969564

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  • Study On The 1720cm-1 Absorption Band Of Cz-Si By Low-Temperature FT-IR Measurement

    N. Nagai, Y. Nagasawa, H. Ishida, A. Ishitani

    7th Intl Conf on Fourier Transform Spectroscopy   1989.12

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    Authorship:Lead author, Corresponding author   Publishing type:Research paper (international conference proceedings)   Publisher:SPIE  

    DOI: 10.1117/12.969487

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Books

  • ポリイミドの高機能化と応用技術

    ( Role: Joint author)

    サイエンス&テクノロジー  2008 

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  • テラヘルツ技術

    ( Role: Joint author)

    オーム社  2006 

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  • 新訂版 表面科学の基礎と応用

    ( Role: Joint author)

    エヌ・ティー・エス  2004 

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  • Handbook of Vibarational Spectroscopy Vol.4

    ( Role: Joint author)

    Wiley  2001 

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  • 半導体計測評価事典

    ( Role: Joint author)

    サイエンスフォーラム社  1994 

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  • 赤外線工学―基礎と応用―

    ( Role: Joint author)

    オーム社  1991 

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MISC

  • テラヘルツ分光法の工業材料分析への応用 Invited

    永井 直人

    光学   9 ( 9 )   465 - 471   2005

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    Authorship:Corresponding author   Language:Japanese   Publisher:応用物理学会分科会日本光学会  

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    CiNii Books

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  • カソードルミネッセンス法によるSTIプロセスの評価 (I)-Si系半導体への適用-

    杉江隆一, 松田景子, 永井直人, 味岡恒夫, 吉川正信, 水越俊和, 葉章二, 渋沢勝彦

    応用物理学会学術講演会講演予稿集   65th ( 2 )   2004

  • 劣化ポリカーボネート樹脂の強度および深さ方向分析

    西山逸雄, 永井直人

    15 ( 2 )   66   2003

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  • 半導体材料の分析技術の動向について

    吉川正信, 永井直人

    光技術コンタクト   35   12   1997

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  • 分析入門シリーズ 分析技術の実際知識(1)分析入門コース Invited

    添田房美, 永井直人

    クリーンテクノロジー   8   69   1995

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  • FT-IRによる半導体材料の評価 Invited

    永井直人, 石田英之

    島津科学器械ニュース   29   1988

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    Authorship:Corresponding author  

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Awards

  • William F. Meggers Award

    2017.10   Society for Applied Spectroscopy  

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  • 先端分析技術・機器開発賞

    2005.7   日本分析化学会  

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Teaching Experience

  • 大型機器分析技術

    2022
    Institution name:新潟大学

  • 産業技術政策特論

    2022
    Institution name:新潟大学

  • 修士のためのインターンシップ

    2021
    Institution name:新潟大学

  • 博士のためのインターンシップ

    2021
    Institution name:新潟大学